CA1243421A - Shallow junction complementary vertical bipolar transistor pair - Google Patents
Shallow junction complementary vertical bipolar transistor pairInfo
- Publication number
- CA1243421A CA1243421A CA000532447A CA532447A CA1243421A CA 1243421 A CA1243421 A CA 1243421A CA 000532447 A CA000532447 A CA 000532447A CA 532447 A CA532447 A CA 532447A CA 1243421 A CA1243421 A CA 1243421A
- Authority
- CA
- Canada
- Prior art keywords
- pnp
- npn
- base
- emitter
- forming
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0112—Integrating together multiple components covered by H10D8/00, H10D10/00 or H10D18/00, e.g. integrating multiple BJTs
- H10D84/0119—Integrating together multiple components covered by H10D8/00, H10D10/00 or H10D18/00, e.g. integrating multiple BJTs the components including complementary BJTs
- H10D84/0121—Integrating together multiple components covered by H10D8/00, H10D10/00 or H10D18/00, e.g. integrating multiple BJTs the components including complementary BJTs the complementary BJTs being vertical BJTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/60—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
- H10D84/67—Complementary BJTs
- H10D84/673—Vertical complementary BJTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
- H10W10/01—Manufacture or treatment
- H10W10/011—Manufacture or treatment of isolation regions comprising dielectric materials
- H10W10/014—Manufacture or treatment of isolation regions comprising dielectric materials using trench refilling with dielectric materials, e.g. shallow trench isolations
- H10W10/0148—Manufacture or treatment of isolation regions comprising dielectric materials using trench refilling with dielectric materials, e.g. shallow trench isolations comprising introducing impurities in side walls or bottom walls of trenches, e.g. for forming channel stoppers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
- H10W10/10—Isolation regions comprising dielectric materials
- H10W10/17—Isolation regions comprising dielectric materials formed using trench refilling with dielectric materials, e.g. shallow trench isolations
Landscapes
- Bipolar Transistors (AREA)
- Bipolar Integrated Circuits (AREA)
- Element Separation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US856,521 | 1986-04-28 | ||
| US06/856,521 US4719185A (en) | 1986-04-28 | 1986-04-28 | Method of making shallow junction complementary vertical bipolar transistor pair |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA1243421A true CA1243421A (en) | 1988-10-18 |
Family
ID=25323834
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA000532447A Expired CA1243421A (en) | 1986-04-28 | 1987-03-19 | Shallow junction complementary vertical bipolar transistor pair |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4719185A (enExample) |
| EP (1) | EP0243622B1 (enExample) |
| JP (1) | JPS62256465A (enExample) |
| CA (1) | CA1243421A (enExample) |
| DE (1) | DE3788453T2 (enExample) |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5051805A (en) * | 1987-07-15 | 1991-09-24 | Rockwell International Corporation | Sub-micron bipolar devices with sub-micron contacts |
| US5055418A (en) * | 1987-07-29 | 1991-10-08 | National Semiconductor Corporation | Process for fabricating complementary contactless vertical bipolar transistors |
| US5518937A (en) * | 1988-03-11 | 1996-05-21 | Fujitsu Limited | Semiconductor device having a region doped to a level exceeding the solubility limit |
| US5270224A (en) * | 1988-03-11 | 1993-12-14 | Fujitsu Limited | Method of manufacturing a semiconductor device having a region doped to a level exceeding the solubility limit |
| US4900689A (en) * | 1988-12-08 | 1990-02-13 | Harris Corporation | Method of fabrication of isolated islands for complementary bipolar devices |
| US4910160A (en) * | 1989-06-06 | 1990-03-20 | National Semiconductor Corporation | High voltage complementary NPN/PNP process |
| US5206182A (en) * | 1989-06-08 | 1993-04-27 | United Technologies Corporation | Trench isolation process |
| US4997775A (en) * | 1990-02-26 | 1991-03-05 | Cook Robert K | Method for forming a complementary bipolar transistor structure including a self-aligned vertical PNP transistor |
| US5151378A (en) * | 1991-06-18 | 1992-09-29 | National Semiconductor Corporation | Self-aligned planar monolithic integrated circuit vertical transistor process |
| WO1993016494A1 (en) * | 1992-01-31 | 1993-08-19 | Analog Devices, Inc. | Complementary bipolar polysilicon emitter devices |
| KR950034673A (ko) * | 1994-04-20 | 1995-12-28 | 윌리엄 이. 힐러 | 로우-케이 유전체를 사용하는 트랜지스터 분리 방법 및 장치 |
| US5447884A (en) * | 1994-06-29 | 1995-09-05 | International Business Machines Corporation | Shallow trench isolation with thin nitride liner |
| US6649477B2 (en) * | 2001-10-04 | 2003-11-18 | General Semiconductor, Inc. | Method for fabricating a power semiconductor device having a voltage sustaining layer with a terraced trench facilitating formation of floating islands |
| US7736976B2 (en) * | 2001-10-04 | 2010-06-15 | Vishay General Semiconductor Llc | Method for fabricating a power semiconductor device having a voltage sustaining layer with a terraced trench facilitating formation of floating islands |
