BRPI0417806A - espectrÈmetro, e, métodos para selecionar um fator de ganho de um circuito detector em um espectrÈmetro e para fabricar um artigo que é exposto a radiação eletromagnética durante pelo menos uma fase de fabricação - Google Patents

espectrÈmetro, e, métodos para selecionar um fator de ganho de um circuito detector em um espectrÈmetro e para fabricar um artigo que é exposto a radiação eletromagnética durante pelo menos uma fase de fabricação

Info

Publication number
BRPI0417806A
BRPI0417806A BRPI0417806-8A BRPI0417806A BRPI0417806A BR PI0417806 A BRPI0417806 A BR PI0417806A BR PI0417806 A BRPI0417806 A BR PI0417806A BR PI0417806 A BRPI0417806 A BR PI0417806A
Authority
BR
Brazil
Prior art keywords
spectrometer
detector circuit
electromagnetic radiation
fabricating
article
Prior art date
Application number
BRPI0417806-8A
Other languages
English (en)
Portuguese (pt)
Inventor
Francis M Aguirre
Jack W Lai
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of BRPI0417806A publication Critical patent/BRPI0417806A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/51—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0213—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using attenuators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/51—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters
    • G01J3/513—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters having fixed filter-detector pairs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N2021/3129—Determining multicomponents by multiwavelength light
    • G01N2021/3133—Determining multicomponents by multiwavelength light with selection of wavelengths before the sample
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N2021/3159—Special features of multiplexing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N2021/3166—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths using separate detectors and filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N2021/317—Special constructive features
    • G01N2021/3174—Filter wheel

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
BRPI0417806-8A 2003-12-19 2004-11-12 espectrÈmetro, e, métodos para selecionar um fator de ganho de um circuito detector em um espectrÈmetro e para fabricar um artigo que é exposto a radiação eletromagnética durante pelo menos uma fase de fabricação BRPI0417806A (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/741,237 US7113282B2 (en) 2003-12-19 2003-12-19 Multiplexing rotary spectrometer
PCT/US2004/037826 WO2005066597A1 (en) 2003-12-19 2004-11-12 Multiplexing rotary spectrometer

Publications (1)

Publication Number Publication Date
BRPI0417806A true BRPI0417806A (pt) 2007-04-10

Family

ID=34678088

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0417806-8A BRPI0417806A (pt) 2003-12-19 2004-11-12 espectrÈmetro, e, métodos para selecionar um fator de ganho de um circuito detector em um espectrÈmetro e para fabricar um artigo que é exposto a radiação eletromagnética durante pelo menos uma fase de fabricação

Country Status (7)

Country Link
US (1) US7113282B2 (https=)
EP (1) EP1695052B1 (https=)
JP (1) JP2007514953A (https=)
AT (1) ATE462121T1 (https=)
BR (1) BRPI0417806A (https=)
DE (1) DE602004026216D1 (https=)
WO (1) WO2005066597A1 (https=)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG130048A1 (en) * 2005-08-18 2007-03-20 Glucostats System Pte Ltd An arrangement for a selection of a wavelength
US7679745B2 (en) * 2006-11-21 2010-03-16 Neptec Optical Solutions Time-resolved fluorescence spectrometer for multiple-species analysis
NL1033815C2 (nl) * 2007-05-07 2008-11-10 Friesland Brands Bv Werkwijze en inrichting voor het bereiden van kaas uit melk.
US8049894B2 (en) * 2007-10-05 2011-11-01 Lightwaves 2020, Inc. Multiple wavelength optical analyzer device
CN101419156B (zh) * 2007-10-23 2012-12-05 深圳迈瑞生物医疗电子股份有限公司 分光光度检测方法与装置以及检测系统
CN101419240B (zh) * 2007-10-23 2013-07-17 深圳迈瑞生物医疗电子股份有限公司 样本分析装置和样本分析方法
JP5527858B2 (ja) * 2008-11-18 2014-06-25 コーニンクレッカ フィリップス エヌ ヴェ フィルタホイール分光計
US9291506B2 (en) * 2010-01-27 2016-03-22 Ci Systems Ltd. Room-temperature filtering for passive infrared imaging
FI128285B (en) 2014-06-27 2020-02-28 Metso Automation Oy Multichannel optical measurement unit, multichannel optical detector unit and related measurement method
FR3046879B1 (fr) * 2016-01-20 2022-07-15 Ulis Procede de fabrication d'un detecteur de rayonnement electromagnetique a micro-encapsulation
KR102289043B1 (ko) * 2017-07-25 2021-08-10 삼성전자주식회사 스펙트럼 측정 장치 및 방법
WO2021171905A1 (ja) * 2020-02-28 2021-09-02 パナソニックＩｐマネジメント株式会社 撮像装置
KR20230072260A (ko) 2021-11-17 2023-05-24 삼성전자주식회사 분광 분석 장치, 이를 이용한 분광 분석 방법 및 이를 포함하는 반도체 메모리 장치의 제조 방법
JP2024101182A (ja) * 2023-01-17 2024-07-29 株式会社島津製作所 光学的測定装置及び液体クロマトグラフシステム

