CH349643A - Dispositif susceptible d'emmagasiner une information - Google Patents
Dispositif susceptible d'emmagasiner une informationInfo
- Publication number
- CH349643A CH349643A CH349643DA CH349643A CH 349643 A CH349643 A CH 349643A CH 349643D A CH349643D A CH 349643DA CH 349643 A CH349643 A CH 349643A
- Authority
- CH
- Switzerland
- Prior art keywords
- device capable
- storing information
- storing
- information
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/45—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of non-linear magnetic or dielectric devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0466—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells with charge storage in an insulating layer, e.g. metal-nitride-oxide-silicon [MNOS], silicon-oxide-nitride-oxide-silicon [SONOS]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G7/00—Capacitors in which the capacitance is varied by non-mechanical means; Processes of their manufacture
- H01G7/02—Electrets, i.e. having a permanently-polarised dielectric
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G7/00—Capacitors in which the capacitance is varied by non-mechanical means; Processes of their manufacture
- H01G7/02—Electrets, i.e. having a permanently-polarised dielectric
- H01G7/021—Electrets, i.e. having a permanently-polarised dielectric having an organic dielectric
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/49—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
- H01L29/51—Insulating materials associated therewith
- H01L29/516—Insulating materials associated therewith with at least one ferroelectric layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/78391—Field effect transistors with field effect produced by an insulated gate the gate comprising a layer which is used for its ferroelectric properties
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/35—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of bipolar semiconductor devices with more than two PN junctions, or more than three electrodes, or more than one electrode connected to the same conductivity region
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
- G11C11/223—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements using MOS with ferroelectric gate insulating film
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Semiconductor Memories (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US489141A US2791758A (en) | 1955-02-18 | 1955-02-18 | Semiconductive translating device |
US489223A US2791760A (en) | 1955-02-18 | 1955-02-18 | Semiconductive translating device |
Publications (1)
Publication Number | Publication Date |
---|---|
CH349643A true CH349643A (fr) | 1960-10-31 |
Family
ID=27049612
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CH349643D CH349643A (fr) | 1955-02-18 | 1956-02-17 | Dispositif susceptible d'emmagasiner une information |
Country Status (7)
Families Citing this family (77)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1097568B (de) * | 1955-05-27 | 1961-01-19 | Globe Union Inc | Verfahren zur Herstellung einer Halbleiteranordnung mit einem gleichmaessig gesinterten Koerper aus Erdalkalititanaten |
US2898477A (en) * | 1955-10-31 | 1959-08-04 | Bell Telephone Labor Inc | Piezoelectric field effect semiconductor device |
US2922986A (en) * | 1956-04-24 | 1960-01-26 | Bell Telephone Labor Inc | Ferroelectric memory device |
DE1166381B (de) * | 1956-07-06 | 1964-03-26 | Siemens Ag | Verstaerkendes Halbleiterbauelement mit einer isolierten Steuerelektrode ueber einemin Sperrichtung vorgespannten pn-UEbergang und Verfahren zu seinem Herstellen |
US3126509A (en) * | 1956-07-27 | 1964-03-24 | Electrical condenser having two electrically | |
US2900531A (en) * | 1957-02-28 | 1959-08-18 | Rca Corp | Field-effect transistor |
BE552928A (US06174465-20010116-C00003.png) * | 1957-03-18 | |||
NL218993A (US06174465-20010116-C00003.png) * | 1957-07-15 | |||
DE1051412B (de) * | 1957-09-12 | 1959-02-26 | Siemens Ag | Temperaturbeeinflussbare Halbleiteranordnung mit zwei pn-UEbergaengen |
US3010033A (en) * | 1958-01-02 | 1961-11-21 | Clevite Corp | Field effect transistor |
NL237225A (US06174465-20010116-C00003.png) * | 1958-03-19 | |||
US3040266A (en) * | 1958-06-16 | 1962-06-19 | Union Carbide Corp | Surface field effect transistor amplifier |
