BR112018015472A2 - circuito de pino de saída resistente a curto - Google Patents

circuito de pino de saída resistente a curto

Info

Publication number
BR112018015472A2
BR112018015472A2 BR112018015472A BR112018015472A BR112018015472A2 BR 112018015472 A2 BR112018015472 A2 BR 112018015472A2 BR 112018015472 A BR112018015472 A BR 112018015472A BR 112018015472 A BR112018015472 A BR 112018015472A BR 112018015472 A2 BR112018015472 A2 BR 112018015472A2
Authority
BR
Brazil
Prior art keywords
short
pin
resistant
short circuit
adjacent
Prior art date
Application number
BR112018015472A
Other languages
English (en)
Other versions
BR112018015472B1 (pt
Inventor
Jain Palkesh
Bhuyan Pranjal
Gulati Rahul
Bansal Virendra
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of BR112018015472A2 publication Critical patent/BR112018015472A2/pt
Publication of BR112018015472B1 publication Critical patent/BR112018015472B1/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H9/00—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection
    • H02H9/02—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess current
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/62—Protection against overvoltage, e.g. fuses, shunts

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Logic Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

um circuito integrado (ic) é revelado neste documento para circuito de pino de saída resistente a curto. em um aspecto exemplificativo, um circuito integrado inclui um pino resistente a curto e um pino adjacente. o circuito integrado ainda inclui um bloco resistente a curto que é acoplado ao pino resistente a curto e um bloco adjacente que é acoplado ao pino adjacente. o circuito integrado ainda inclui circuito resistente a curto que é acoplado ao bloco resistente a curto e ao bloco adjacente. o circuito resistente a curto é implementado para detectar uma condição de curto-circuito entre o pino resistente a curto e o pino adjacente e para reduzir um efeito da condição de curto-circuito no pino resistente a curto.
BR112018015472-5A 2016-02-01 2017-01-09 Circuito integrado e método de implementação de circuito de pino de saída resistente a curto BR112018015472B1 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15/012,723 US20170222430A1 (en) 2016-02-01 2016-02-01 Short-resistant output pin circuitry
US15/012,723 2016-02-01
PCT/US2017/012764 WO2017136107A1 (en) 2016-02-01 2017-01-09 Short-resistant output pin circuitry

Publications (2)

Publication Number Publication Date
BR112018015472A2 true BR112018015472A2 (pt) 2018-12-18
BR112018015472B1 BR112018015472B1 (pt) 2023-04-11

Family

ID=57944520

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112018015472-5A BR112018015472B1 (pt) 2016-02-01 2017-01-09 Circuito integrado e método de implementação de circuito de pino de saída resistente a curto

Country Status (10)

Country Link
US (1) US20170222430A1 (pt)
EP (1) EP3411722B1 (pt)
JP (1) JP2019506746A (pt)
KR (1) KR20180108617A (pt)
CN (1) CN108700625B (pt)
BR (1) BR112018015472B1 (pt)
CA (1) CA3010603A1 (pt)
ES (1) ES2745333T3 (pt)
HU (1) HUE045080T2 (pt)
WO (1) WO2017136107A1 (pt)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109633362A (zh) * 2019-01-30 2019-04-16 努比亚技术有限公司 智能终端设计电路、智能终端及智能终端短路检测方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10152256A1 (de) * 2001-10-20 2003-05-08 Bosch Gmbh Robert Elektrische Schaltungsanordnung
CN1508553A (zh) * 2002-12-17 2004-06-30 技嘉科技股份有限公司 开/短路检测装置及其检测方法
EP1737032A4 (en) * 2004-03-23 2008-05-28 Rohm Co Ltd SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND SWITCHING POWER SUPPLY SOURCE DEVICE USING THE SAME
KR20060006249A (ko) * 2004-07-15 2006-01-19 (주)제일전자 커넥터핀의 쇼트여부 검사장치
CN100489549C (zh) * 2005-08-26 2009-05-20 鸿富锦精密工业（深圳）有限公司 导线短/开路测试装置
CN101226224A (zh) * 2008-01-16 2008-07-23 深圳国人通信有限公司 一种电路板的测试系统及方法
US7996162B1 (en) * 2008-03-28 2011-08-09 Kelsey-Hayes Company Detection of shorted output pins
US7889011B2 (en) * 2008-06-30 2011-02-15 Texas Instruments Incorporated Output short circuit and load detection
CN202494750U (zh) * 2012-03-22 2012-10-17 杭州士兰微电子股份有限公司 一种集成电路引脚开短路的测试装置
US9207278B2 (en) * 2013-03-22 2015-12-08 Texas Instruments Incorporated Testing integrated circuit packaging for shorts
CN103245869A (zh) * 2013-04-10 2013-08-14 福州瑞芯微电子有限公司 一种集成电路电源管脚短路判定检测方法
US9036310B2 (en) * 2013-08-28 2015-05-19 Power Integrations, Inc. Feedback protection from adjacent terminal shorts
US9442184B2 (en) * 2014-02-21 2016-09-13 Nxp B.V. Functional safety monitor pin
US20160025790A1 (en) * 2014-07-24 2016-01-28 Cmc Industrial Electronics Ltd. Short detection bus

Also Published As

Publication number Publication date
HUE045080T2 (hu) 2019-12-30
EP3411722B1 (en) 2019-07-10
CA3010603A1 (en) 2017-08-10
BR112018015472B1 (pt) 2023-04-11
CN108700625B (zh) 2020-11-03
JP2019506746A (ja) 2019-03-07
ES2745333T3 (es) 2020-02-28
CN108700625A (zh) 2018-10-23
US20170222430A1 (en) 2017-08-03
EP3411722A1 (en) 2018-12-12
KR20180108617A (ko) 2018-10-04
WO2017136107A1 (en) 2017-08-10

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Legal Events

Date Code Title Description
B350 Update of information on the portal [chapter 15.35 patent gazette]
B06W Patent application suspended after preliminary examination (for patents with searches from other patent authorities) chapter 6.23 patent gazette]
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B16A Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]

Free format text: PRAZO DE VALIDADE: 20 (VINTE) ANOS CONTADOS A PARTIR DE 09/01/2017, OBSERVADAS AS CONDICOES LEGAIS