AU522334B2 - Measuring the content or quantity of a given element by x-ray radiation - Google Patents

Measuring the content or quantity of a given element by x-ray radiation

Info

Publication number
AU522334B2
AU522334B2 AU48236/79A AU4823679A AU522334B2 AU 522334 B2 AU522334 B2 AU 522334B2 AU 48236/79 A AU48236/79 A AU 48236/79A AU 4823679 A AU4823679 A AU 4823679A AU 522334 B2 AU522334 B2 AU 522334B2
Authority
AU
Australia
Prior art keywords
measuring
content
ray radiation
given element
given
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
AU48236/79A
Other languages
English (en)
Other versions
AU4823679A (en
Inventor
Johannes Baecklund
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nils Johannes Baecklund
Original Assignee
Nils Johannes Baecklund
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nils Johannes Baecklund filed Critical Nils Johannes Baecklund
Publication of AU4823679A publication Critical patent/AU4823679A/en
Application granted granted Critical
Publication of AU522334B2 publication Critical patent/AU522334B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/10—Power supply arrangements for feeding the X-ray tube
    • H05G1/12—Power supply arrangements for feeding the X-ray tube with dc or rectified single-phase ac or double-phase
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/112—Non-rotating anodes
    • H01J35/116—Transmissive anodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H01J35/18—Windows
    • H01J35/186—Windows used as targets or X-ray converters

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AU48236/79A 1978-06-21 1979-06-20 Measuring the content or quantity of a given element by x-ray radiation Ceased AU522334B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE78070786 1978-06-21
SE7807078A SE415804B (sv) 1978-06-21 1978-06-21 Sett att medelst rontgenstralning meta halten eller mengden av ett forutbestemt grundemne i ett prov, samt anordning for utforande av settet

Publications (2)

Publication Number Publication Date
AU4823679A AU4823679A (en) 1980-01-03
AU522334B2 true AU522334B2 (en) 1982-05-27

Family

ID=20335268

Family Applications (1)

Application Number Title Priority Date Filing Date
AU48236/79A Ceased AU522334B2 (en) 1978-06-21 1979-06-20 Measuring the content or quantity of a given element by x-ray radiation

Country Status (11)

Country Link
US (1) US4344181A (US06346242-20020212-C00066.png)
JP (2) JPS552991A (US06346242-20020212-C00066.png)
AU (1) AU522334B2 (US06346242-20020212-C00066.png)
CA (1) CA1139021A (US06346242-20020212-C00066.png)
DE (1) DE2924244A1 (US06346242-20020212-C00066.png)
FI (1) FI72814C (US06346242-20020212-C00066.png)
FR (1) FR2429425A1 (US06346242-20020212-C00066.png)
GB (1) GB2025040B (US06346242-20020212-C00066.png)
NL (1) NL7904500A (US06346242-20020212-C00066.png)
SE (1) SE415804B (US06346242-20020212-C00066.png)
ZA (1) ZA793095B (US06346242-20020212-C00066.png)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE428974B (sv) * 1979-02-07 1983-08-01 Nils Johannes Baecklund Sett att medelst rontgenstralning meta halten av ett forutbestemt emne i ett prov
US4484341A (en) * 1981-10-02 1984-11-20 Radiation Dynamics, Inc. Method and apparatus for selectively radiating materials with electrons and X-rays
US4731804A (en) * 1984-12-31 1988-03-15 North American Philips Corporation Window configuration of an X-ray tube
FR2600422B1 (fr) * 1986-05-29 1989-10-13 Instruments Sa Appareil et procede d'analyses chimiques locales a la surface de materiaux solides par spectroscopie de photo-electrons x
GB8621983D0 (en) * 1986-09-12 1986-10-22 K X Technology Ltd Ore analysis
US5442678A (en) * 1990-09-05 1995-08-15 Photoelectron Corporation X-ray source with improved beam steering
US5369679A (en) * 1990-09-05 1994-11-29 Photoelectron Corporation Low power x-ray source with implantable probe for treatment of brain tumors
US5452720A (en) * 1990-09-05 1995-09-26 Photoelectron Corporation Method for treating brain tumors
US5153900A (en) * 1990-09-05 1992-10-06 Photoelectron Corporation Miniaturized low power x-ray source
US5115457A (en) * 1990-10-01 1992-05-19 E. I. Du Pont De Nemours And Company Method of determining titanium dioxide content in paint
WO1997007740A1 (en) 1995-08-24 1997-03-06 Interventional Innovations Corporation X-ray catheter
US6377846B1 (en) 1997-02-21 2002-04-23 Medtronic Ave, Inc. Device for delivering localized x-ray radiation and method of manufacture
DE69823406T2 (de) * 1997-02-21 2005-01-13 Medtronic AVE, Inc., Santa Rosa Röntgenvorrichtung versehen mit einer Dehnungsstruktur zur lokalen Bestrahlung des Inneren eines Körpers
FI102697B1 (fi) * 1997-06-26 1999-01-29 Metorex Int Oy Polarisoitua herätesäteilyä hyödyntävä röntgenfluoresenssimittausjärjestely ja röntgenputki
US5854822A (en) * 1997-07-25 1998-12-29 Xrt Corp. Miniature x-ray device having cold cathode
US6108402A (en) * 1998-01-16 2000-08-22 Medtronic Ave, Inc. Diamond vacuum housing for miniature x-ray device
US6069938A (en) * 1998-03-06 2000-05-30 Chornenky; Victor Ivan Method and x-ray device using pulse high voltage source
US6195411B1 (en) 1999-05-13 2001-02-27 Photoelectron Corporation Miniature x-ray source with flexible probe
JP2003142294A (ja) * 2001-10-31 2003-05-16 Ge Medical Systems Global Technology Co Llc 高電圧発生回路およびｘ線発生装置
JP5581056B2 (ja) 2006-12-15 2014-08-27 ライフボンド リミテッド ゼラチン−トランスグルタミナーゼ止血ドレッシング及びシーラント
EP2133069A1 (en) 2008-06-12 2009-12-16 Lifebond Process for manufacture of gelatin solutions and products thereof
EP2303341A2 (en) * 2008-06-18 2011-04-06 Lifebond Ltd A method for enzymatic cross-linking of a protein
JP5450612B2 (ja) 2008-06-18 2014-03-26 ライフボンド リミテッド 改良された架橋組成物
US20110112573A1 (en) * 2008-06-18 2011-05-12 Orahn Preiss Bloom Methods and devices for use with sealants
EP2515957B1 (en) 2009-12-22 2015-07-29 Lifebond Ltd Modification of enzymatic crosslinkers for controlling properties of crosslinked matrices
US8961544B2 (en) 2010-08-05 2015-02-24 Lifebond Ltd. Dry composition wound dressings and adhesives comprising gelatin and transglutaminase in a cross-linked matrix
US11998654B2 (en) 2018-07-12 2024-06-04 Bard Shannon Limited Securing implants and medical devices

