BR0112513A - Fast switching input buffer. - Google Patents
Fast switching input buffer.Info
- Publication number
- BR0112513A BR0112513A BR0112513-3A BR0112513A BR0112513A BR 0112513 A BR0112513 A BR 0112513A BR 0112513 A BR0112513 A BR 0112513A BR 0112513 A BR0112513 A BR 0112513A
- Authority
- BR
- Brazil
- Prior art keywords
- input buffer
- causes
- pmos transistor
- fast switching
- switching input
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/01—Modifications for accelerating switching
- H03K19/017—Modifications for accelerating switching in field-effect transistor circuits
- H03K19/01707—Modifications for accelerating switching in field-effect transistor circuits in asynchronous circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0175—Coupling arrangements; Interface arrangements
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Logic Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Abstract
"BUFFER DE ENTRADA DE COMUTAçãO RáPIDA". Um circuito de buffer de entrada (300) para um dispositivo semicondutor que inclui um transistor PMOS (306), um transistor NMOS (308) e um circuito de recuperação (314). O circuito de recuperação (314) aplica uma tensão à região de massa do transistor PMOS (306) que provoca um efeito de corpo positivo que faz com que o valor absoluto do limiar de tensão do transistor PMOS (306) diminua temporariamente quando o buffer de entrada (300) comuta. Isto faz com que o buffer de entrada (300) comute mais rapidamente que buffers de entrada convencionais. O buffer de entrada (300) é um buffer de entrada inversora, NOR, NAND ou outro buffer de entrada."QUICK SWITCH INPUT BUFFER". An input buffer circuit (300) for a semiconductor device including a PMOS transistor (306), a NMOS transistor (308), and a recovery circuit (314). The recovery circuit 314 applies a voltage to the mass region of the PMOS transistor 306 which causes a positive body effect that causes the absolute value of the PMOS transistor voltage threshold 306 to temporarily decrease when the entrance (300) switches. This causes the input buffer (300) to switch faster than conventional input buffers. Input buffer (300) is an inverter input buffer, NOR, NAND, or other input buffer.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US61635700A | 2000-07-14 | 2000-07-14 | |
| PCT/US2001/020818 WO2002007317A1 (en) | 2000-07-14 | 2001-06-29 | Fast switching input buffer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BR0112513A true BR0112513A (en) | 2003-07-01 |
Family
ID=24469083
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BR0112513-3A BR0112513A (en) | 2000-07-14 | 2001-06-29 | Fast switching input buffer. |
Country Status (8)
| Country | Link |
|---|---|
| EP (1) | EP1307965A1 (en) |
| JP (1) | JP2004504751A (en) |
| KR (1) | KR20030016401A (en) |
| CN (1) | CN1441996A (en) |
| AU (1) | AU2001271671A1 (en) |
| BR (1) | BR0112513A (en) |
| TW (1) | TW498617B (en) |
| WO (1) | WO2002007317A1 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101795134B (en) * | 2010-03-18 | 2011-12-21 | 中国科学院上海微系统与信息技术研究所 | Circuit for lowering CMOS transient power consumption |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5644266A (en) * | 1995-11-13 | 1997-07-01 | Chen; Ming-Jer | Dynamic threshold voltage scheme for low voltage CMOS inverter |
| KR100242997B1 (en) * | 1996-12-30 | 2000-02-01 | 김영환 | Low power consumption input buffer |
| KR100245556B1 (en) * | 1997-05-27 | 2000-02-15 | 윤종용 | Semiconductor random access memory device of soi having word line driving circuit |
-
2001
- 2001-06-29 AU AU2001271671A patent/AU2001271671A1/en not_active Abandoned
- 2001-06-29 KR KR10-2003-7000515A patent/KR20030016401A/en not_active Application Discontinuation
- 2001-06-29 CN CN01812668A patent/CN1441996A/en active Pending
- 2001-06-29 WO PCT/US2001/020818 patent/WO2002007317A1/en not_active Application Discontinuation
- 2001-06-29 JP JP2002513098A patent/JP2004504751A/en not_active Withdrawn
- 2001-06-29 BR BR0112513-3A patent/BR0112513A/en not_active Application Discontinuation
- 2001-06-29 EP EP01950703A patent/EP1307965A1/en not_active Withdrawn
- 2001-07-06 TW TW090116545A patent/TW498617B/en not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| AU2001271671A1 (en) | 2002-01-30 |
| CN1441996A (en) | 2003-09-10 |
| EP1307965A1 (en) | 2003-05-07 |
| WO2002007317A1 (en) | 2002-01-24 |
| TW498617B (en) | 2002-08-11 |
| KR20030016401A (en) | 2003-02-26 |
| JP2004504751A (en) | 2004-02-12 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| B11A | Dismissal acc. art.33 of ipl - examination not requested within 36 months of filing | ||
| B11Y | Definitive dismissal acc. article 33 of ipl - extension of time limit for request of examination expired |