CA2045878A1 - Method for forming probe and apparatus therefor - Google Patents
Method for forming probe and apparatus thereforInfo
- Publication number
- CA2045878A1 CA2045878A1 CA 2045878 CA2045878A CA2045878A1 CA 2045878 A1 CA2045878 A1 CA 2045878A1 CA 2045878 CA2045878 CA 2045878 CA 2045878 A CA2045878 A CA 2045878A CA 2045878 A1 CA2045878 A1 CA 2045878A1
- Authority
- CA
- Canada
- Prior art keywords
- probe
- electrode
- position controller
- information
- apparatus therefor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
Abstract
Information reading and/or inputting apparatus has a probe, an electrodes, a detector, a position controller and a probe and portion forming device.
By positioning the probe close to an information medium, information reading/inputting is effected in the apparatus. A voltage is applied to the probe through the electrode. Information on distance between the electrode and the probe is detected by the detector and whereby the relative position of the probe to the electrode is controlled by the position controller. The end portion of the probe is reformed in such a manner that a voltage is applied to the end portion of the probe through the electrode under controlling the relative position of the probe to the electrode by the position controller. A high reliable performance for the apparatus can always be attained by the probe reforming mechanism.
By positioning the probe close to an information medium, information reading/inputting is effected in the apparatus. A voltage is applied to the probe through the electrode. Information on distance between the electrode and the probe is detected by the detector and whereby the relative position of the probe to the electrode is controlled by the position controller. The end portion of the probe is reformed in such a manner that a voltage is applied to the end portion of the probe through the electrode under controlling the relative position of the probe to the electrode by the position controller. A high reliable performance for the apparatus can always be attained by the probe reforming mechanism.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17955790A JP2802675B2 (en) | 1990-07-09 | 1990-07-09 | Probe forming method and apparatus |
JP2-179557 | 1990-07-09 |
Publications (2)
Publication Number | Publication Date |
---|---|
CA2045878A1 true CA2045878A1 (en) | 1992-01-10 |
CA2045878C CA2045878C (en) | 1997-08-19 |
Family
ID=16067822
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA 2045878 Expired - Lifetime CA2045878C (en) | 1990-07-09 | 1991-06-26 | Method for forming probe and apparatus therefor |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP2802675B2 (en) |
CA (1) | CA2045878C (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0926427A (en) * | 1995-07-07 | 1997-01-28 | Hewlett Packard Co <Hp> | Positioning device and media moving type memory device usingpositioning device |
-
1990
- 1990-07-09 JP JP17955790A patent/JP2802675B2/en not_active Expired - Fee Related
-
1991
- 1991-06-26 CA CA 2045878 patent/CA2045878C/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0466802A (en) | 1992-03-03 |
JP2802675B2 (en) | 1998-09-24 |
CA2045878C (en) | 1997-08-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EEER | Examination request | ||
MKLA | Lapsed | ||
MKEC | Expiry (correction) |
Effective date: 20121202 |