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL92853C (US06346242-20020212-C00066.png) * 1952-02-20
US2999937A (en) * 1958-10-20 1961-09-12 Philips Corp X-ray apparatus
DE1773759A1 (de) * 1968-07-03 1972-03-16 Vnii Raswedotschnoj Geofisiki Vorrichtung fuer Roentgenspektralanalyse
JPS5435078B1 (US06346242-20020212-C00066.png) * 1970-07-30 1979-10-31
US4048496A (en) * 1972-05-08 1977-09-13 Albert Richard D Selectable wavelength X-ray source, spectrometer and assay method
US3925660A (en) * 1972-05-08 1975-12-09 Richard D Albert Selectable wavelength X-ray source, spectrometer and assay method
JPS5139580B2 (US06346242-20020212-C00066.png) * 1973-02-08 1976-10-28
JPS5232593B2 (US06346242-20020212-C00066.png) * 1973-09-06 1977-08-23
JPS5346062Y2 (US06346242-20020212-C00066.png) * 1973-11-06 1978-11-04
JPS5139580U (US06346242-20020212-C00066.png) * 1974-09-18 1976-03-24
US3963922A (en) * 1975-06-09 1976-06-15 Nuclear Semiconductor X-ray fluorescence device
GB1537099A (en) * 1976-06-15 1978-12-29 United Scient Corp X-ray fluorescence device

Also Published As

Publication number Publication date
FR2429425A1 (fr) 1980-01-18
US4344181A (en) 1982-08-10
NL7904500A (nl) 1979-12-28
AU4823679A (en) 1980-01-03
FI72814B (fi) 1987-03-31
SE415804B (sv) 1980-10-27
GB2025040A (en) 1980-01-16
FR2429425B1 (US06346242-20020212-C00066.png) 1985-04-26
SE7807078L (sv) 1979-12-22
JPS552991A (en) 1980-01-10
CA1139021A (en) 1983-01-04
JPS6419160U (US06346242-20020212-C00066.png) 1989-01-31
DE2924244A1 (de) 1980-01-03
FI72814C (fi) 1987-07-10
DE2924244C2 (US06346242-20020212-C00066.png) 1987-05-07
ZA793095B (en) 1980-08-27
JPH0334681Y2 (US06346242-20020212-C00066.png) 1991-07-23
GB2025040B (en) 1982-11-17
FI791817A (fi) 1979-12-22

Similar Documents

Publication Publication Date Title
AU522334B2 (en) Measuring the content or quantity of a given element by x-ray radiation
GB2013877B (en) X-ray detector
JPS5542689A (en) Materials pickinggout instrument
AU4452879A (en) X-ray tube
GB2035748B (en) Radiography
AU529744B2 (en) Exposure meter
AU4950779A (en) Counter weighing scale
AU552526B2 (en) Remote radiation sensing instrument
GB2021770B (en) Distance measuring
GB2031590B (en) Angular displacement measurement
JPS5553051A (en) Radiation detector
GB2036312B (en) Measuring the axis of a borehole
JPS55101069A (en) Multiicell radiation detector
JPS54107360A (en) Thread gage
GB2035550B (en) Measuring radioactive samples
GB2020802B (en) Measuring x-rays
JPS5548673A (en) Scintillation counter
GB2018999B (en) Distance measuring
JPS54123982A (en) Sounddinsulating property measuring instrument
GB2038150B (en) Radiography
JPS5535295A (en) Radiation meter
JPS54139780A (en) Radiation counter
AU531074B2 (en) Measuring content of an element using x-rays
JPS5570745A (en) Indicator adjusting mechanism
GB2025057B (en) Percutaneous blood-oxygen-concentration measuring sensor