CA3084917A1 - System and method for set up of production line inspection - Google Patents

System and method for set up of production line inspection Download PDF

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Publication number
CA3084917A1
CA3084917A1 CA3084917A CA3084917A CA3084917A1 CA 3084917 A1 CA3084917 A1 CA 3084917A1 CA 3084917 A CA3084917 A CA 3084917A CA 3084917 A CA3084917 A CA 3084917A CA 3084917 A1 CA3084917 A1 CA 3084917A1
Authority
CA
Canada
Prior art keywords
item
processor
defect free
images
same
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CA3084917A
Other languages
English (en)
French (fr)
Inventor
Yonatan HYATT
Joel KOENKA
Harel BOREN
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Inspekto AMV Ltd
Original Assignee
Inspekto AMV Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inspekto AMV Ltd filed Critical Inspekto AMV Ltd
Publication of CA3084917A1 publication Critical patent/CA3084917A1/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/845—Objects on a conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/8893—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a video image and a processed signal for helping visual decision
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
CA3084917A 2017-12-29 2018-12-27 System and method for set up of production line inspection Pending CA3084917A1 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201762611551P 2017-12-29 2017-12-29
US62/611,551 2017-12-29
IL257256 2018-01-30
IL257256A IL257256A (en) 2018-01-30 2018-01-30 System and method for establishing production line tests
PCT/IL2018/051398 WO2019130307A1 (en) 2017-12-29 2018-12-27 System and method for set up of production line inspection

Publications (1)

Publication Number Publication Date
CA3084917A1 true CA3084917A1 (en) 2019-07-04

Family

ID=66624720

Family Applications (1)

Application Number Title Priority Date Filing Date
CA3084917A Pending CA3084917A1 (en) 2017-12-29 2018-12-27 System and method for set up of production line inspection

Country Status (9)

Country Link
US (2) US11562480B2 (cg-RX-API-DMAC7.html)
EP (1) EP3732464A4 (cg-RX-API-DMAC7.html)
JP (1) JP2021509716A (cg-RX-API-DMAC7.html)
KR (1) KR20200100086A (cg-RX-API-DMAC7.html)
CN (1) CN111527396A (cg-RX-API-DMAC7.html)
CA (1) CA3084917A1 (cg-RX-API-DMAC7.html)
IL (1) IL257256A (cg-RX-API-DMAC7.html)
MX (1) MX2020006757A (cg-RX-API-DMAC7.html)
WO (1) WO2019130307A1 (cg-RX-API-DMAC7.html)

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IL261733B (en) * 2018-09-13 2022-09-01 Inspekto A M V Ltd Streamlining an automatic visual inspection process
IL263097B2 (en) * 2018-11-18 2024-01-01 Inspekto A M V Ltd Optimizing a set-up stage in an automatic visual inspection process
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IL267563A (en) * 2019-06-20 2019-11-28 HYATT Yonatan Establishing a process for visual inspection
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JP7604190B2 (ja) * 2020-11-25 2024-12-23 キヤノン株式会社 検査システム、管理装置、検査方法、プログラム、記録媒体および物品の製造方法
JP7509033B2 (ja) * 2020-12-25 2024-07-02 新東工業株式会社 検査装置、検査方法、機械学習装置、及び機械学習方法
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CN114283269A (zh) * 2021-12-30 2022-04-05 深圳志涯科技有限公司 基于图像识别技术实现自动抓取检测衣服标签信息的方法
KR102907591B1 (ko) * 2023-01-04 2026-01-02 한양대학교 에리카산학협력단 사후 보정이 가능한 비지도 학습기반 불량 검사 방법 및 장치
CN115931905B (zh) * 2023-02-02 2023-09-26 北京百度网讯科技有限公司 Poy产品的检测方法、装置、电子设备和存储介质
CN118980694B (zh) * 2024-09-26 2024-12-20 无锡市广泰诚机械制造有限公司 一种涡轮蜗壳加工缺陷在线检测方法
KR102963716B1 (ko) * 2025-08-19 2026-05-18 주식회사 글로벌제조혁신네트웍 의료기기 제품 품질검사를 위한 지능형 비전 및 광 측정 자동화 시스템

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Also Published As

Publication number Publication date
US11562480B2 (en) 2023-01-24
EP3732464A4 (en) 2021-12-29
CN111527396A (zh) 2020-08-11
IL257256A (en) 2018-03-29
KR20200100086A (ko) 2020-08-25
BR112020012932A2 (pt) 2020-12-01
US12169924B2 (en) 2024-12-17
EP3732464A1 (en) 2020-11-04
US20230162347A1 (en) 2023-05-25
MX2020006757A (es) 2020-09-28
US20210012475A1 (en) 2021-01-14
JP2021509716A (ja) 2021-04-01
WO2019130307A1 (en) 2019-07-04
RU2020120935A (ru) 2022-01-31

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