CH460962A - Halbleitervorrichtung zum Nachweisen und/oder Messen von Strahlung - Google Patents
Halbleitervorrichtung zum Nachweisen und/oder Messen von StrahlungInfo
- Publication number
- CH460962A CH460962A CH283867A CH283867A CH460962A CH 460962 A CH460962 A CH 460962A CH 283867 A CH283867 A CH 283867A CH 283867 A CH283867 A CH 283867A CH 460962 A CH460962 A CH 460962A
- Authority
- CH
- Switzerland
- Prior art keywords
- detecting
- semiconductor device
- measuring radiation
- radiation
- measuring
- Prior art date
Links
- 230000005855 radiation Effects 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/29—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to radiation having very short wavelengths, e.g. X-rays, gamma-rays or corpuscular radiation
- H10F30/295—Surface barrier or shallow PN junction radiation detectors, e.g. surface barrier alpha-particle detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
- G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/482—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body (electrodes)
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/40—Crystalline structures
- H10D62/405—Orientations of crystalline planes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/115—Orientation
Landscapes
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Health & Medical Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Life Sciences & Earth Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Light Receiving Elements (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL666602606A NL154329B (nl) | 1966-03-01 | 1966-03-01 | Inrichting voor het detecteren en/of meten van straling. |
Publications (1)
Publication Number | Publication Date |
---|---|
CH460962A true CH460962A (de) | 1968-08-15 |
Family
ID=19795864
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CH283867A CH460962A (de) | 1966-03-01 | 1967-02-27 | Halbleitervorrichtung zum Nachweisen und/oder Messen von Strahlung |
CH283767A CH471440A (de) | 1966-03-01 | 1967-02-27 | Halbleitervorrichtung zum Detektieren und/oder Messen von Strahlung |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CH283767A CH471440A (de) | 1966-03-01 | 1967-02-27 | Halbleitervorrichtung zum Detektieren und/oder Messen von Strahlung |
Country Status (9)
Country | Link |
---|---|
US (2) | US3529159A (en, 2012) |
JP (2) | JPS4415502B1 (en, 2012) |
BE (2) | BE694727A (en, 2012) |
CH (2) | CH460962A (en, 2012) |
DE (2) | DE1614222B2 (en, 2012) |
FR (2) | FR1512887A (en, 2012) |
GB (2) | GB1171395A (en, 2012) |
NL (1) | NL154329B (en, 2012) |
SE (2) | SE333613B (en, 2012) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2255095A1 (de) * | 1972-11-10 | 1974-05-22 | Siemens Ag | Detektor fuer ionisierende strahlung |
Families Citing this family (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3824680A (en) * | 1968-03-28 | 1974-07-23 | Levina Fizichesky I I Lebedeva | Nuclear radiation detector and method of manufacturing same |
FR1593679A (en, 2012) * | 1968-11-27 | 1970-06-01 | ||
US3622844A (en) * | 1969-08-18 | 1971-11-23 | Texas Instruments Inc | Avalanche photodiode utilizing schottky-barrier configurations |
US3715590A (en) * | 1971-03-26 | 1973-02-06 | Nasa | Micrometeoroid analyzer |
GB1431053A (en) * | 1972-05-18 | 1976-04-07 | Nat Res Dev | Radiation detectors |
DE2239953A1 (de) * | 1972-08-14 | 1974-02-28 | Siemens Ag | Detektoranordnung |
US3790794A (en) * | 1972-12-21 | 1974-02-05 | Us Navy | Absolute calorimetric dosimeter |
