CH302299A - Magnetische Querfeldlinse, insbesondere für Elektronenmikroskope. - Google Patents

Magnetische Querfeldlinse, insbesondere für Elektronenmikroskope.

Info

Publication number
CH302299A
CH302299A CH302299DA CH302299A CH 302299 A CH302299 A CH 302299A CH 302299D A CH302299D A CH 302299DA CH 302299 A CH302299 A CH 302299A
Authority
CH
Switzerland
Prior art keywords
field lens
electron microscopes
transverse field
magnetic transverse
magnetic
Prior art date
Application number
Other languages
German (de)
English (en)
Inventor
Gloeilampenfabrieken N Philips
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Publication of CH302299A publication Critical patent/CH302299A/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
    • H01J29/58—Arrangements for focusing or reflecting ray or beam
    • H01J29/64—Magnetic lenses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Electron Beam Exposure (AREA)
CH302299D 1951-02-10 1952-02-08 Magnetische Querfeldlinse, insbesondere für Elektronenmikroskope. CH302299A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL302299X 1951-02-10

Publications (1)

Publication Number Publication Date
CH302299A true CH302299A (de) 1954-10-15

Family

ID=19783341

Family Applications (1)

Application Number Title Priority Date Filing Date
CH302299D CH302299A (de) 1951-02-10 1952-02-08 Magnetische Querfeldlinse, insbesondere für Elektronenmikroskope.

Country Status (6)

Country Link
US (1) US2777958A (ru)
BE (1) BE509097A (ru)
CH (1) CH302299A (ru)
DE (1) DE911878C (ru)
FR (1) FR1058851A (ru)
GB (1) GB753562A (ru)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2872574A (en) * 1956-04-12 1959-02-03 Edwin M Mcmillan Cloverleaf cyclotron
GB846898A (en) * 1956-10-25 1960-08-31 Nat Res Dev Improvements in or relating to electrion lenses
NL91617C (ru) * 1957-02-16 1900-01-01
NL225017A (ru) * 1957-02-19
US2931903A (en) * 1957-06-17 1960-04-05 High Voltage Engineering Corp Acceleration and application of high intensity electron beams for radiation processing
US3360647A (en) * 1964-09-14 1967-12-26 Varian Associates Electron accelerator with specific deflecting magnet structure and x-ray target
CH393535A (de) * 1961-09-26 1965-06-15 Trueb Taeuber & Co Ag Magnetanordnung zur Erzeugung von Magnetfeldern veränderbarer Feldstärke mit konstanter geometrischer Konfiguration
US3243667A (en) * 1962-04-09 1966-03-29 High Voltage Engineering Corp Non dispersive magnetic deflection apparatus and method
GB1074625A (en) * 1963-04-24 1967-07-05 Ass Elect Ind Improvements relating to magnetic spectrometers
US3379911A (en) * 1965-06-11 1968-04-23 High Voltage Engineering Corp Particle accelerator provided with an adjustable 270deg. non-dispersive magnetic charged-particle beam bender
US3516037A (en) * 1967-12-05 1970-06-02 High Voltage Engineering Corp Nondispersive magnetic deflection method
FR2036373A5 (ru) * 1969-03-12 1970-12-24 Thomson Csf
FR2043973A5 (ru) * 1969-05-05 1971-02-19 Thomson Csf
US3659236A (en) * 1970-08-05 1972-04-25 Us Air Force Inhomogeneity variable magnetic field magnet
NL7012758A (ru) * 1970-08-28 1972-03-01
US3655902A (en) * 1970-10-19 1972-04-11 Air Reduction Heating system for electron beam furnace
US3673528A (en) * 1971-03-01 1972-06-27 Gen Electric Wide frequency response line scan magnetic deflector
US4281251A (en) * 1979-08-06 1981-07-28 Radiation Dynamics, Inc. Scanning beam deflection system and method
US4922106A (en) * 1986-04-09 1990-05-01 Varian Associates, Inc. Ion beam scanning method and apparatus
US4980562A (en) * 1986-04-09 1990-12-25 Varian Associates, Inc. Method and apparatus for high efficiency scanning in an ion implanter
US4745281A (en) * 1986-08-25 1988-05-17 Eclipse Ion Technology, Inc. Ion beam fast parallel scanning having dipole magnetic lens with nonuniform field
US5053627A (en) * 1990-03-01 1991-10-01 Ibis Technology Corporation Apparatus for ion implantation
US5279723A (en) * 1992-07-30 1994-01-18 As Represented By The United States Department Of Energy Filtered cathodic arc source
US5319339A (en) * 1993-03-08 1994-06-07 The United States Of America As Represented By The Secretary Of The Army Tubular structure having transverse magnetic field with gradient
AU1067799A (en) * 1997-10-07 1999-04-27 Sti Optronics Inc. Magnetic separator for linear dispersion and method for producing the same
US6677599B2 (en) * 2000-03-27 2004-01-13 Applied Materials, Inc. System and method for uniformly implanting a wafer with an ion beam
AU2001270133A1 (en) 2000-06-22 2002-01-02 Proteros, Llc Ion implantation uniformity correction using beam current control

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2636999A (en) * 1953-04-28 x x x x i
DE639469C (de) * 1934-12-20 1936-12-10 Fernseh Akt Ges Magnetisch-elektrisches Ablenksystem fuer Braunsche Roehren, insbesondere fuer Fernsehzwecke
US2272165A (en) * 1938-03-01 1942-02-03 Univ Leland Stanford Junior High frequency electrical apparatus
US2260041A (en) * 1939-03-22 1941-10-21 Gen Electric Electron microscope
US2469964A (en) * 1941-05-03 1949-05-10 Bell Telephone Labor Inc Electron discharge apparatus
US2551544A (en) * 1944-09-20 1951-05-01 Alfred O C Nicr Mass spectrometer
US2457495A (en) * 1944-12-18 1948-12-28 Sylvania Electric Prod Ultra high frequency tube
US2447260A (en) * 1945-06-21 1948-08-17 Research Corp Electron microspectroscope
US2429558A (en) * 1945-08-24 1947-10-21 Research Corp Electron beam monochromator
US2435386A (en) * 1946-07-27 1948-02-03 Rca Corp Electron diffraction camera
US2533687A (en) * 1949-05-27 1950-12-12 Quam Nichols Company Magnetic focusing device

Also Published As

Publication number Publication date
US2777958A (en) 1957-01-15
BE509097A (ru)
GB753562A (en) 1956-07-25
DE911878C (de) 1954-05-20
FR1058851A (fr) 1954-03-19

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