JP2021509716A - 生産ライン検査の設定のためのシステムおよび方法 - Google Patents

生産ライン検査の設定のためのシステムおよび方法 Download PDF

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Publication number
JP2021509716A
JP2021509716A JP2020536544A JP2020536544A JP2021509716A JP 2021509716 A JP2021509716 A JP 2021509716A JP 2020536544 A JP2020536544 A JP 2020536544A JP 2020536544 A JP2020536544 A JP 2020536544A JP 2021509716 A JP2021509716 A JP 2021509716A
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item
defect
processor
image
same type
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Japanese (ja)
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JP2021509716A5 (cg-RX-API-DMAC7.html
Inventor
ハイアット，ヨナタン
コエンカ，ジョエル
ボレン，ハレル
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インスペクト，エー．エム．ブイ リミテッド
インスペクト，エー．エム．ブイ リミテッド
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Publication of JP2021509716A publication Critical patent/JP2021509716A/ja
Publication of JP2021509716A5 publication Critical patent/JP2021509716A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/845—Objects on a conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/8893—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a video image and a processed signal for helping visual decision
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP2020536544A 2017-12-29 2018-12-27 生産ライン検査の設定のためのシステムおよび方法 Pending JP2021509716A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201762611551P 2017-12-29 2017-12-29
US62/611,551 2017-12-29
IL257256 2018-01-30
IL257256A IL257256A (en) 2018-01-30 2018-01-30 System and method for establishing production line tests
PCT/IL2018/051398 WO2019130307A1 (en) 2017-12-29 2018-12-27 System and method for set up of production line inspection

Publications (2)

Publication Number Publication Date
JP2021509716A true JP2021509716A (ja) 2021-04-01
JP2021509716A5 JP2021509716A5 (cg-RX-API-DMAC7.html) 2022-01-11

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JP2020536544A Pending JP2021509716A (ja) 2017-12-29 2018-12-27 生産ライン検査の設定のためのシステムおよび方法

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US (2) US11562480B2 (cg-RX-API-DMAC7.html)
EP (1) EP3732464A4 (cg-RX-API-DMAC7.html)
JP (1) JP2021509716A (cg-RX-API-DMAC7.html)
KR (1) KR20200100086A (cg-RX-API-DMAC7.html)
CN (1) CN111527396A (cg-RX-API-DMAC7.html)
CA (1) CA3084917A1 (cg-RX-API-DMAC7.html)
IL (1) IL257256A (cg-RX-API-DMAC7.html)
MX (1) MX2020006757A (cg-RX-API-DMAC7.html)
WO (1) WO2019130307A1 (cg-RX-API-DMAC7.html)

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JP7568727B2 (ja) 2019-09-30 2024-10-16 ムサシ エーアイ ノース アメリカ インコーポレイテッド Ａｉ外観検査のためのシステム及び方法
IT201900021645A1 (it) * 2019-11-19 2021-05-19 Sacmi Apparato per l’ispezione ottica di sanitari
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JP7604190B2 (ja) * 2020-11-25 2024-12-23 キヤノン株式会社 検査システム、管理装置、検査方法、プログラム、記録媒体および物品の製造方法
JP7509033B2 (ja) * 2020-12-25 2024-07-02 新東工業株式会社 検査装置、検査方法、機械学習装置、及び機械学習方法
FR3120721B1 (fr) * 2021-03-10 2023-02-10 Airbus Helicopters Procédé de test d’un dispositif électroportatif
US20230011330A1 (en) * 2021-07-09 2023-01-12 At&T Intellectual Property I, L.P. Device condition determination
CN114283269A (zh) * 2021-12-30 2022-04-05 深圳志涯科技有限公司 基于图像识别技术实现自动抓取检测衣服标签信息的方法
KR102907591B1 (ko) * 2023-01-04 2026-01-02 한양대학교 에리카산학협력단 사후 보정이 가능한 비지도 학습기반 불량 검사 방법 및 장치
CN115931905B (zh) * 2023-02-02 2023-09-26 北京百度网讯科技有限公司 Poy产品的检测方法、装置、电子设备和存储介质
CN118980694B (zh) * 2024-09-26 2024-12-20 无锡市广泰诚机械制造有限公司 一种涡轮蜗壳加工缺陷在线检测方法

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Publication number Priority date Publication date Assignee Title
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Publication number Publication date
US11562480B2 (en) 2023-01-24
EP3732464A4 (en) 2021-12-29
CN111527396A (zh) 2020-08-11
IL257256A (en) 2018-03-29
KR20200100086A (ko) 2020-08-25
BR112020012932A2 (pt) 2020-12-01
US12169924B2 (en) 2024-12-17
EP3732464A1 (en) 2020-11-04
US20230162347A1 (en) 2023-05-25
CA3084917A1 (en) 2019-07-04
MX2020006757A (es) 2020-09-28
US20210012475A1 (en) 2021-01-14
WO2019130307A1 (en) 2019-07-04
RU2020120935A (ru) 2022-01-31

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