CA2045878C - Method for forming probe and apparatus therefor - Google Patents

Method for forming probe and apparatus therefor

Info

Publication number
CA2045878C
CA2045878C CA 2045878 CA2045878A CA2045878C CA 2045878 C CA2045878 C CA 2045878C CA 2045878 CA2045878 CA 2045878 CA 2045878 A CA2045878 A CA 2045878A CA 2045878 C CA2045878 C CA 2045878C
Authority
CA
Canada
Prior art keywords
probe
electrode
information
end portion
recording medium
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CA 2045878
Other languages
English (en)
French (fr)
Other versions
CA2045878A1 (en
Inventor
Toshimitsu Kawase
Akihiko Yamano
Ryo Kuroda
Hiroyasu Nose
Toshihiko Miyazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Publication of CA2045878A1 publication Critical patent/CA2045878A1/en
Application granted granted Critical
Publication of CA2045878C publication Critical patent/CA2045878C/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
CA 2045878 1990-07-09 1991-06-26 Method for forming probe and apparatus therefor Expired - Lifetime CA2045878C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP17955790A JP2802675B2 (ja) 1990-07-09 1990-07-09 プローブ形成方法及び装置
JP2-179557 1990-07-09

Publications (2)

Publication Number Publication Date
CA2045878A1 CA2045878A1 (en) 1992-01-10
CA2045878C true CA2045878C (en) 1997-08-19

Family

ID=16067822

Family Applications (1)

Application Number Title Priority Date Filing Date
CA 2045878 Expired - Lifetime CA2045878C (en) 1990-07-09 1991-06-26 Method for forming probe and apparatus therefor

Country Status (2)

Country Link
JP (1) JP2802675B2 (ja)
CA (1) CA2045878C (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0926427A (ja) * 1995-07-07 1997-01-28 Hewlett Packard Co <Hp> 位置決め装置、およびこれを用いたメディア移動型メモリ装置

Also Published As

Publication number Publication date
CA2045878A1 (en) 1992-01-10
JP2802675B2 (ja) 1998-09-24
JPH0466802A (ja) 1992-03-03

Similar Documents

Publication Publication Date Title
US5132533A (en) Method for forming probe and apparatus therefor
CA2046474C (en) Information detection apparatus and displacement information measurement apparatus
US5519686A (en) Encoder for controlling measurements in the range of a few angstroms
US5299184A (en) Information processing apparatus with held distance control on track edge detection
EP0378444B1 (en) Reproducing apparatus
Terris et al. Atomic force microscope-based data storage: track servo and wear study.
US5391871A (en) Scanning probe microscope
EP0674170B1 (en) Inter-atomic measurement techniques
EP0475365A2 (en) Tracking method for memory apparatus
EP0537642B1 (en) Information processing apparatus with tracking mechanism
CA2045878C (en) Method for forming probe and apparatus therefor
JP2003065935A (ja) 非接触原子間力顕微鏡、磁気力顕微鏡、および静電気力顕微鏡
EP0722077B1 (en) Information processing apparatus effecting probe position control with electrostatic forces
CA2031733C (en) Method for forming probe and apparatus therefor
EP0640963B1 (en) Recording and reproducing method and apparatus using a scanning probe
JP3353519B2 (ja) 力勾配検出方法、情報再生方法、情報再生装置及び情報記録再生装置
JPH04355231A (ja) トラッキング方法
JP2939006B2 (ja) 傾斜測定機構
Grigg et al. Scanning Probe Microscopy
JPH09326141A (ja) 情報記録装置及び情報記録方法
JPH09306046A (ja) 記録再生方法および記録再生装置
JP2002207328A (ja) 静電潜像読み取り方法及び装置

Legal Events

Date Code Title Description
EEER Examination request
MKLA Lapsed
MKEC Expiry (correction)

Effective date: 20121202