BR112017028018A2 - sistema para medir as características ópticas de uma placa de vidro curvada, sistema para fabricar placas de vidro curvadas, e método para medir as características ópticas de uma placa de vidro curvada - Google Patents

sistema para medir as características ópticas de uma placa de vidro curvada, sistema para fabricar placas de vidro curvadas, e método para medir as características ópticas de uma placa de vidro curvada

Info

Publication number
BR112017028018A2
BR112017028018A2 BR112017028018A BR112017028018A BR112017028018A2 BR 112017028018 A2 BR112017028018 A2 BR 112017028018A2 BR 112017028018 A BR112017028018 A BR 112017028018A BR 112017028018 A BR112017028018 A BR 112017028018A BR 112017028018 A2 BR112017028018 A2 BR 112017028018A2
Authority
BR
Brazil
Prior art keywords
glass plate
curved glass
measuring
optical characteristics
cameras
Prior art date
Application number
BR112017028018A
Other languages
English (en)
Other versions
BR112017028018B1 (pt
Inventor
l moran Benjamin
c addington Jason
J Vild Michael
Original Assignee
Glasstech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Glasstech Inc filed Critical Glasstech Inc
Publication of BR112017028018A2 publication Critical patent/BR112017028018A2/pt
Publication of BR112017028018B1 publication Critical patent/BR112017028018B1/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B23/00—Re-forming shaped glass
    • C03B23/02—Re-forming glass sheets
    • C03B23/023—Re-forming glass sheets by bending
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B27/00—Tempering or quenching glass products
    • C03B27/04—Tempering or quenching glass products using gas
    • C03B27/0417—Controlling or regulating for flat or bent glass sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B1/00—Comparing elements, i.e. elements for effecting comparison directly or indirectly between a desired value and existing or anticipated values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/845—Objects on a conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9586—Windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0635—Structured illumination, e.g. with grating
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Automation & Control Theory (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Thermal Sciences (AREA)
  • Textile Engineering (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

um sistema para medir distorção óptica numa placa de vidro contornada inclui um transportador para transportar a placa de vidro numa primeira direção, pelo menos uma tela que projeta um padrão de contraste multifásico não repetido pré-selecionado e, pelo menos, uma câmera, cada uma das câmeras emparelhadas unicamente com uma das telas. o sistema também pode incluir um controle programado para executar lógica para controlar cada uma das câmeras para adquirir as imagens pretendidas e lógica para analisar e combinar os dados adquiridos pelas câmeras para construir uma definição da superfície da placa de vidro e lógica para realizar uma ou mais operações de processamento óptico nos dados de superfície para analisar as características ópticas da placa de vidro.
BR112017028018-3A 2015-06-26 2016-05-17 Sistema para medir as características ópticas de uma placa de vidro curvada e método para medir as características ópticas de uma placa de vidro curvada BR112017028018B1 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/752,033 US9470641B1 (en) 2015-06-26 2015-06-26 System and method for measuring reflected optical distortion in contoured glass sheets
US14/752,033 2015-06-26
PCT/US2016/032837 WO2016209409A1 (en) 2015-06-26 2016-05-17 System and method for measuring reflected optical distortion in contoured glass sheets

Publications (2)

Publication Number Publication Date
BR112017028018A2 true BR112017028018A2 (pt) 2018-08-28
BR112017028018B1 BR112017028018B1 (pt) 2021-04-13

Family

ID=57120842

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112017028018-3A BR112017028018B1 (pt) 2015-06-26 2016-05-17 Sistema para medir as características ópticas de uma placa de vidro curvada e método para medir as características ópticas de uma placa de vidro curvada

Country Status (7)

Country Link
US (2) US9470641B1 (pt)
EP (1) EP3314236A4 (pt)
CN (1) CN107735671A (pt)
BR (1) BR112017028018B1 (pt)
CA (1) CA2990844A1 (pt)
MX (1) MX2018000277A (pt)
WO (1) WO2016209409A1 (pt)

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Also Published As

Publication number Publication date
MX2018000277A (es) 2018-05-22
CN107735671A (zh) 2018-02-23
WO2016209409A1 (en) 2016-12-29
CA2990844A1 (en) 2016-12-29
EP3314236A1 (en) 2018-05-02
BR112017028018B1 (pt) 2021-04-13
US20170003232A1 (en) 2017-01-05
EP3314236A4 (en) 2018-12-05
US9846129B2 (en) 2017-12-19
US9470641B1 (en) 2016-10-18

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B09A Decision: intention to grant [chapter 9.1 patent gazette]
B16A Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]

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