MX2018000277A - Sistema y metodo para medir la distorcion optica reflejada en laminas de vidrio contorneadas. - Google Patents

Sistema y metodo para medir la distorcion optica reflejada en laminas de vidrio contorneadas.

Info

Publication number
MX2018000277A
MX2018000277A MX2018000277A MX2018000277A MX2018000277A MX 2018000277 A MX2018000277 A MX 2018000277A MX 2018000277 A MX2018000277 A MX 2018000277A MX 2018000277 A MX2018000277 A MX 2018000277A MX 2018000277 A MX2018000277 A MX 2018000277A
Authority
MX
Mexico
Prior art keywords
glass sheet
cameras
optical distortion
logic
glass sheets
Prior art date
Application number
MX2018000277A
Other languages
English (en)
Inventor
c addington Jason
J Vild Michael
l moran Benjamin
Original Assignee
Glasstech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Glasstech Inc filed Critical Glasstech Inc
Publication of MX2018000277A publication Critical patent/MX2018000277A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B23/00—Re-forming shaped glass
    • C03B23/02—Re-forming glass sheets
    • C03B23/023—Re-forming glass sheets by bending
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B27/00—Tempering or quenching glass products
    • C03B27/04—Tempering or quenching glass products using gas
    • C03B27/0417—Controlling or regulating for flat or bent glass sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B1/00—Comparing elements, i.e. elements for effecting comparison directly or indirectly between a desired value and existing or anticipated values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/845—Objects on a conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9586—Windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0635—Structured illumination, e.g. with grating
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Automation & Control Theory (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Thermal Sciences (AREA)
  • Textile Engineering (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

Un sistema para medir la distorsión Óptica en una lámina de vidrio contorneada incluye una cinta transportadora para transportar la lámina de vidrio en una primera dirección, al menos una pantalla que proyecta un patrón contrastado no repetitivo multifase preseleccionado y al menos una cámara, cada una de las cámaras emparejada de manera única con una de las pantallas. El sistema también puede incluir un control programado para ejecutar la lógica para controlar cada una de las cámaras para adquirir las imágenes deseadas, y la lógica para analizar y combinar los datos adquiridos por las cámaras para construir una definición de la superficie de la lámina de vidrio, y la lógica para realizar una o rads operaciones de procesado óptico en los datos superficiales para analizar las características apticas de la lámina de vidrio.
MX2018000277A 2015-06-26 2016-05-17 Sistema y metodo para medir la distorcion optica reflejada en laminas de vidrio contorneadas. MX2018000277A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/752,033 US9470641B1 (en) 2015-06-26 2015-06-26 System and method for measuring reflected optical distortion in contoured glass sheets
PCT/US2016/032837 WO2016209409A1 (en) 2015-06-26 2016-05-17 System and method for measuring reflected optical distortion in contoured glass sheets

Publications (1)

Publication Number Publication Date
MX2018000277A true MX2018000277A (es) 2018-05-22

Family

ID=57120842

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2018000277A MX2018000277A (es) 2015-06-26 2016-05-17 Sistema y metodo para medir la distorcion optica reflejada en laminas de vidrio contorneadas.

Country Status (7)

Country Link
US (2) US9470641B1 (es)
EP (1) EP3314236A4 (es)
CN (1) CN107735671A (es)
BR (1) BR112017028018B1 (es)
CA (1) CA2990844A1 (es)
MX (1) MX2018000277A (es)
WO (1) WO2016209409A1 (es)

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Also Published As

Publication number Publication date
US9470641B1 (en) 2016-10-18
BR112017028018A2 (pt) 2018-08-28
BR112017028018B1 (pt) 2021-04-13
WO2016209409A1 (en) 2016-12-29
US9846129B2 (en) 2017-12-19
CA2990844A1 (en) 2016-12-29
EP3314236A1 (en) 2018-05-02
US20170003232A1 (en) 2017-01-05
CN107735671A (zh) 2018-02-23
EP3314236A4 (en) 2018-12-05

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