| US7226835B2 (en) * | 2001-12-28 | 2007-06-05 | Texas Instruments Incorporated | Versatile system for optimizing current gain in bipolar transistor structures |
| US6686244B2 (en) * | 2002-03-21 | 2004-02-03 | General Semiconductor, Inc. | Power semiconductor device having a voltage sustaining region that includes doped columns formed with a single ion implantation step |
| JP3967193B2 (ja) * | 2002-05-21 | 2007-08-29 | スパンション エルエルシー | 不揮発性半導体記憶装置及びその製造方法 |
| DE10358047A1 (de) * | 2003-12-05 | 2005-06-30 | IHP GmbH - Innovations for High Performance Microelectronics/Institut für innovative Mikroelektronik | Komplementäre Bipolar-Halbleitervorrichtung |
| US7691734B2 (en) * | 2007-03-01 | 2010-04-06 | International Business Machines Corporation | Deep trench based far subcollector reachthrough |
| US8766235B2 (en) * | 2012-03-08 | 2014-07-01 | Micron Technology, Inc. | Bipolar junction transistors and memory arrays |
| JP6333483B2 (ja) | 2014-12-24 | 2018-05-30 | スリーエム イノベイティブ プロパティズ カンパニー | リボン及びストランドを有するポリマーネット、及びその製造方法 |
| US10134721B2 (en) * | 2016-08-01 | 2018-11-20 | Texas Instruments Incorporated | Variable holding voltage silicon controlled rectifier using separate and distinct bipolars |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3930909A (en) * | 1966-10-21 | 1976-01-06 | U.S. Philips Corporation | Method of manufacturing a semiconductor device utilizing simultaneous outdiffusion during epitaxial growth |
| US3617827A (en) * | 1970-03-30 | 1971-11-02 | Albert Schmitz | Semiconductor device with complementary transistors |
| US3730786A (en) * | 1970-09-03 | 1973-05-01 | Ibm | Performance matched complementary pair transistors |
| IT946150B (it) * | 1971-12-15 | 1973-05-21 | Ates Componenti Elettron | Perfezionamento al processo plana re epistssiale per la produzione di circuiti integrati lineari di potenza |
| JPS5017180A (enExample) * | 1973-06-13 | 1975-02-22 | ||
| US4412376A (en) * | 1979-03-30 | 1983-11-01 | Ibm Corporation | Fabrication method for vertical PNP structure with Schottky barrier diode emitter utilizing ion implantation |
| JPS55156366A (en) * | 1979-05-24 | 1980-12-05 | Toshiba Corp | Semiconductor device |
| US4485552A (en) * | 1980-01-18 | 1984-12-04 | International Business Machines Corporation | Complementary transistor structure and method for manufacture |
| US4381953A (en) * | 1980-03-24 | 1983-05-03 | International Business Machines Corporation | Polysilicon-base self-aligned bipolar transistor process |
| US4339767A (en) * | 1980-05-05 | 1982-07-13 | International Business Machines Corporation | High performance PNP and NPN transistor structure |
| US4553318A (en) * | 1983-05-02 | 1985-11-19 | Rca Corporation | Method of making integrated PNP and NPN bipolar transistors and junction field effect transistor |
| JPS60194558A (ja) * | 1984-03-16 | 1985-10-03 | Hitachi Ltd | 半導体装置の製造方法 |
-
1986
- 1986-04-28 US US06/856,521 patent/US4719185A/en not_active Expired - Fee Related
-
1987
- 1987-01-20 JP JP62009212A patent/JPS62256465A/ja active Granted
- 1987-03-06 EP EP87103204A patent/EP0243622B1/en not_active Expired - Lifetime
- 1987-03-06 DE DE3788453T patent/DE3788453T2/de not_active Expired - Fee Related
- 1987-03-19 CA CA000532447A patent/CA1243421A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DE3788453T2 (de) | 1994-06-23 |
| JPS62256465A (ja) | 1987-11-09 |
| EP0243622B1 (en) | 1993-12-15 |
| EP0243622A3 (en) | 1990-11-28 |
| DE3788453D1 (de) | 1994-01-27 |
| EP0243622A2 (en) | 1987-11-04 |
| US4719185A (en) | 1988-01-12 |
| JPH0583195B2 (enExample) | 1993-11-25 |
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| CA1243421A (en) | Shallow junction complementary vertical bipolar transistor pair | |
| EP0061729B1 (en) | Process for producing integrated semiconductor device structures with a mesa configuration and structure of said type | |
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| EP0036082B1 (en) | A self-aligned process for providing an improved high performance bipolar transistor | |
| US4357622A (en) | Complementary transistor structure | |
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| JPS6028134B2 (ja) | 半導体構造体の形成方法 | |
| JPH0252422B2 (enExample) | ||
| JPH0420265B2 (enExample) | ||
| US4485552A (en) | Complementary transistor structure and method for manufacture | |
| EP0290763B1 (en) | High performance sidewall emitter transistor | |
| US4735912A (en) | Process of fabricating a semiconductor IC device | |
| DE68906095T2 (de) | Vertikaler Bipolartransistor. | |
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| US5063168A (en) | Process for making bipolar transistor with polysilicon stringer base contact | |
| EP0221742B1 (en) | Integrated circuit fabrication process for forming a bipolar transistor having extrinsic base regions | |
| US5882976A (en) | Method of fabricating a self-aligned double polysilicon NPN transistor with poly etch stop | |
| EP0166923A2 (en) | High performance bipolar transistor having a lightly doped guard ring disposed between the emitter and the extrinsic base region | |
| US6004855A (en) | Process for producing a high performance bipolar structure | |
| KR0182000B1 (ko) | 바이폴라 트랜지스터의 제조방법 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MKEX | Expiry |