BR9917355A - Processo de modificação de uma superfìcie - Google Patents
Processo de modificação de uma superfìcieInfo
- Publication number
- BR9917355A BR9917355A BR9917355-7A BR9917355A BR9917355A BR 9917355 A BR9917355 A BR 9917355A BR 9917355 A BR9917355 A BR 9917355A BR 9917355 A BR9917355 A BR 9917355A
- Authority
- BR
- Brazil
- Prior art keywords
- phase
- modified
- abrasive article
- modification
- abrasive
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
- B24B37/245—Pads with fixed abrasives
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/02—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
- B24D3/20—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Manufacture Of Macromolecular Shaped Articles (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/328,916 US6234875B1 (en) | 1999-06-09 | 1999-06-09 | Method of modifying a surface |
| PCT/US1999/024445 WO2000074896A1 (en) | 1999-06-09 | 1999-10-18 | Method of modifying a surface of a structured wafer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BR9917355A true BR9917355A (pt) | 2002-02-26 |
Family
ID=23283024
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BR9917355-7A BR9917355A (pt) | 1999-06-09 | 1999-10-18 | Processo de modificação de uma superfìcie |
Country Status (14)
| Country | Link |
|---|---|
| US (1) | US6234875B1 (https=) |
| EP (1) | EP1189729B1 (https=) |
| JP (1) | JP2003501820A (https=) |
| KR (1) | KR100638289B1 (https=) |
| CN (1) | CN1352589A (https=) |
| AT (1) | ATE272465T1 (https=) |
| AU (1) | AU1317500A (https=) |
| BR (1) | BR9917355A (https=) |
| CA (1) | CA2374004A1 (https=) |
| DE (1) | DE69919230T2 (https=) |
| ES (1) | ES2224717T3 (https=) |
| HK (1) | HK1044504B (https=) |
| TW (1) | TWI231245B (https=) |
| WO (1) | WO2000074896A1 (https=) |
Families Citing this family (43)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6390890B1 (en) | 1999-02-06 | 2002-05-21 | Charles J Molnar | Finishing semiconductor wafers with a fixed abrasive finishing element |
| US6641463B1 (en) | 1999-02-06 | 2003-11-04 | Beaver Creek Concepts Inc | Finishing components and elements |
| US6413153B1 (en) | 1999-04-26 | 2002-07-02 | Beaver Creek Concepts Inc | Finishing element including discrete finishing members |
| TW501197B (en) * | 1999-08-17 | 2002-09-01 | Hitachi Chemical Co Ltd | Polishing compound for chemical mechanical polishing and method for polishing substrate |
| US7736687B2 (en) * | 2006-01-31 | 2010-06-15 | Advance Bio Prosthetic Surfaces, Ltd. | Methods of making medical devices |
| US6976905B1 (en) * | 2000-06-16 | 2005-12-20 | Cabot Microelectronics Corporation | Method for polishing a memory or rigid disk with a phosphate ion-containing polishing system |
| CN100496896C (zh) * | 2000-12-01 | 2009-06-10 | 东洋橡膠工业株式会社 | 研磨垫 |
| US6572463B1 (en) * | 2000-12-27 | 2003-06-03 | Lam Research Corp. | Methods for making reinforced wafer polishing pads utilizing direct casting and apparatuses implementing the same |
| US6561889B1 (en) | 2000-12-27 | 2003-05-13 | Lam Research Corporation | Methods for making reinforced wafer polishing pads and apparatuses implementing the same |
| US6612916B2 (en) * | 2001-01-08 | 2003-09-02 | 3M Innovative Properties Company | Article suitable for chemical mechanical planarization processes |
