BRPI0517571A - processo de inspeção óptica, dispositivo de iluminação, e, posto de inspeção óptica - Google Patents

processo de inspeção óptica, dispositivo de iluminação, e, posto de inspeção óptica

Info

Publication number
BRPI0517571A
BRPI0517571A BRPI0517571-2A BRPI0517571A BRPI0517571A BR PI0517571 A BRPI0517571 A BR PI0517571A BR PI0517571 A BRPI0517571 A BR PI0517571A BR PI0517571 A BRPI0517571 A BR PI0517571A
Authority
BR
Brazil
Prior art keywords
optical inspection
lighting device
ring surface
inspection process
post
Prior art date
Application number
BRPI0517571-2A
Other languages
English (en)
Inventor
Olivier Colle
Original Assignee
Tiama
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tiama filed Critical Tiama
Publication of BRPI0517571A publication Critical patent/BRPI0517571A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9054—Inspection of sealing surface and container finish
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9018—Dirt detection in containers
    • G01N21/9027—Dirt detection in containers in containers after filling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9036—Investigating the presence of flaws or contamination in a container or its contents using arrays of emitters or receivers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/10—Image acquisition
    • G06V10/12—Details of acquisition arrangements; Constructional details thereof
    • G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
    • G06V10/145—Illumination specially adapted for pattern recognition, e.g. using gratings

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Artificial Intelligence (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PROCESSO DE INSPEçãO óPTICA, DISPOSITIVO DE ILUMINAçãO, E, POSTO DE INSPEçãO óPTICA. A invenção se refere a um dispositivo de iluminação (1) para um posto (2) próprio para determinar em uma imagem, a presença de defeitos na superficie (s) do anel de um recipiente (4) transparente ou translúcido. De acordo com a invenção, ele compreende: - pelo menos um sistema de iluminação (11, 20) que traz em qualquer ponto de uma superficie que engloba a superficie (s) de anel, uma iluminação quase constante de acordo com a totalidade ou parte das incidências compreendidas em pelo menos uma parte do ângulo sólido 2 <227> esterradiano, - e meios (12) para bloquear pelo menos uma parte dos raios luminosos que iluminam fora da superficie (s) de anel (3) e que são suscetíveis de provocar reflexos parasitas na imagem do anel.
BRPI0517571-2A 2004-11-09 2005-11-09 processo de inspeção óptica, dispositivo de iluminação, e, posto de inspeção óptica BRPI0517571A (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0411907A FR2877724B1 (fr) 2004-11-09 2004-11-09 Procede et dispositif d'eclairage pour determiner la presence de defauts sur la surface de la bague d'un recipient
PCT/FR2005/002792 WO2006051217A1 (fr) 2004-11-09 2005-11-09 Procede et dispositif d'eclairage pour determiner la presence de defauts sur la surface de la bague d'un recipient

Publications (1)

Publication Number Publication Date
BRPI0517571A true BRPI0517571A (pt) 2008-10-14

Family

ID=34950952

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0517571-2A BRPI0517571A (pt) 2004-11-09 2005-11-09 processo de inspeção óptica, dispositivo de iluminação, e, posto de inspeção óptica

Country Status (10)