US3859521A (en) * | 1973-01-23 | 1975-01-07 | Mc Donnell Douglas Corp | Grid lateral photodetector |
US3842276A (en) * | 1973-06-15 | 1974-10-15 | Rca Corp | Thermal radiation detector |
US3870887A (en) * | 1973-10-10 | 1975-03-11 | Mc Donnell Douglas Corp | Optical image position indicator means using time and phase delay sensing |
DE2442276A1 (de) * | 1974-09-04 | 1976-03-25 | Siemens Ag | Elektrooptischer wandler |
JPS52105856A (en) * | 1976-03-03 | 1977-09-05 | Toyo Glass Co Ltd | Detector for eccentricity of opening of bottle |
US4070578A (en) * | 1976-07-30 | 1978-01-24 | Timothy John G | Detector array and method |
FR2375602A1 (fr) * | 1976-12-23 | 1978-07-21 | Thomson Csf | Dispositif de detection du signal de deviation du faisceau electronique d'un canon a electrons, notamment pour oscillographe cathodique, et oscillographe comportant un tel dispositif |
US4472728A (en) * | 1982-02-19 | 1984-09-18 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Imaging X-ray spectrometer |
GB2125217B (en) * | 1982-08-06 | 1986-01-02 | Secr Defence | Infra red detector arrays |
US4513201A (en) * | 1983-07-21 | 1985-04-23 | Ball Corporation | Thermocouple detector |
US5125016B1 (en) * | 1983-09-22 | 1998-02-24 | Outokumpu Oy | Procedure and measuring apparatus based on x-ray diffraction for measuring stresses |
US4688067A (en) * | 1984-02-24 | 1987-08-18 | The United States Of America As Represented By The Department Of Energy | Carrier transport and collection in fully depleted semiconductors by a combined action of the space charge field and the field due to electrode voltages |
JPH01315231A (ja) * | 1988-06-14 | 1989-12-20 | Fanuc Ltd | 交流モータのコイル巻設構造 |
US5028971A (en) * | 1990-06-04 | 1991-07-02 | The United States Of America As Represented By The Secretary Of The Army | High power photoconductor bulk GaAs switch |
US5592523A (en) * | 1994-12-06 | 1997-01-07 | Picker International, Inc. | Two dimensional detector array for CT scanners |
US5930330A (en) * | 1995-09-29 | 1999-07-27 | New Mexico Biophysics | Method and apparatus for multitaxis scanning system |
US6332590B1 (en) * | 1998-12-23 | 2001-12-25 | Space Systems/Loral, Inc. | Photoemission based spacecraft charging sensor |
US6455858B1 (en) | 2000-08-13 | 2002-09-24 | Photon Imaging, Inc. | Semiconductor radiation detector |
FR2939968B1 (fr) * | 2008-12-17 | 2013-06-07 | Eads Europ Aeronautic Defence | Generateur electrique excite par rayonnements cosmiques. |
FR2948200B1 (fr) * | 2009-07-16 | 2013-02-08 | Commissariat Energie Atomique | Dispositif de detection de rayonnement a agencement ameliore |
GB2475063A (en) * | 2009-11-04 | 2011-05-11 | Univ Leicester | Charge detector for photons or particles. |
US11677040B2 (en) * | 2019-11-21 | 2023-06-13 | Raytheon Company | Method and apparatus for enhanced photoconductivity of semiconductor |
US11927616B2 (en) | 2021-03-30 | 2024-03-12 | International Business Machines Corporation | Evaluation of wafer carcass alpha particle emission |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3207902A (en) * | 1963-06-20 | 1965-09-21 | Nuclear Diodes Inc | Radiation position detector |
US3415992A (en) * | 1965-12-28 | 1968-12-10 | Nasa | Extended area semiconductor radiation detectors and a novel readout arrangement |
-
1966
- 1966-03-01 NL NL666602606A patent/NL154329B/xx not_active IP Right Cessation
-
1967
- 1967-02-24 GB GB8984/67A patent/GB1171395A/en not_active Expired
- 1967-02-25 JP JP1175267A patent/JPS4415502B1/ja active Pending
- 1967-02-25 DE DE1967N0030065 patent/DE1614222B2/de active Granted
