AU2002218092A1 - Vddq integrated circuit testing system and method - Google Patents

Vddq integrated circuit testing system and method

Info

Publication number
AU2002218092A1
AU2002218092A1 AU2002218092A AU1809202A AU2002218092A1 AU 2002218092 A1 AU2002218092 A1 AU 2002218092A1 AU 2002218092 A AU2002218092 A AU 2002218092A AU 1809202 A AU1809202 A AU 1809202A AU 2002218092 A1 AU2002218092 A1 AU 2002218092A1
Authority
AU
Australia
Prior art keywords
vddq
integrated circuit
testing system
circuit testing
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2002218092A
Other languages
English (en)
Inventor
Claude Thibeault
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ecole de Technologie Superieure
Original Assignee
ECOLE TECHNOLOGIE SUPERIEURE
Ecole de Technologie Superieure
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ECOLE TECHNOLOGIE SUPERIEURE, Ecole de Technologie Superieure filed Critical ECOLE TECHNOLOGIE SUPERIEURE
Publication of AU2002218092A1 publication Critical patent/AU2002218092A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
AU2002218092A 2000-11-22 2001-11-20 Vddq integrated circuit testing system and method Abandoned AU2002218092A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US71863700A 2000-11-22 2000-11-22
US09/718,637 2000-11-22
PCT/CA2001/001636 WO2002042783A2 (fr) 2000-11-22 2001-11-20 Systeme et procede de test de circuit integre vddq

Publications (1)

Publication Number Publication Date
AU2002218092A1 true AU2002218092A1 (en) 2002-06-03

Family

ID=24886876

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2002218092A Abandoned AU2002218092A1 (en) 2000-11-22 2001-11-20 Vddq integrated circuit testing system and method

Country Status (4)

Country Link
US (1) US6686756B2 (fr)
AU (1) AU2002218092A1 (fr)
CA (1) CA2407766C (fr)
WO (1) WO2002042783A2 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060034899A1 (en) * 2004-08-12 2006-02-16 Ylitalo Caroline M Biologically-active adhesive articles and methods of manufacture
CN101470653B (zh) * 2007-12-28 2012-08-29 鸿富锦精密工业（深圳）有限公司 电压裕度测试装置
TWI402519B (zh) * 2008-01-04 2013-07-21 Hon Hai Prec Ind Co Ltd 電壓裕度測試裝置
US8476917B2 (en) * 2010-01-29 2013-07-02 Freescale Semiconductor, Inc. Quiescent current (IDDQ) indication and testing apparatus and methods
US9482706B2 (en) * 2012-12-11 2016-11-01 Dust Company, Inc. Methods and circuits for measuring a high impedance element based on time constant measurements
JP5773092B2 (ja) * 2012-12-26 2015-09-02 株式会社村田製作所 高周波増幅回路
CN117147950B (zh) * 2023-11-01 2024-01-09 广东科信电子有限公司 一种芯片供电电压自动检测电路

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5905381A (en) * 1996-08-22 1999-05-18 Lsi Logic Corporation Functional OBIC analysis
US5929650A (en) * 1997-02-04 1999-07-27 Motorola, Inc. Method and apparatus for performing operative testing on an integrated circuit
US6031386A (en) * 1997-10-31 2000-02-29 Sandia Corporation Apparatus and method for defect testing of integrated circuits
US6005433A (en) * 1998-07-30 1999-12-21 Credence Systems Corporation Low charge injection mosfet switch
JP2001091568A (ja) * 1999-09-17 2001-04-06 Advantest Corp 半導体集積回路の試験装置及び試験方法

Also Published As

Publication number Publication date
WO2002042783A3 (fr) 2003-05-01
US20030001608A1 (en) 2003-01-02
WO2002042783A2 (fr) 2002-05-30
CA2407766C (fr) 2010-06-29
CA2407766A1 (fr) 2002-05-30
US6686756B2 (en) 2004-02-03

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