CH302722A - Elektronenmikroskop. - Google Patents
Elektronenmikroskop.Info
- Publication number
- CH302722A CH302722A CH302722DA CH302722A CH 302722 A CH302722 A CH 302722A CH 302722D A CH302722D A CH 302722DA CH 302722 A CH302722 A CH 302722A
- Authority
- CH
- Switzerland
- Prior art keywords
- electron microscope
- microscope
- electron
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/10—Lenses
- H01J37/14—Lenses magnetic
- H01J37/141—Electromagnetic lenses
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Sources, Ion Sources (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL302722X | 1951-06-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
CH302722A true CH302722A (de) | 1954-10-31 |
Family
ID=19783367
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CH302722D CH302722A (de) | 1951-06-15 | 1952-06-13 | Elektronenmikroskop. |
Country Status (6)
Country | Link |
---|---|
US (1) | US2670450A (de) |
BE (1) | BE512056A (de) |
CH (1) | CH302722A (de) |
DE (1) | DE918464C (de) |
FR (1) | FR1071047A (de) |
GB (1) | GB711672A (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL103598C (de) * | 1957-03-13 | |||
DE1614407B1 (de) * | 1967-01-13 | 1972-08-03 | Siemens Ag | Anordnung zur erzeugung eines den korpuskularstrahl in einem korpuskulargeraet, insbesondere elektronenmikroskop, beeinflussenden elektromagnetischen feldes |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2418349A (en) * | 1945-12-13 | 1947-04-01 | Rca Corp | Method of and means for correcting for distortion in electron lens systems |
US2438971A (en) * | 1946-10-31 | 1948-04-06 | Rca Corp | Compound electron objective lens |
US2472315A (en) * | 1948-03-30 | 1949-06-07 | Rca Corp | Varying the gap spacing of pole pieces for electron optical apparatus |
-
0
- BE BE512056D patent/BE512056A/xx unknown
-
1952
- 1952-05-23 US US289685A patent/US2670450A/en not_active Expired - Lifetime
- 1952-06-11 DE DEN5633A patent/DE918464C/de not_active Expired
- 1952-06-12 GB GB14840/52A patent/GB711672A/en not_active Expired
- 1952-06-13 FR FR1071047D patent/FR1071047A/fr not_active Expired
- 1952-06-13 CH CH302722D patent/CH302722A/de unknown
Also Published As
Publication number | Publication date |
---|---|
DE918464C (de) | 1954-09-27 |
BE512056A (de) | |
FR1071047A (fr) | 1954-08-24 |
US2670450A (en) | 1954-02-23 |
GB711672A (en) | 1954-07-07 |
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