| US6612917B2 (en) * | 2001-02-07 | 2003-09-02 | 3M Innovative Properties Company | Abrasive article suitable for modifying a semiconductor wafer |
| US6632129B2 (en) * | 2001-02-15 | 2003-10-14 | 3M Innovative Properties Company | Fixed abrasive article for use in modifying a semiconductor wafer |
| US6627550B2 (en) * | 2001-03-27 | 2003-09-30 | Micron Technology, Inc. | Post-planarization clean-up |
| US6629879B1 (en) * | 2001-05-08 | 2003-10-07 | Advanced Micro Devices, Inc. | Method of controlling barrier metal polishing processes based upon X-ray fluorescence measurements |
| US6811470B2 (en) | 2001-07-16 | 2004-11-02 | Applied Materials Inc. | Methods and compositions for chemical mechanical polishing shallow trench isolation substrates |
| US7199056B2 (en) * | 2002-02-08 | 2007-04-03 | Applied Materials, Inc. | Low cost and low dishing slurry for polysilicon CMP |
| US6943114B2 (en) * | 2002-02-28 | 2005-09-13 | Infineon Technologies Ag | Integration scheme for metal gap fill, with fixed abrasive CMP |
| US7063597B2 (en) | 2002-10-25 | 2006-06-20 | Applied Materials | Polishing processes for shallow trench isolation substrates |
| US6908366B2 (en) * | 2003-01-10 | 2005-06-21 | 3M Innovative Properties Company | Method of using a soft subpad for chemical mechanical polishing |
| JP2006513573A (ja) * | 2003-01-10 | 2006-04-20 | スリーエム イノベイティブ プロパティズ カンパニー | 化学的機械的平坦化用途向けのパッド構成体 |
| US6951504B2 (en) * | 2003-03-20 | 2005-10-04 | 3M Innovative Properties Company | Abrasive article with agglomerates and method of use |
| SG168412A1 (en) * | 2003-06-03 | 2011-02-28 | Nexplanar Corp | Synthesis of a functionally graded pad for chemical mechanical planarization |
| DE602005006326T2 (de) * | 2004-02-05 | 2009-07-09 | Jsr Corp. | Chemisch-mechanisches Polierkissen und Polierverfahren |
| US7485028B2 (en) | 2004-03-19 | 2009-02-03 | Saint-Gobain Performance Plastics Corporation | Chemical mechanical polishing retaining ring, apparatuses and methods incorporating same |
| US7086939B2 (en) * | 2004-03-19 | 2006-08-08 | Saint-Gobain Performance Plastics Corporation | Chemical mechanical polishing retaining ring with integral polymer backing |
| US20050252547A1 (en) * | 2004-05-11 | 2005-11-17 | Applied Materials, Inc. | Methods and apparatus for liquid chemical delivery |
| US7150771B2 (en) * | 2004-06-18 | 2006-12-19 | 3M Innovative Properties Company | Coated abrasive article with composite tie layer, and method of making and using the same |
| US7150770B2 (en) * | 2004-06-18 | 2006-12-19 | 3M Innovative Properties Company | Coated abrasive article with tie layer, and method of making and using the same |
| US20050282029A1 (en) * | 2004-06-18 | 2005-12-22 | 3M Innovative Properties Company | Polymerizable composition and articles therefrom |
| US20060088976A1 (en) * | 2004-10-22 | 2006-04-27 | Applied Materials, Inc. | Methods and compositions for chemical mechanical polishing substrates |
| US7344575B2 (en) * | 2005-06-27 | 2008-03-18 | 3M Innovative Properties Company | Composition, treated backing, and abrasive articles containing the same |
| US7344574B2 (en) * | 2005-06-27 | 2008-03-18 | 3M Innovative Properties Company | Coated abrasive article, and method of making and using the same |
