AU2018374514B2 - X-ray source and method for generating x-ray radiation - Google Patents

X-ray source and method for generating x-ray radiation Download PDF

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Publication number
AU2018374514B2
AU2018374514B2 AU2018374514A AU2018374514A AU2018374514B2 AU 2018374514 B2 AU2018374514 B2 AU 2018374514B2 AU 2018374514 A AU2018374514 A AU 2018374514A AU 2018374514 A AU2018374514 A AU 2018374514A AU 2018374514 B2 AU2018374514 B2 AU 2018374514B2
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AU
Australia
Prior art keywords
liquid target
electron beam
impact portion
ray
axis
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AU2018374514A
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English (en)
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AU2018374514A1 (en
Inventor
Björn HANSSON
Per TAKMAN
Shiho Tanaka
Yuli Wang
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Excillum AB
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Excillum AB
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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
    • H01J35/153—Spot position control
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
    • H05G2/001—Production of X-ray radiation generated from plasma
    • H05G2/002—Supply of the plasma generating material
    • H05G2/0027—Arrangements for controlling the supply; Arrangements for measurements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/08—Targets (anodes) and X-ray converters
    • H01J2235/081—Target material
    • H01J2235/082—Fluids, e.g. liquids, gases

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Plasma & Fusion (AREA)
  • X-Ray Techniques (AREA)
AU2018374514A 2017-12-01 2018-11-30 X-ray source and method for generating x-ray radiation Active AU2018374514B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP17204949.6 2017-12-01
EP17204949.6A EP3493239A1 (en) 2017-12-01 2017-12-01 X-ray source and method for generating x-ray radiation
PCT/EP2018/083138 WO2019106145A1 (en) 2017-12-01 2018-11-30 X-ray source and method for generating x-ray radiation

Publications (2)

Publication Number Publication Date
AU2018374514A1 AU2018374514A1 (en) 2020-07-16
AU2018374514B2 true AU2018374514B2 (en) 2021-11-11

Family

ID=60569730

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2018374514A Active AU2018374514B2 (en) 2017-12-01 2018-11-30 X-ray source and method for generating x-ray radiation

Country Status (8)

Country Link
US (2) US11342154B2 (enExample)
EP (2) EP3493239A1 (enExample)
JP (2) JP7195648B2 (enExample)
KR (2) KR20240150529A (enExample)
CN (2) CN116504601A (enExample)
AU (1) AU2018374514B2 (enExample)
TW (1) TWI687959B (enExample)
WO (1) WO2019106145A1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3493239A1 (en) 2017-12-01 2019-06-05 Excillum AB X-ray source and method for generating x-ray radiation
EP3579664A1 (en) * 2018-06-08 2019-12-11 Excillum AB Method for controlling an x-ray source
EP3648135A1 (en) 2018-11-05 2020-05-06 Excillum AB Mechanical alignment of x-ray sources
JPWO2021199563A1 (enExample) * 2020-04-03 2021-10-07
EP4075474A1 (en) * 2021-04-15 2022-10-19 Excillum AB Liquid jet target x-ray source
JP7337312B1 (ja) * 2022-03-31 2023-09-01 キヤノンアネルバ株式会社 Ｘ線発生装置、ｘ線撮像装置、および、ｘ線発生装置の調整方法
CN114945237B (zh) * 2022-04-25 2025-12-05 上海科技大学 桌面型飞秒硬x射线脉冲源装置及脉冲产生方法
SE2351080A1 (en) * 2023-09-18 2025-03-19 Northvolt Ab A battery cell imaging apparatus

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5052034A (en) * 1989-10-30 1991-09-24 Siemens Aktiengesellschaft X-ray generator

