CA1197322A - Appareil de verification dynamique en circuit d'elements numeriques - Google Patents

Appareil de verification dynamique en circuit d'elements numeriques

Info

Publication number
CA1197322A
CA1197322A CA000444461A CA444461A CA1197322A CA 1197322 A CA1197322 A CA 1197322A CA 000444461 A CA000444461 A CA 000444461A CA 444461 A CA444461 A CA 444461A CA 1197322 A CA1197322 A CA 1197322A
Authority
CA
Canada
Prior art keywords
test
library
signals
block
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA000444461A
Other languages
English (en)
Inventor
Milan Slamka
Mandouh H. Rassem
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thalamus Electronics Inc
Original Assignee
Thalamus Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thalamus Electronics Inc filed Critical Thalamus Electronics Inc
Priority to CA000444461A priority Critical patent/CA1197322A/fr
Application granted granted Critical
Publication of CA1197322A publication Critical patent/CA1197322A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
CA000444461A 1983-12-29 1983-12-29 Appareil de verification dynamique en circuit d'elements numeriques Expired CA1197322A (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CA000444461A CA1197322A (fr) 1983-12-29 1983-12-29 Appareil de verification dynamique en circuit d'elements numeriques

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA000444461A CA1197322A (fr) 1983-12-29 1983-12-29 Appareil de verification dynamique en circuit d'elements numeriques

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CA000444461A Division CA1197322A (fr) 1983-12-29 1983-12-29 Appareil de verification dynamique en circuit d'elements numeriques

Related Child Applications (1)

Application Number Title Priority Date Filing Date
CA000444461A Division CA1197322A (fr) 1983-12-29 1983-12-29 Appareil de verification dynamique en circuit d'elements numeriques

Publications (1)

Publication Number Publication Date
CA1197322A true CA1197322A (fr) 1985-11-26

Family

ID=4126842

Family Applications (1)

Application Number Title Priority Date Filing Date
CA000444461A Expired CA1197322A (fr) 1983-12-29 1983-12-29 Appareil de verification dynamique en circuit d'elements numeriques

Country Status (1)

Country Link
CA (1) CA1197322A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1291662A2 (fr) * 2001-05-18 2003-03-12 Sony Computer Entertainment Inc. Système de débogage pour circuit intégré à semi-conducteur

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1291662A2 (fr) * 2001-05-18 2003-03-12 Sony Computer Entertainment Inc. Système de débogage pour circuit intégré à semi-conducteur
EP1291662A3 (fr) * 2001-05-18 2003-08-06 Sony Computer Entertainment Inc. Système de débogage pour circuit intégré à semi-conducteur

Similar Documents

Publication Publication Date Title
US4484329A (en) Apparatus for the dynamic in-circuit element-to-element comparison testing of electronic digital circuit elements
US4125763A (en) Automatic tester for microprocessor board
US4807161A (en) Automatic test equipment
KR890004450B1 (ko) 검사 벡터 인덱싱 방법 및 장치
US4620302A (en) Programmable digital signal testing system
KR970030813A (ko) 프로그래머블 게이트 어레이의 시험 및 동작을 위한 프로그램 가능 회로
US5809040A (en) Testable circuit configuration having a plurality of identical circuit blocks
JPH06249919A (ja) 半導体集積回路装置の端子間接続試験方法
CA1197322A (fr) Appareil de verification dynamique en circuit d'elements numeriques
US4390837A (en) Test unit for a logic circuit analyzer
GB2195029A (en) Testing electrical circuits
EP0157028A1 (fr) Dispositif d'essai programmable
US3814920A (en) Employing variable clock rate
CA1197323A (fr) Appareil de verification dynamique en circuit d'elements de circuits numeriques
JP2003240828A (ja) 回路の試験装置
KR970011582B1 (ko) 대규모 집적 회로 장치
CN102043695A (zh) 支持外部自动测试设备的电路板及外部控制该板的方法
CN201903876U (zh) 支持外部自动测试设备的电路板
US20040177303A1 (en) Analog-hybrid ic test system
US5600600A (en) Method for programming and testing a nonvolatile memory
RU2093885C1 (ru) Устройство для имитации отказов и внутрисхемного тестирования элементов дискретной аппаратуры
JPH0391195A (ja) メモリ回路
JPS60149980A (ja) 電子回路試験用の自動試験装置
JP2605858B2 (ja) 半導体集積回路装置のモニタダイナミックバーンインテスト装置
RU1778765C (ru) Устройство дл проверки монтажа

Legal Events

Date Code Title Description
MKEX Expiry