CA1208810A - Method of manufacturing a semiconductor device by means of plasma etching - Google Patents
Method of manufacturing a semiconductor device by means of plasma etchingInfo
- Publication number
- CA1208810A CA1208810A CA000440705A CA440705A CA1208810A CA 1208810 A CA1208810 A CA 1208810A CA 000440705 A CA000440705 A CA 000440705A CA 440705 A CA440705 A CA 440705A CA 1208810 A CA1208810 A CA 1208810A
- Authority
- CA
- Canada
- Prior art keywords
- fluorine
- gas
- reactor
- silicon nitride
- gas mixture
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H10P50/283—
Landscapes
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NL8204437 | 1982-11-16 | ||
| NL8204437A NL8204437A (nl) | 1982-11-16 | 1982-11-16 | Werkwijze voor het vervaardigen van een halfgeleiderinrichting met behulp van plasma-etsen. |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA1208810A true CA1208810A (en) | 1986-07-29 |
Family
ID=19840600
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA000440705A Expired CA1208810A (en) | 1982-11-16 | 1983-11-08 | Method of manufacturing a semiconductor device by means of plasma etching |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US4717447A (index.php) |
| EP (1) | EP0109706B1 (index.php) |
| JP (1) | JPS59100539A (index.php) |
| CA (1) | CA1208810A (index.php) |
| DE (1) | DE3369600D1 (index.php) |
| NL (1) | NL8204437A (index.php) |
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61158143A (ja) * | 1984-12-29 | 1986-07-17 | Fujitsu Ltd | 窒化シリコン膜のエッチング方法 |
| US5180466A (en) * | 1984-12-29 | 1993-01-19 | Fujitsu Limited | Process for dry etching a silicon nitride layer |
| JPS6399533A (ja) * | 1986-05-31 | 1988-04-30 | Toshiba Corp | シリコン窒化膜のドライエツチング方法及びドライエツチング装置 |
| US4778583A (en) * | 1987-05-11 | 1988-10-18 | Eastman Kodak Company | Semiconductor etching process which produces oriented sloped walls |
| DE3854561T2 (de) * | 1987-07-02 | 1996-05-02 | Toshiba Kawasaki Kk | Verfahren zum Trockenätzen. |
| US4844773A (en) * | 1987-07-16 | 1989-07-04 | Texas Instruments Incorporated | Process for etching silicon nitride film |
| KR930005440B1 (ko) * | 1989-10-02 | 1993-06-21 | 다이닛뽕 스쿠린 세이소오 가부시키가이샤 | 절연막의 선택적 제거방법 |
| EP0424299A3 (en) * | 1989-10-20 | 1991-08-28 | International Business Machines Corporation | Selective silicon nitride plasma etching |
| US5188704A (en) * | 1989-10-20 | 1993-02-23 | International Business Machines Corporation | Selective silicon nitride plasma etching |
| JPH04302426A (ja) * | 1991-03-29 | 1992-10-26 | Sony Corp | デジタル・エッチング方法 |
| DE4232475C2 (de) * | 1992-09-28 | 1998-07-02 | Siemens Ag | Verfahren zum plasmachemischen Trockenätzen von Si¶3¶N¶4¶-Schichten hochselektiv zu SiO¶2¶-Schichten |
| US5338395A (en) * | 1993-03-10 | 1994-08-16 | Micron Semiconductor, Inc. | Method for enhancing etch uniformity useful in etching submicron nitride features |
| DE4315435C2 (de) * | 1993-05-08 | 1995-03-09 | Itt Ind Gmbh Deutsche | Verfahren zum selektiven Ätzen von auf einem Halbleitersubstrat angeordneten Isolier- und Pufferschichten |
| US5983828A (en) * | 1995-10-13 | 1999-11-16 | Mattson Technology, Inc. | Apparatus and method for pulsed plasma processing of a semiconductor substrate |
| US6794301B2 (en) | 1995-10-13 | 2004-09-21 | Mattson Technology, Inc. | Pulsed plasma processing of semiconductor substrates |
| US6253704B1 (en) | 1995-10-13 | 2001-07-03 | Mattson Technology, Inc. | Apparatus and method for pulsed plasma processing of a semiconductor substrate |
| US5877090A (en) * | 1997-06-03 | 1999-03-02 | Applied Materials, Inc. | Selective plasma etching of silicon nitride in presence of silicon or silicon oxides using mixture of NH3 or SF6 and HBR and N2 |
| US6165375A (en) * | 1997-09-23 | 2000-12-26 | Cypress Semiconductor Corporation | Plasma etching method |