US3109163A (en) * | 1958-12-08 | 1963-10-29 | Gen Mills Inc | Memory system and method utilizing a semiconductor containing a grain boundary |
NL246032A (US06174465-20010116-C00003.png) * | 1959-01-27 | |||
US3032706A (en) * | 1959-03-18 | 1962-05-01 | Herman H Wieder | Four terminal ferroelectric crystals |
US2994811A (en) * | 1959-05-04 | 1961-08-01 | Bell Telephone Labor Inc | Electrostatic field-effect transistor having insulated electrode controlling field in depletion region of reverse-biased junction |
NL250955A (US06174465-20010116-C00003.png) * | 1959-08-05 | |||
US3154692A (en) * | 1960-01-08 | 1964-10-27 | Clevite Corp | Voltage regulating semiconductor device |
NL267831A (US06174465-20010116-C00003.png) * | 1960-08-17 | |||
NL274072A (US06174465-20010116-C00003.png) * | 1961-02-02 | |||
NL274830A (US06174465-20010116-C00003.png) * | 1961-04-12 | |||
GB1007936A (en) * | 1961-04-26 | 1965-10-22 | Clevite Corp | Improvements in or relating to semiconductive devices |
US3152928A (en) * | 1961-05-18 | 1964-10-13 | Clevite Corp | Semiconductor device and method |
NL282170A (US06174465-20010116-C00003.png) * | 1961-08-17 | |||
FR1336813A (fr) * | 1962-07-25 | 1963-09-06 | Csf | Dispositif de mesure des contraintes à semi-conducteur |
NL297002A (US06174465-20010116-C00003.png) * | 1962-08-23 | 1900-01-01 | ||
NL301034A (US06174465-20010116-C00003.png) * | 1962-11-27 | |||
NL301882A (US06174465-20010116-C00003.png) * | 1962-12-17 | |||
US3472703A (en) * | 1963-06-06 | 1969-10-14 | Hitachi Ltd | Method for producing semiconductor devices |
US3360736A (en) * | 1963-09-10 | 1967-12-26 | Hitachi Ltd | Two input field effect transistor amplifier |
US3275911A (en) * | 1963-11-06 | 1966-09-27 | Motorola Inc | Semiconductor current limiter |
US3290569A (en) * | 1964-02-14 | 1966-12-06 | Rca Corp | Tellurium thin film field effect solid state electrical devices |
US3400383A (en) * | 1964-08-05 | 1968-09-03 | Texas Instruments Inc | Trainable decision system and adaptive memory element |
US3484309A (en) * | 1964-11-09 | 1969-12-16 | Solitron Devices | Semiconductor device with a portion having a varying lateral resistivity |
GB1153428A (en) | 1965-06-18 | 1969-05-29 | Philips Nv | Improvements in Semiconductor Devices. |
DE1514495C3 (de) * | 1965-07-01 | 1974-10-17 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Halbleiteranordnung |
US3523188A (en) * | 1965-12-20 | 1970-08-04 | Xerox Corp | Semiconductor current control device and method |
US3384794A (en) * | 1966-03-08 | 1968-05-21 | Bell Telephone Laboraotries In | Superconductive logic device |
US3430203A (en) * | 1966-06-28 | 1969-02-25 | Texas Instruments Inc | Trainable decision system utilizing metal-oxide-semiconductor field effect transistors |
US3443175A (en) * | 1967-03-22 | 1969-05-06 | Rca Corp | Pn-junction semiconductor with polycrystalline layer on one region |
CH461646A (de) * | 1967-04-18 | 1968-08-31 | Ibm | Feld-Effekt-Transistor und Verfahren zu seiner Herstellung |
US3508211A (en) * | 1967-06-23 | 1970-04-21 | Sperry Rand Corp | Electrically alterable non-destructive readout field effect transistor memory |
US3463973A (en) * | 1967-09-12 | 1969-08-26 | Rca Corp | Insulating ferroelectric gate adaptive resistor |
US3531696A (en) * | 1967-09-30 | 1970-09-29 | Nippon Electric Co | Semiconductor device with hysteretic capacity vs. voltage characteristics |
US3590337A (en) * | 1968-10-14 | 1971-06-29 | Sperry Rand Corp | Plural dielectric layered electrically alterable non-destructive readout memory element |
US3591852A (en) * | 1969-01-21 | 1971-07-06 | Gen Electric | Nonvolatile field effect transistor counter |
US3832700A (en) * | 1973-04-24 | 1974-08-27 | Westinghouse Electric Corp | Ferroelectric memory device |
JPS5027901Y1 (US06174465-20010116-C00003.png) * | 1973-11-07 | 1975-08-18 | ||
DE3370252D1 (en) * | 1982-12-28 | 1987-04-16 | Toshiaki Ikoma | Voltage-control type semiconductor switching device |
KR930002470B1 (ko) * | 1989-03-28 | 1993-04-02 | 가부시키가이샤 도시바 | 전기적인 독출/기록동작이 가능한 불휘발성 반도체기억장치 및 그 정보독출방법 |
KR920704360A (ko) * | 1990-02-26 | 1992-12-19 | 시메트릭스 코포레이션 | 전자장치, 메모리 매트릭스 및 그 신경망 |
JP3374216B2 (ja) * | 1991-10-26 | 2003-02-04 | ローム株式会社 | 強誘電体層を有する半導体素子 |
US6537830B1 (en) | 1992-10-23 | 2003-03-25 | Symetrix Corporation | Method of making ferroelectric FET with polycrystalline crystallographically oriented ferroelectric material |