- 1967-02-27 BE BE694727D patent/BE694727A/xx unknown
- 1967-02-27 CH CH283867A patent/CH460962A/de not_active IP Right Cessation
- 1967-02-27 CH CH283767A patent/CH471440A/de not_active IP Right Cessation
- 1967-02-28 US US619466A patent/US3529159A/en not_active Expired - Lifetime
- 1967-02-28 JP JP1232567A patent/JPS5512746B1/ja active Pending
- 1967-02-28 SE SE02734/67A patent/SE333613B/xx unknown
- 1967-02-28 SE SE02736/67A patent/SE327478B/xx unknown
- 1967-02-28 GB GB9348/67A patent/GB1173507A/en not_active Expired
- 1967-02-28 US US619465A patent/US3529161A/en not_active Expired - Lifetime
- 1967-02-28 DE DE19671614223 patent/DE1614223A1/de active Pending
- 1967-03-01 BE BE694869D patent/BE694869A/xx unknown
- 1967-03-01 FR FR96980A patent/FR1512887A/fr not_active Expired
- 1967-03-01 FR FR96981A patent/FR1524189A/fr not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2255095A1 (de) * | 1972-11-10 | 1974-05-22 | Siemens Ag | Detektor fuer ionisierende strahlung |
Also Published As
Publication number | Publication date |
---|---|
BE694727A (en, 2012) | 1967-08-28 |
FR1512887A (fr) | 1968-02-09 |
GB1173507A (en) | 1969-12-10 |
DE1614222A1 (de) | 1970-02-26 |
DE1614223A1 (de) | 1970-05-27 |
JPS4415502B1 (en, 2012) | 1968-07-09 |
NL6602606A (en, 2012) | 1967-09-04 |
FR1524189A (fr) | 1968-05-10 |
CH471440A (de) | 1969-04-15 |
US3529161A (en) | 1970-09-15 |
NL154329B (nl) | 1977-08-15 |
DE1614222B2 (de) | 1977-02-10 |
GB1171395A (en) | 1969-11-19 |
SE327478B (en, 2012) | 1970-08-24 |
JPS5512746B1 (en, 2012) | 1980-04-03 |
SE333613B (en, 2012) | 1971-03-22 |
BE694869A (en, 2012) | 1967-09-01 |
US3529159A (en) | 1970-09-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CH460962A (de) | Halbleitervorrichtung zum Nachweisen und/oder Messen von Strahlung | |
AT310470B (de) | Vorrichtung zum messen von kraeften und momenten | |
FR1472596A (fr) | Appareil pour radiothérapie et mesures associées | |
CH531702A (de) | Einrichtung zum elektrischen Messen von Abstandsänderungen | |
AT288050B (de) | Einrichtung zum Messen von Längen oder Winkeln | |
CH481381A (de) | Einrichtung zum Messen der Geschwindigkeit oder Verschiebung und Verwendung dieser Messeinrichtung | |
CH458760A (de) | Vorrichtung zum Messen von Prüflingen und Verwendung der Vorrichtung | |
AT296658B (de) | Vorrichtung zum Messen der Opazität von Gasen | |
CH488190A (de) | Vorrichtung zum Messen von Fadengeschwindigkeiten und/oder Fadenlängen | |
AT308920B (de) | Halbleitervorrichtung zur Strahlungsdetektion | |
CH515488A (de) | Entfernungsmesseinrichtung | |
CH478686A (de) | Einrichtung zum Messen von lotrechten und/oder horizontalen Gleisfehlern | |
AT268713B (de) | Lichtelektrische Meßeinrichtung | |
AT287335B (de) | Vorrichtung zum Bestimmen der X- und Y-Koordinaten beliebiger Punkte | |
DE1811930B2 (de) | Vorrichtung zum messen von messgroessen | |
CH425257A (de) | Messeinrichtung mit radioaktiver Strahlungsquelle und Strahlungsdetektor | |
CH497708A (de) | Distanzmesseinrichtung | |
CH469274A (de) | Entfernungsmessgerät | |
FR1450654A (fr) | Perfectionnements aux dispositifs semi-conducteurs de détection de radiations ionisantes | |
DE6600059U (de) | Dickenmessgeraet | |
AT310469B (de) | Meßeinrichtung | |
CH503280A (de) | Signalmessvorrichtung | |
CH496941A (de) | Mess- und Anreissgerät | |
CH502746A (de) | Planare Halbleitervorrichtung und deren Verwendung | |
AT285718B (de) | Ortsveränderungsmeßvorrichtung |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PL | Patent ceased |