| US6294102B1 (en) * | 1999-05-05 | 2001-09-25 | International Business Machines Corporation | Selective dry etch of a dielectric film |
| US6372634B1 (en) | 1999-06-15 | 2002-04-16 | Cypress Semiconductor Corp. | Plasma etch chemistry and method of improving etch control |
| US6322716B1 (en) | 1999-08-30 | 2001-11-27 | Cypress Semiconductor Corp. | Method for conditioning a plasma etch chamber |
| US7803639B2 (en) * | 2007-01-04 | 2010-09-28 | International Business Machines Corporation | Method of forming vertical contacts in integrated circuits |
| US8008095B2 (en) * | 2007-10-03 | 2011-08-30 | International Business Machines Corporation | Methods for fabricating contacts to pillar structures in integrated circuits |
| US8563225B2 (en) | 2008-05-23 | 2013-10-22 | International Business Machines Corporation | Forming a self-aligned hard mask for contact to a tunnel junction |
| JP5537324B2 (ja) * | 2010-08-05 | 2014-07-02 | 株式会社東芝 | 半導体装置の製造方法 |
| EP3624171B1 (en) | 2017-06-08 | 2021-09-08 | Showa Denko K.K. | Etching method |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4211601A (en) * | 1978-07-31 | 1980-07-08 | Bell Telephone Laboratories, Incorporated | Device fabrication by plasma etching |
| US4208241A (en) * | 1978-07-31 | 1980-06-17 | Bell Telephone Laboratories, Incorporated | Device fabrication by plasma etching |
| US4226665A (en) * | 1978-07-31 | 1980-10-07 | Bell Telephone Laboratories, Incorporated | Device fabrication by plasma etching |
| NL8004005A (nl) * | 1980-07-11 | 1982-02-01 | Philips Nv | Werkwijze voor het vervaardigen van een halfgeleiderinrichting. |
| US4450042A (en) * | 1982-07-06 | 1984-05-22 | Texas Instruments Incorporated | Plasma etch chemistry for anisotropic etching of silicon |
-
1982
- 1982-11-16 NL NL8204437A patent/NL8204437A/nl not_active Application Discontinuation
-
1983
- 1983-10-31 US US06/547,178 patent/US4717447A/en not_active Expired - Fee Related
- 1983-11-08 CA CA000440705A patent/CA1208810A/en not_active Expired
- 1983-11-10 DE DE8383201609T patent/DE3369600D1/de not_active Expired
- 1983-11-10 EP EP83201609A patent/EP0109706B1/en not_active Expired
- 1983-11-12 JP JP58211730A patent/JPS59100539A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59100539A (ja) | 1984-06-09 |
| US4717447A (en) | 1988-01-05 |
| EP0109706A1 (en) | 1984-05-30 |
| DE3369600D1 (en) | 1987-03-05 |
| NL8204437A (nl) | 1984-06-18 |
| EP0109706B1 (en) | 1987-01-28 |
| JPH0527245B2 (index.php) | 1993-04-20 |
Similar Documents
| Publication | Publication Date | Title |
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| CA1208810A (en) | Method of manufacturing a semiconductor device by means of plasma etching | |
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| US5188704A (en) | Selective silicon nitride plasma etching | |
| US4174251A (en) | Method of selective gas etching on a silicon nitride layer | |
| US4678539A (en) | Dry-etching method | |
| EP0004285A1 (en) | A method of plasma etching silica at a faster rate than silicon in an article comprising both | |
| US5908735A (en) | Method of removing polymer of semiconductor device | |
| US5387312A (en) | High selective nitride etch | |
| JPH1098029A (ja) | 基板から有機反射防止膜をエッチングする処理法 | |
| US6069087A (en) | Highly selective dry etching process | |
| US6277759B1 (en) | Plasma etching methods | |
| EP0203560A1 (en) | Plasma trench etch | |
| US5180466A (en) | Process for dry etching a silicon nitride layer | |
| US5338395A (en) | Method for enhancing etch uniformity useful in etching submicron nitride features | |
| US6429140B1 (en) | Method of etching of photoresist layer | |
| JPS59222933A (ja) | エツチング方法 | |
| JP3124599B2 (ja) | エッチング方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MKEX | Expiry |