| TWI292185B (en) * | 2005-07-11 | 2008-01-01 | Fujitsu Ltd | Manufacture of semiconductor device with cmp |
| US8016644B2 (en) * | 2007-07-13 | 2011-09-13 | UNIVERSITé LAVAL | Method and apparatus for micro-machining a surface |
| US20090215266A1 (en) * | 2008-02-22 | 2009-08-27 | Thomas Terence M | Polishing Copper-Containing patterned wafers |
| DE102009025242B4 (de) * | 2009-06-17 | 2013-05-23 | Siltronic Ag | Verfahren zum beidseitigen chemischen Schleifen einer Halbleiterscheibe |
| DE102009033206A1 (de) * | 2009-07-15 | 2011-01-27 | Brand, Guido | Polierverfahren und Poliervorrichtung zur Korrektur von geometrischen Abweichungsfehlern auf Präzisionsoberflächen |
| PL2665583T3 (pl) * | 2011-01-22 | 2017-01-31 | Rud. Starcke Gmbh & Co. Kg | Korpus ścierny |
| JP5934053B2 (ja) * | 2012-08-14 | 2016-06-15 | セイコープレシジョン株式会社 | X線処理装置 |
| SG11201608134YA (en) | 2014-04-03 | 2016-10-28 | 3M Innovative Properties Co | Polishing pads and systems and methods of making and using the same |
| TWI769988B (zh) | 2015-10-07 | 2022-07-11 | 美商3M新設資產公司 | 拋光墊與系統及其製造與使用方法 |
| CN111087973B (zh) * | 2019-12-17 | 2021-07-27 | 吉林大学 | 一种植物纤维发酵改性增强摩擦材料制备装置及制备方法 |
| US20230347470A1 (en) * | 2022-04-28 | 2023-11-02 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Pad for chemical mechanical polishing |
Family Cites Families (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4244775A (en) | 1979-04-30 | 1981-01-13 | Bell Telephone Laboratories, Incorporated | Process for the chemical etch polishing of semiconductors |
| EP0226931B1 (en) | 1985-12-17 | 1991-02-27 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | A method of preparing semiconductor substrates |
| JPS62259769A (ja) * | 1986-05-02 | 1987-11-12 | Nec Corp | シリコンウエハの加工方法 |
| US5399528A (en) | 1989-06-01 | 1995-03-21 | Leibovitz; Jacques | Multi-layer fabrication in integrated circuit systems |
| US5152917B1 (en) | 1991-02-06 | 1998-01-13 | Minnesota Mining & Mfg | Structured abrasive article |
| TW307801B (https=) | 1992-03-19 | 1997-06-11 | Minnesota Mining & Mfg | |
| MY114512A (en) | 1992-08-19 | 2002-11-30 | Rodel Inc | Polymeric substrate with polymeric microelements |
| JPH0811050A (ja) | 1994-06-28 | 1996-01-16 | Sony Corp | 研磨布及びこれを用いた半導体装置の製造方法 |
| BR9509116A (pt) * | 1994-09-30 | 1997-11-18 | Minnesota Mining & Mfg | Artigo abrasivo revestido processos para produzir o mesmo e processo para desbastar uma peça dura |
| US5791969A (en) | 1994-11-01 | 1998-08-11 | Lund; Douglas E. | System and method of automatically polishing semiconductor wafers |
| US5643044A (en) | 1994-11-01 | 1997-07-01 | Lund; Douglas E. | Automatic chemical and mechanical polishing system for semiconductor wafers |
| US5609517A (en) | 1995-11-20 | 1997-03-11 | International Business Machines Corporation | Composite polishing pad |
| JPH09148285A (ja) | 1995-11-27 | 1997-06-06 | Sony Corp | 化学的機械研磨粒子及び半導体装置の製造方法 |
| JP3440665B2 (ja) | 1995-12-20 | 2003-08-25 | ソニー株式会社 | 研磨布およびその製造方法 |
| US5778481A (en) | 1996-02-15 | 1998-07-14 | International Business Machines Corporation | Silicon wafer cleaning and polishing pads |
| TW349896B (en) | 1996-05-02 | 1999-01-11 | Applied Materials Inc | Apparatus and chemical mechanical polishing system for polishing a substrate |
