CA2045878A1 - Method for forming probe and apparatus therefor - Google Patents

Method for forming probe and apparatus therefor

Info

Publication number
CA2045878A1
CA2045878A1 CA 2045878 CA2045878A CA2045878A1 CA 2045878 A1 CA2045878 A1 CA 2045878A1 CA 2045878 CA2045878 CA 2045878 CA 2045878 A CA2045878 A CA 2045878A CA 2045878 A1 CA2045878 A1 CA 2045878A1
Authority
CA
Canada
Prior art keywords
probe
electrode
position controller
information
apparatus therefor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA 2045878
Other languages
French (fr)
Other versions
CA2045878C (en
Inventor
Toshimitsu Kawase
Akihiko Yamano
Ryo Kuroda
Hiroyasu Nose
Toshihiko Miyazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Publication of CA2045878A1 publication Critical patent/CA2045878A1/en
Application granted granted Critical
Publication of CA2045878C publication Critical patent/CA2045878C/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)

Abstract

Information reading and/or inputting apparatus has a probe, an electrodes, a detector, a position controller and a probe and portion forming device.
By positioning the probe close to an information medium, information reading/inputting is effected in the apparatus. A voltage is applied to the probe through the electrode. Information on distance between the electrode and the probe is detected by the detector and whereby the relative position of the probe to the electrode is controlled by the position controller. The end portion of the probe is reformed in such a manner that a voltage is applied to the end portion of the probe through the electrode under controlling the relative position of the probe to the electrode by the position controller. A high reliable performance for the apparatus can always be attained by the probe reforming mechanism.
CA 2045878 1990-07-09 1991-06-26 Method for forming probe and apparatus therefor Expired - Lifetime CA2045878C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP17955790A JP2802675B2 (en) 1990-07-09 1990-07-09 Probe forming method and apparatus
JP2-179557 1990-07-09

Publications (2)

Publication Number Publication Date
CA2045878A1 true CA2045878A1 (en) 1992-01-10
CA2045878C CA2045878C (en) 1997-08-19

Family

ID=16067822

Family Applications (1)

Application Number Title Priority Date Filing Date
CA 2045878 Expired - Lifetime CA2045878C (en) 1990-07-09 1991-06-26 Method for forming probe and apparatus therefor

Country Status (2)

Country Link
JP (1) JP2802675B2 (en)
CA (1) CA2045878C (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0926427A (en) * 1995-07-07 1997-01-28 Hewlett Packard Co <Hp> Positioning device and media moving type memory device usingpositioning device

Also Published As

Publication number Publication date
JPH0466802A (en) 1992-03-03
JP2802675B2 (en) 1998-09-24
CA2045878C (en) 1997-08-19

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Legal Events

Date Code Title Description
EEER Examination request
MKLA Lapsed
MKEC Expiry (correction)

Effective date: 20121202