HUE045080T2 - Rövidzárlatbiztos kimenetitû-áramkör - Google Patents
Rövidzárlatbiztos kimenetitû-áramkörInfo
- Publication number
- HUE045080T2 HUE045080T2 HUE17702452A HUE17702452A HUE045080T2 HU E045080 T2 HUE045080 T2 HU E045080T2 HU E17702452 A HUE17702452 A HU E17702452A HU E17702452 A HUE17702452 A HU E17702452A HU E045080 T2 HUE045080 T2 HU E045080T2
- Authority
- HU
- Hungary
- Prior art keywords
- short
- output pin
- pin circuitry
- resistant output
- resistant
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H9/00—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection
- H02H9/02—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess current
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
- H01L23/62—Protection against overvoltage, e.g. fuses, shunts
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Semiconductor Integrated Circuits (AREA)
- Logic Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15/012,723 US20170222430A1 (en) | 2016-02-01 | 2016-02-01 | Short-resistant output pin circuitry |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| HUE045080T2 true HUE045080T2 (hu) | 2019-12-30 |
Family
ID=57944520
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| HUE17702452A HUE045080T2 (hu) | 2016-02-01 | 2017-01-09 | Rövidzárlatbiztos kimenetitû-áramkör |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US20170222430A1 (hu) |
| EP (1) | EP3411722B1 (hu) |
| JP (1) | JP2019506746A (hu) |
| KR (1) | KR20180108617A (hu) |
| CN (1) | CN108700625B (hu) |
| BR (1) | BR112018015472B1 (hu) |
| CA (1) | CA3010603A1 (hu) |
| ES (1) | ES2745333T3 (hu) |
| HU (1) | HUE045080T2 (hu) |
| WO (1) | WO2017136107A1 (hu) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109633362A (zh) * | 2019-01-30 | 2019-04-16 | 努比亚技术有限公司 | 智能终端设计电路、智能终端及智能终端短路检测方法 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10152256A1 (de) * | 2001-10-20 | 2003-05-08 | Bosch Gmbh Robert | Elektrische Schaltungsanordnung |
| CN1508553A (zh) * | 2002-12-17 | 2004-06-30 | 技嘉科技股份有限公司 | 开/短路检测装置及其检测方法 |
| CN100429764C (zh) * | 2004-03-23 | 2008-10-29 | 罗姆股份有限公司 | 半导体集成电路装置及使用其的开关电源装置 |
| KR20060006249A (ko) * | 2004-07-15 | 2006-01-19 | (주)제일전자 | 커넥터핀의 쇼트여부 검사장치 |
| CN100489549C (zh) * | 2005-08-26 | 2009-05-20 | 鸿富锦精密工业（深圳）有限公司 | 导线短/开路测试装置 |
| CN101226224A (zh) * | 2008-01-16 | 2008-07-23 | 深圳国人通信有限公司 | 一种电路板的测试系统及方法 |
| US7996162B1 (en) * | 2008-03-28 | 2011-08-09 | Kelsey-Hayes Company | Detection of shorted output pins |
| US7889011B2 (en) * | 2008-06-30 | 2011-02-15 | Texas Instruments Incorporated | Output short circuit and load detection |
| CN202494750U (zh) * | 2012-03-22 | 2012-10-17 | 杭州士兰微电子股份有限公司 | 一种集成电路引脚开短路的测试装置 |
| US9207278B2 (en) * | 2013-03-22 | 2015-12-08 | Texas Instruments Incorporated | Testing integrated circuit packaging for shorts |
| CN103245869A (zh) * | 2013-04-10 | 2013-08-14 | 福州瑞芯微电子有限公司 | 一种集成电路电源管脚短路判定检测方法 |
| US9036310B2 (en) * | 2013-08-28 | 2015-05-19 | Power Integrations, Inc. | Feedback protection from adjacent terminal shorts |
| US9442184B2 (en) * | 2014-02-21 | 2016-09-13 | Nxp B.V. | Functional safety monitor pin |
| US20160025790A1 (en) * | 2014-07-24 | 2016-01-28 | Cmc Industrial Electronics Ltd. | Short detection bus |
-
2016
- 2016-02-01 US US15/012,723 patent/US20170222430A1/en not_active Abandoned
-
2017
- 2017-01-09 WO PCT/US2017/012764 patent/WO2017136107A1/en active Application Filing
- 2017-01-09 EP EP17702452.8A patent/EP3411722B1/en active Active
- 2017-01-09 HU HUE17702452A patent/HUE045080T2/hu unknown
- 2017-01-09 CN CN201780009386.4A patent/CN108700625B/zh active Active
- 2017-01-09 JP JP2018539816A patent/JP2019506746A/ja active Pending
- 2017-01-09 BR BR112018015472-5A patent/BR112018015472B1/pt active IP Right Grant
- 2017-01-09 KR KR1020187021541A patent/KR20180108617A/ko unknown
- 2017-01-09 CA CA3010603A patent/CA3010603A1/en not_active Abandoned
- 2017-01-09 ES ES17702452T patent/ES2745333T3/es active Active
Also Published As
| Publication number | Publication date |
|---|---|
| ES2745333T3 (es) | 2020-02-28 |
| BR112018015472B1 (pt) | 2023-04-11 |
| EP3411722B1 (en) | 2019-07-10 |
| CN108700625B (zh) | 2020-11-03 |
| EP3411722A1 (en) | 2018-12-12 |
| CN108700625A (zh) | 2018-10-23 |
| KR20180108617A (ko) | 2018-10-04 |
| JP2019506746A (ja) | 2019-03-07 |
| BR112018015472A2 (pt) | 2018-12-18 |
| US20170222430A1 (en) | 2017-08-03 |
| WO2017136107A1 (en) | 2017-08-10 |
| CA3010603A1 (en) | 2017-08-10 |
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