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4608543A (en) 1984-12-17 1986-08-26 Advanced Micro Devices, Inc. Controllable effective resistance and phase lock loop with controllable filter
US4953191A (en) * 1989-07-24 1990-08-28 The United States Of America As Represented By The United States Department Of Energy High intensity x-ray source using liquid gallium target
JPH05258692A (ja) 1992-03-10 1993-10-08 Nikon Corp Ｘ線発生方法およびｘ線発生装置
US6324255B1 (en) * 1998-08-13 2001-11-27 Nikon Technologies, Inc. X-ray irradiation apparatus and x-ray exposure apparatus
DE60033374T2 (de) * 1999-12-20 2007-11-29 Koninklijke Philips Electronics N.V. Röntgenmikroskop mit einer röntgenstrahlungsquelle für weiche röntgenstrahlungen
EP1305984B1 (en) * 2000-07-28 2010-11-24 Jettec AB Method and apparatus for generating x-ray radiation
EP1573774A2 (en) * 2002-12-11 2005-09-14 Koninklijke Philips Electronics N.V. X-ray source for generating monochromatic x-rays
DE10326279A1 (de) * 2003-06-11 2005-01-05 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Plasma-basierte Erzeugung von Röntgenstrahlung mit einem schichtförmigen Targetmaterial
DE102004013620B4 (de) * 2004-03-19 2008-12-04 GE Homeland Protection, Inc., Newark Elektronenfenster für eine Flüssigmetallanode, Flüssigmetallanode, Röntgenstrahler und Verfahren zum Betrieb eines solchen Röntgenstrahlers
US7208746B2 (en) * 2004-07-14 2007-04-24 Asml Netherlands B.V. Radiation generating device, lithographic apparatus, device manufacturing method and device manufactured thereby
US8213576B2 (en) * 2007-08-09 2012-07-03 Shimadzu Corporation X-ray tube apparatus
DE102008026938A1 (de) * 2008-06-05 2009-12-17 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Strahlungsquelle und Verfahren zum Erzeugen von Röntgenstrahlung
US8681943B2 (en) * 2009-01-26 2014-03-25 Excillum Ab X-ray window
EP2743963B8 (en) * 2009-04-03 2015-10-28 Excillum AB Supply of a liquid-metal target in x-ray generation
HUP1000635A2 (en) * 2010-11-26 2012-05-29 Ge Hungary Kft Liquid anode x-ray source
EP3089192B1 (en) * 2010-12-22 2018-05-09 Excillum AB Focusing an electron beam in an x-ray source
WO2013020130A1 (en) 2011-08-04 2013-02-07 John Lewellen Bremstrahlung target for intensity modulated x-ray radiation therapy and stereotactic x-ray therapy
NL2009359A (en) * 2011-09-23 2013-03-26 Asml Netherlands Bv Radiation source.
WO2013185829A1 (en) * 2012-06-14 2013-12-19 Excillum Ab Limiting migration of target material
EP2837016B1 (de) * 2012-06-15 2016-08-17 Siemens Aktiengesellschaft Röntgenstrahlungsquelle und deren verwendung und verfahren zum erzeugen von röntgenstrahlung
CN103543298B (zh) 2012-07-13 2016-03-23 旺矽科技股份有限公司 探针固持结构及其光学检测装置
US20140161233A1 (en) 2012-12-06 2014-06-12 Bruker Axs Gmbh X-ray apparatus with deflectable electron beam
US20140219424A1 (en) * 2013-02-04 2014-08-07 Moxtek, Inc. Electron Beam Focusing and Centering
US9232623B2 (en) * 2014-01-22 2016-01-05 Asml Netherlands B.V. Extreme ultraviolet light source
EP3493239A1 (en) 2017-12-01 2019-06-05 Excillum AB X-ray source and method for generating x-ray radiation

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5052034A (en) * 1989-10-30 1991-09-24 Siemens Aktiengesellschaft X-ray generator

Also Published As

Publication number Publication date
US11342154B2 (en) 2022-05-24
JP7488600B2 (ja) 2024-05-22
KR102714936B1 (ko) 2024-10-07
JP2023027189A (ja) 2023-03-01
EP3718127B1 (en) 2023-12-20
CN111542906A (zh) 2020-08-14
CN111542906B (zh) 2023-06-30
TWI687959B (zh) 2020-03-11
KR20200090885A (ko) 2020-07-29
US20220254595A1 (en) 2022-08-11
EP3493239A1 (en) 2019-06-05
TW201926396A (zh) 2019-07-01
US11963286B2 (en) 2024-04-16
JP7195648B2 (ja) 2022-12-26
WO2019106145A1 (en) 2019-06-06
JP2021504906A (ja) 2021-02-15
AU2018374514A1 (en) 2020-07-16
EP3718127A1 (en) 2020-10-07
KR20240150529A (ko) 2024-10-15
US20210027974A1 (en) 2021-01-28
CN116504601A (zh) 2023-07-28

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