BE631568A - - Google Patents
Info
- Publication number
- BE631568A BE631568A BE631568DA BE631568A BE 631568 A BE631568 A BE 631568A BE 631568D A BE631568D A BE 631568DA BE 631568 A BE631568 A BE 631568A
- Authority
- BE
- Belgium
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B13/00—Single-crystal growth by zone-melting; Refining by zone-melting
- C30B13/28—Controlling or regulating
- C30B13/30—Stabilisation or shape controlling of the molten zone, e.g. by concentrators, by electromagnetic fields; Controlling the section of the crystal
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DES79197A DE1231671B (de) | 1962-04-27 | 1962-04-27 | Vorrichtung zur Steuerung des Durchmessers der Erstarrungsfront der Schmelzzone beimZonenschmelzen eines Halbleiterstabes |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BE631568A true BE631568A (US20030199744A1-20031023-C00003.png) |
Family
ID=7508016
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BE631568D BE631568A (US20030199744A1-20031023-C00003.png) | 1962-04-27 |
Country Status (5)
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3321575A (en) * | 1964-02-11 | 1967-05-23 | Jolew Corp | Television inspection apparatus adapted for measurement and comparison purposes |
| DE2012438B2 (de) * | 1969-03-17 | 1976-09-30 | Daido Seiko KX., Nagoya, Aichi (Japan) | Verfahren zur steuerung des schmelzvorgangs in einem stahl herstellenden lichtbogenofens |
| US3621130A (en) * | 1969-11-21 | 1971-11-16 | Nasa | System for quantizing graphic displays |
| FR2139434A5 (US20030199744A1-20031023-C00003.png) * | 1971-05-11 | 1973-01-05 | Image Analysing Computers Ltd | |
| DD110182A5 (US20030199744A1-20031023-C00003.png) * | 1972-09-28 | 1974-12-12 | ||
| DE2332968C3 (de) * | 1973-06-28 | 1981-12-10 | Siemens AG, 1000 Berlin und 8000 München | Vorrichtung zur Steuerung des durchmessers eines Halbleiterstabes |
| DE2250721C3 (de) * | 1972-10-16 | 1978-05-18 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Vorrichtung zum tiegellosen Zonenschmelzen eines Halbleiterstabes mit einer die Schmelzzone überwachenden Fernsehkamera |
| US4080172A (en) * | 1975-12-29 | 1978-03-21 | Monsanto Company | Zone refiner automatic control |
| US4135204A (en) * | 1977-06-09 | 1979-01-16 | Chesebrough-Pond's Inc. | Automatic glass blowing apparatus and method |
| DE2731250C2 (de) * | 1977-07-11 | 1986-04-17 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zur Regelung des Stabquerschnittes beim tiegellosen Zonenschmelzen eines Halbleiterstabes |
| US4272781A (en) * | 1978-09-08 | 1981-06-09 | Tokyo Shibaura Denki Kabushiki Kaisha | Nondestructive examining apparatus |
| DE2923240A1 (de) * | 1979-06-08 | 1980-12-18 | Leybold Heraeus Gmbh & Co Kg | Messverfahren und messanordnung fuer den durchmesser von einkristallen beim tiegelziehen |
| US4297893A (en) * | 1980-02-27 | 1981-11-03 | Johns-Manville Corporation | Method and apparatus for measuring flow characteristics of moving fluid stream |
| US4445185A (en) * | 1980-05-08 | 1984-04-24 | Chesebrough-Pond's Inc. | Video inspection system |
| US4344146A (en) * | 1980-05-08 | 1982-08-10 | Chesebrough-Pond's Inc. | Video inspection system |
| JPS63269003A (ja) * | 1987-04-27 | 1988-11-07 | Shin Etsu Handotai Co Ltd | 晶出界面位置検出装置 |
| US4866230A (en) * | 1987-04-27 | 1989-09-12 | Shin-Etu Handotai Company, Limited | Method of and apparatus for controlling floating zone of semiconductor rod |
| JPS63307186A (ja) * | 1987-06-05 | 1988-12-14 | Shin Etsu Handotai Co Ltd | 晶出結晶径制御装置 |
| JPH0651599B2 (ja) * | 1987-12-05 | 1994-07-06 | 信越半導体株式会社 | 浮遊帯域制御方法 |
| US6064429A (en) * | 1997-08-18 | 2000-05-16 | Mcdonnell Douglas Corporation | Foreign object video detection and alert system and method |
| US7171033B2 (en) * | 2001-03-28 | 2007-01-30 | The Boeing Company | System and method for identifying defects in a composite structure |
| US6871684B2 (en) | 2002-08-13 | 2005-03-29 | The Boeing Company | System for identifying defects in a composite structure |
| US7424902B2 (en) | 2004-11-24 | 2008-09-16 | The Boeing Company | In-process vision detection of flaw and FOD characteristics |
| US20060108048A1 (en) * | 2004-11-24 | 2006-05-25 | The Boeing Company | In-process vision detection of flaws and fod by back field illumination |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2674915A (en) * | 1950-01-07 | 1954-04-13 | Gen Electric | Noncontacting width gauge |
| AT194444B (de) * | 1953-02-26 | 1958-01-10 | Siemens Ag | Verfahren und Einrichtung zur Behandlung einer längserstreckten Halbleiterkristallanordnung |
| DE1092576B (de) * | 1957-11-15 | 1960-11-10 | Siemens Ag | Stromzufuehrung fuer die bewegliche Heizspule einer tiegelfreien Zonenziehvorrichtung im Innern eines Gefaesses |
| DE1094238B (de) * | 1959-03-09 | 1960-12-08 | Licentia Gmbh | Verfahren zum Konstanthalten der Breite der Schmelzzone beim tiegelfreien Zonenschmelzen |
| US3021386A (en) * | 1960-03-30 | 1962-02-13 | Gen Electric | Boiler port viewing system |
-
0
- BE BE631568D patent/BE631568A/xx unknown
-
1962
- 1962-04-27 DE DES79197A patent/DE1231671B/de not_active Withdrawn
-
1963
- 1963-02-07 CH CH154063A patent/CH411803A/de unknown
- 1963-04-26 US US277665A patent/US3243509A/en not_active Expired - Lifetime
- 1963-04-29 GB GB16847/63A patent/GB986943A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DE1231671B (de) | 1967-01-05 |
| US3243509A (en) | 1966-03-29 |
| CH411803A (de) | 1966-04-30 |
| GB986943A (en) | 1965-03-24 |