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE291855C (https=) 1914-02-03
DE6946593U (de) 1969-12-02 1973-08-02 Heye Hermann Fa Vorrichtung zur feststellung von unregelmaessigkeiten in hohlglasgegenstaenden.
US3877812A (en) * 1973-01-31 1975-04-15 Wilks Scientific Corp Multiple wavelength spectrometer
JPS5832338B2 (ja) * 1975-06-21 1983-07-12 コニカ株式会社 走査型カラ−濃度計
JPS5934252B2 (ja) * 1976-10-02 1984-08-21 国際技術開発株式会社 炎感知器
US4176916A (en) * 1977-03-14 1979-12-04 Neotec Corporation Cam filter wheel
DE2930431A1 (de) * 1979-07-26 1981-02-26 Boehringer Mannheim Gmbh Polychromatisches photometer
US4363967A (en) * 1980-10-07 1982-12-14 The United States Of America As Represented By The Secretary Of The Army Method and apparatus for far infrared detection
US4477190A (en) * 1981-07-20 1984-10-16 American Hospital Supply Corporation Multichannel spectrophotometer
JPS6176330A (ja) * 1984-09-25 1986-04-18 Toyota Motor Corp 成形品の表皮巻込み方法およびその巻込み装置
SU1257414A1 (ru) 1985-04-01 1986-09-15 Вильнюсский Ордена Трудового Красного Знамени И Ордена Дружбы Народов Государственный Университет Им.В.Капсукаса Способ фотометрировани звездного пол и мультиплексирующий сканирующий фотометр дл его осуществлени
US4755054A (en) * 1986-05-07 1988-07-05 E-Squared Engineering, Inc. Multichannel, optical-fiber-based spectrometer
DE69103714T2 (de) * 1990-10-01 1995-04-20 Eastman Kodak Co Spektralphotometer mit Mitteln zur gleichzeitigen Modulierung, Umschaltung und Wellenlängenauswahl einer Lichtquelle.
US5165078A (en) * 1991-03-25 1992-11-17 Miles Inc. Multi-channel, multi-wavelength detection system
DE4125548A1 (de) 1991-08-01 1993-02-04 Hauck Gmbh Licht- und farbintensitaets-messgeraet
JP3400056B2 (ja) 1992-12-25 2003-04-28 ティーディーケイ株式会社 リチウム二次電池
EP0633618B1 (en) * 1992-12-25 2000-03-22 TDK Corporation Lithium secondary cell
JP3256592B2 (ja) * 1993-04-06 2002-02-12 バブコック日立株式会社 燃焼診断装置
US6254385B1 (en) * 1997-01-02 2001-07-03 Lj Laboratories, Llc Apparatus and method for measuring optical characteristics of teeth
JPH109961A (ja) * 1996-06-21 1998-01-16 Kokusai Denshin Denwa Co Ltd <Kdd> 光波長監視装置
DK172795B1 (da) * 1997-02-28 1999-07-19 Slagteriernes Forskningsinst Reflektionsmåleudstyr til bestemmelse af kvalitetsegenskaber ved emner, navnlig fedtholdige emner
JPH11201817A (ja) 1998-01-12 1999-07-30 Satake Eng Co Ltd 光学フィルタホイ−ルの駆動方法及びその駆動装置
EP0953838A1 (en) 1998-05-01 1999-11-03 F. Hoffmann-La Roche Ag Apparatus for simultaneously monitoring reactions taking place in a plurality of reaction vessels
JP4089093B2 (ja) 1999-07-28 2008-05-21 住友電気工業株式会社 波長多重信号数監視装置
CA2354267A1 (en) 1999-10-08 2001-04-19 Nippon Sheet Glass Co., Ltd. Light-receiving element array and optical demultiflexer using the same
DE10032948A1 (de) 2000-07-06 2002-01-17 Rudolf Huber Spektroskopische Messung mehrerer Komponenten mit einem Filterrad

Also Published As

Publication number Publication date
EP1695052B1 (en) 2010-03-24
WO2005066597A1 (en) 2005-07-21
EP1695052A1 (en) 2006-08-30
JP2007514953A (ja) 2007-06-07
DE602004026216D1 (de) 2010-05-06
ATE462121T1 (de) 2010-04-15
US20050134854A1 (en) 2005-06-23
US7113282B2 (en) 2006-09-26

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B08L Patent application lapsed because of non payment of annual fee [chapter 8.12 patent gazette]

Free format text: REFERENTE AO NAO RECOLHIMENTO DAS 8A E 9A ANUIDADES.

B08I Publication cancelled [chapter 8.9 patent gazette]

Free format text: ANULADA A PUBLICACAO CODIGO 8.12 NA RPI NO 2259 DE 22/04/2014 POR TER SIDO INDEVIDA.

B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE AS 8A, 9A, 10A, 11A, 12A, 13A, 14A E 15A ANUIDADES.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2602 DE 17-11-2020 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.