US5523964A (en) * | 1994-04-07 | 1996-06-04 | Symetrix Corporation | Ferroelectric non-volatile memory unit |
US6373743B1 (en) | 1999-08-30 | 2002-04-16 | Symetrix Corporation | Ferroelectric memory and method of operating same |
US5644533A (en) * | 1992-11-02 | 1997-07-01 | Nvx Corporation | Flash memory system, and methods of constructing and utilizing same |
US6013950A (en) * | 1994-05-19 | 2000-01-11 | Sandia Corporation | Semiconductor diode with external field modulation |
US5541870A (en) * | 1994-10-28 | 1996-07-30 | Symetrix Corporation | Ferroelectric memory and non-volatile memory cell for same |
US5578846A (en) * | 1995-03-17 | 1996-11-26 | Evans, Jr.; Joseph T. | Static ferroelectric memory transistor having improved data retention |
JP3805001B2 (ja) * | 1995-06-08 | 2006-08-02 | 株式会社ルネサステクノロジ | 半導体装置 |
US5742076A (en) * | 1996-06-05 | 1998-04-21 | North Carolina State University | Silicon carbide switching devices having near ideal breakdown voltage capability and ultralow on-state resistance |
US5767543A (en) * | 1996-09-16 | 1998-06-16 | Motorola, Inc. | Ferroelectric semiconductor device having a layered ferroelectric structure |
US6339238B1 (en) | 1998-10-13 | 2002-01-15 | Symetrix Corporation | Ferroelectric field effect transistor, memory utilizing same, and method of operating same |
US6441414B1 (en) | 1998-10-13 | 2002-08-27 | Symetrix Corporation | Ferroelectric field effect transistor, memory utilizing same, and method of operating same |
US6255121B1 (en) | 1999-02-26 | 2001-07-03 | Symetrix Corporation | Method for fabricating ferroelectric field effect transistor having an interface insulator layer formed by a liquid precursor |
US6236076B1 (en) | 1999-04-29 | 2001-05-22 | Symetrix Corporation | Ferroelectric field effect transistors for nonvolatile memory applications having functional gradient material |
US20050094457A1 (en) * | 1999-06-10 | 2005-05-05 | Symetrix Corporation | Ferroelectric memory and method of operating same |
TW475267B (en) | 1999-07-13 | 2002-02-01 | Toshiba Corp | Semiconductor memory |
US8030575B2 (en) * | 2005-12-29 | 2011-10-04 | Sensor Electronic Technology, Inc. | Mounting structure providing electrical surge protection |
KR100653954B1 (ko) * | 2006-01-19 | 2006-12-05 | 한국표준과학연구원 | 나노전자소자 및 그 제조방법 |
RU2383945C2 (ru) * | 2006-06-09 | 2010-03-10 | Юрий Генрихович Кригер | Методы неразрушаемого считывания информации с ферроэлектрических элементов памяти |
US8064255B2 (en) * | 2007-12-31 | 2011-11-22 | Cypress Semiconductor Corporation | Architecture of a nvDRAM array and its sense regime |
US8059458B2 (en) * | 2007-12-31 | 2011-11-15 | Cypress Semiconductor Corporation | 3T high density nvDRAM cell |
DE102008008699B4 (de) * | 2008-02-11 | 2010-09-09 | Eads Deutschland Gmbh | Abstimmbarer planarer ferroelektrischer Kondensator |
US7700985B2 (en) * | 2008-06-24 | 2010-04-20 | Seagate Technology Llc | Ferroelectric memory using multiferroics |
WO2013017131A2 (de) * | 2011-07-12 | 2013-02-07 | Helmholtz-Zentrum Dresden - Rossendorf E.V. | Integrierte nichtflüchtige speicherelemente, aufbau und verwendung |
EP3413325A4 (en) * | 2016-02-04 | 2019-10-09 | Sekisui Chemical Co., Ltd. | ELECTRET FILM |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2773250A (en) * | 1953-05-13 | 1956-12-04 | Int Standard Electric Corp | Device for storing information |
US2695398A (en) * | 1953-06-16 | 1954-11-23 | Bell Telephone Labor Inc | Ferroelectric storage circuits |
-
0
- NL NL97896D patent/NL97896C/xx active
- NL NL202404D patent/NL202404A/xx unknown
- BE BE545324D patent/BE545324A/xx unknown
-
1955
- 1955-02-18 US US489141A patent/US2791758A/en not_active Expired - Lifetime
- 1955-02-18 US US489223A patent/US2791760A/en not_active Expired - Lifetime
-
1956
- 1956-01-24 DE DEW18292A patent/DE1024119B/de active Pending
- 1956-01-30 FR FR1145450D patent/FR1145450A/fr not_active Expired
- 1956-02-17 CH CH349643D patent/CH349643A/fr unknown
- 1956-02-17 GB GB5013/56A patent/GB810452A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
US2791760A (en) | 1957-05-07 |
US2791758A (en) | 1957-05-07 |
DE1024119B (de) | 1958-02-13 |
GB810452A (en) | 1959-03-18 |
NL97896C (US06174465-20010116-C00003.png) | |
FR1145450A (fr) | 1957-10-25 |
BE545324A (US06174465-20010116-C00003.png) | |
NL202404A (US06174465-20010116-C00003.png) |
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