Country Link
US (1) US8164746B2 (pt)
EP (1) EP1817574B8 (pt)
KR (1) KR20070119607A (pt)
CN (1) CN101084431B (pt)
BR (1) BRPI0517571A (pt)
FR (1) FR2877724B1 (pt)
MX (1) MX2007005602A (pt)
RU (1) RU2397477C2 (pt)
WO (1) WO2006051217A1 (pt)
ZA (1) ZA200703752B (pt)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7852521B2 (en) * 2006-06-06 2010-12-14 Canon Kabushiki Kaisha Recording medium determination apparatus and image forming apparatus
GB2482473A (en) * 2010-06-29 2012-02-08 Constar Internat Uk Ltd Inspection of articles
KR101015988B1 (ko) * 2010-08-19 2011-02-23 주식회사 디에이테크놀로지 폴리머 전극 비전 검사장치
KR101751394B1 (ko) 2011-06-02 2017-07-11 해성디에스 주식회사 인쇄회로기판 검사 장치 및 방법
CN102322593B (zh) * 2011-08-30 2013-06-19 成都四星液压制造有限公司 一种用于磁瓦的在线自动检测自适应光源装置及其控制方法
PL2708845T3 (pl) * 2012-09-13 2017-10-31 General Electric Technology Gmbh Sposób i system do określania jakości rur
US9485473B2 (en) 2012-09-13 2016-11-01 Alstom Technology Ltd Method and system for determining quality of tubes
US8941825B2 (en) 2013-03-15 2015-01-27 Owens-Brockway Glass Container Inc. Container inspection
DE102013105726B3 (de) * 2013-06-04 2014-12-04 Petra Sonja Biedermann Verfahren und Vorrichtungen zur Detektion und Lokalisierung von Infraschall
DE202013104938U1 (de) 2013-11-05 2015-02-06 Krones Ag Vorrichtung zur optischen Inspektion eines Mündungsbereichs eines Behälters
FR3027391B1 (fr) * 2014-10-17 2024-05-24 Msc & Sgcc Procedes, dispositif et ligne d'inspection pour visualiser la planeite d'une surface de bague de recipient
CN106896112A (zh) * 2015-12-21 2017-06-27 深圳市青铜科技有限公司 鱼眼类端子在视觉检测中借助于遮光板的光学成像方法
JP6772406B2 (ja) * 2015-12-28 2020-10-21 キリンテクノシステム株式会社 口部天面の検査装置及び検査方法
CN106353340B (zh) * 2016-10-18 2019-07-16 厦门威芯泰科技有限公司 一种棒状高反射率零件表面缺陷检测方法
KR102205582B1 (ko) * 2017-02-28 2021-01-21 도요 가라스 가부시키가이샤 용기 검사장치 및 용기 검사방법
CN107091811B (zh) * 2017-04-21 2019-10-22 无限极（中国）有限公司 一种灯检方法
FR3076619B1 (fr) * 2018-01-05 2020-01-24 Tiama Procede, dispositif et ligne d'inspection pour determiner la geometrie tridimensionnelle d'une surface de bague de recipient

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60159637A (ja) * 1984-01-31 1985-08-21 Kirin Brewery Co Ltd 欠陥検出方法および装置
CH679698A5 (pt) * 1989-10-06 1992-03-31 Elpatronic Ag
EP0657732A1 (de) * 1993-12-06 1995-06-14 Elpatronic Ag Verfahren und Vorrichtung zur optischen Prüfung eines durchsichtigen Behälterbereichs, insbesondere des Mündungsbereichs
US6122048A (en) * 1994-08-26 2000-09-19 Pressco Technology Inc. Integral field lens illumination for video inspection
JPH09119902A (ja) * 1995-09-13 1997-05-06 Nippon Glass Kk 瓶口部・ネジ部ビリ検査装置
FR2846422B1 (fr) 2002-10-25 2004-12-17 Sgcc Dispositif d'eclairage d'un article pour la detection automatique de defauts et installation de detection automatique de defauts comportant un tel dispositif
US20040150815A1 (en) * 2003-02-05 2004-08-05 Applied Vision Company, Llc Flaw detection in objects and surfaces

Also Published As

Publication number Publication date
ZA200703752B (en) 2008-09-25
FR2877724B1 (fr) 2007-03-16
EP1817574B8 (fr) 2015-11-04
US8164746B2 (en) 2012-04-24
CN101084431B (zh) 2010-11-10
RU2007117364A (ru) 2008-12-20
KR20070119607A (ko) 2007-12-20
FR2877724A1 (fr) 2006-05-12
MX2007005602A (es) 2007-07-13
RU2397477C2 (ru) 2010-08-20
US20100039640A1 (en) 2010-02-18
WO2006051217A1 (fr) 2006-05-18
EP1817574A1 (fr) 2007-08-15
EP1817574B1 (fr) 2015-09-23
CN101084431A (zh) 2007-12-05

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Legal Events

Date Code Title Description
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 9A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: REFERENTE AO DESPACHO 8.6 PUBLICADO NA RPI 2280 DE 16/09/2014.