| US5692950A (en) | 1996-08-08 | 1997-12-02 | Minnesota Mining And Manufacturing Company | Abrasive construction for semiconductor wafer modification |
| US5759427A (en) | 1996-08-28 | 1998-06-02 | International Business Machines Corporation | Method and apparatus for polishing metal surfaces |
| US5759917A (en) | 1996-12-30 | 1998-06-02 | Cabot Corporation | Composition for oxide CMP |
| KR100487455B1 (ko) | 1997-01-13 | 2005-05-09 | 롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스, 인코포레이티드 | 사진석판술에 의해 유도된 표면 패턴(들)이 있는 연마용 중합체 패드 및 이에 관련된 방법 |
| US6328642B1 (en) | 1997-02-14 | 2001-12-11 | Lam Research Corporation | Integrated pad and belt for chemical mechanical polishing |
| US6022268A (en) | 1998-04-03 | 2000-02-08 | Rodel Holdings Inc. | Polishing pads and methods relating thereto |
| JP2001523395A (ja) | 1997-04-30 | 2001-11-20 | ミネソタ・マイニング・アンド・マニュファクチャリング・カンパニー | 半導体ウェーハの上面を平坦化する方法 |
| US6224465B1 (en) | 1997-06-26 | 2001-05-01 | Stuart L. Meyer | Methods and apparatus for chemical mechanical planarization using a microreplicated surface |
| US6121143A (en) * | 1997-09-19 | 2000-09-19 | 3M Innovative Properties Company | Abrasive articles comprising a fluorochemical agent for wafer surface modification |
| US6056794A (en) * | 1999-03-05 | 2000-05-02 | 3M Innovative Properties Company | Abrasive articles having bonding systems containing abrasive particles |
-
1999
- 1999-06-09 US US09/328,916 patent/US6234875B1/en not_active Expired - Lifetime
- 1999-10-18 CA CA002374004A patent/CA2374004A1/en not_active Abandoned
- 1999-10-18 WO PCT/US1999/024445 patent/WO2000074896A1/en not_active Ceased
- 1999-10-18 CN CN99816713A patent/CN1352589A/zh active Pending
- 1999-10-18 DE DE69919230T patent/DE69919230T2/de not_active Expired - Fee Related
- 1999-10-18 HK HK02106259.1A patent/HK1044504B/en not_active IP Right Cessation
- 1999-10-18 KR KR1020017015751A patent/KR100638289B1/ko not_active Expired - Fee Related
- 1999-10-18 BR BR9917355-7A patent/BR9917355A/pt active Search and Examination
- 1999-10-18 ES ES99956604T patent/ES2224717T3/es not_active Expired - Lifetime
- 1999-10-18 AT AT99956604T patent/ATE272465T1/de not_active IP Right Cessation
- 1999-10-18 JP JP2001501410A patent/JP2003501820A/ja active Pending
- 1999-10-18 EP EP99956604A patent/EP1189729B1/en not_active Expired - Lifetime
- 1999-10-18 AU AU13175/00A patent/AU1317500A/en not_active Abandoned
-
2000
- 2000-05-30 TW TW089110529A patent/TWI231245B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| EP1189729B1 (en) | 2004-08-04 |
| KR20020011435A (ko) | 2002-02-08 |
| WO2000074896A1 (en) | 2000-12-14 |
| AU1317500A (en) | 2000-12-28 |
| EP1189729A1 (en) | 2002-03-27 |
| HK1044504A1 (en) | 2002-10-25 |
| TWI231245B (en) | 2005-04-21 |
| HK1044504B (en) | 2005-06-30 |
| ATE272465T1 (de) | 2004-08-15 |
| JP2003501820A (ja) | 2003-01-14 |
| US6234875B1 (en) | 2001-05-22 |
| ES2224717T3 (es) | 2005-03-01 |
| CA2374004A1 (en) | 2000-12-14 |
| KR100638289B1 (ko) | 2006-10-26 |
| DE69919230D1 (de) | 2004-09-09 |
| DE69919230T2 (de) | 2005-08-04 |
| WO2000074896A8 (en) | 2001-03-29 |
| CN1352589A (zh) | 2002-06-05 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| B09A | Decision: intention to grant [chapter 9.1 patent gazette] | ||
| B11D | Dismissal acc. art. 38, par 2 of ipl - failure to pay fee after grant in time |