AU2001291462A1 - Device used for the chemical analysis of material samples and corresponding metallurgical vessel - Google Patents

Device used for the chemical analysis of material samples and corresponding metallurgical vessel

Info

Publication number
AU2001291462A1
AU2001291462A1 AU2001291462A AU9146201A AU2001291462A1 AU 2001291462 A1 AU2001291462 A1 AU 2001291462A1 AU 2001291462 A AU2001291462 A AU 2001291462A AU 9146201 A AU9146201 A AU 9146201A AU 2001291462 A1 AU2001291462 A1 AU 2001291462A1
Authority
AU
Australia
Prior art keywords
laser beam
laser
material sample
chemical analysis
material samples
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001291462A
Other languages
English (en)
Inventor
Dieter Bauerle
Johann Gruber
Johannes Heitz
Norbert Ramaseder
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Primetals Technologies Austria GmbH
Original Assignee
Voest Alpine Industrienlagenbau GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Voest Alpine Industrienlagenbau GmbH filed Critical Voest Alpine Industrienlagenbau GmbH
Publication of AU2001291462A1 publication Critical patent/AU2001291462A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718Laser microanalysis, i.e. with formation of sample plasma
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/063Illuminating optical parts
    • G01N2201/0638Refractive parts

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Sampling And Sample Adjustment (AREA)
AU2001291462A 2000-09-28 2001-09-27 Device used for the chemical analysis of material samples and corresponding metallurgical vessel Abandoned AU2001291462A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
AT1647/2000 2000-09-28
AT0164700A AT409553B (de) 2000-09-28 2000-09-28 Vorrichtung zur chemischen analyse von materialproben sowie metallurgisches gefäss hierfür
PCT/AT2001/000306 WO2002027301A1 (fr) 2000-09-28 2001-09-27 Dispositif d'analyse chimique d'echantillons de matiere et recipient metallurgique utilise a cette fin

Publications (1)

Publication Number Publication Date
AU2001291462A1 true AU2001291462A1 (en) 2002-04-08

Family

ID=3688537

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001291462A Abandoned AU2001291462A1 (en) 2000-09-28 2001-09-27 Device used for the chemical analysis of material samples and corresponding metallurgical vessel

Country Status (11)

Country Link
US (1) US7006216B2 (fr)
EP (1) EP1322939B1 (fr)
KR (1) KR100809563B1 (fr)
AT (2) AT409553B (fr)
AU (1) AU2001291462A1 (fr)
BR (1) BR0114292A (fr)
CA (1) CA2425621A1 (fr)
CZ (1) CZ2003905A3 (fr)
DE (1) DE50112457D1 (fr)
WO (1) WO2002027301A1 (fr)
ZA (1) ZA200302380B (fr)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT500029B1 (de) * 2004-02-18 2006-11-15 Innsitec Laser Technologies Gm Vorrichtung und verfahren zur bestimmung der chemischen zusammensetzung von festen, flüssigen oder gasförmigen stoffen
DE102004063365A1 (de) * 2004-12-30 2006-07-13 Sms Demag Ag Vorrichtung zur Erfassung der Temperatur und der Analyse von Schmelzen in metallurgischen Schmelzgefäßen
EP1720002A1 (fr) * 2005-05-04 2006-11-08 Oxford Instruments Analytical Oy Procédé et arrangement pour l'analyse non-destructive de la composition d'un échantillon délicat
DE102007033622B4 (de) * 2007-07-17 2010-04-08 Heraeus Electro-Nite International N.V. Verwendung einer hochtemperaturbeständigen Vorrichtung in Stahlschmelzen
EP2489979B1 (fr) * 2011-02-19 2013-06-05 Refractory Intellectual Property GmbH & Co. KG Procédé de reconnaissance et de mesure de surfaces cylindriques sur des composants céramiques ignifuges dans des applications métallurgiques
CN102706838B (zh) * 2012-06-16 2014-01-15 冶金自动化研究设计院 一种冶金成分在线检测装置及方法
EP3215828B1 (fr) * 2014-11-07 2024-07-17 National Research Council of Canada Appareil compact pour la spectroscopie par rupture induite par laser et procédé associé
CN106290264B (zh) * 2016-10-27 2019-06-11 西安交通大学 一种基于激光诱导光谱击穿技术检测真空装置真空度的系统及方法
US10506985B2 (en) * 2017-06-15 2019-12-17 The University Of Massachusetts Methods and systems for diagnosing or monitoring progress of a pathology using laser induced breakdown spectroscopy and biological fluids
CN109738421A (zh) * 2019-01-30 2019-05-10 合肥金星机电科技发展有限公司 熔体成分检测系统
US12055495B2 (en) 2020-07-16 2024-08-06 University Of Massachusetts Diagnosis of disease using laser-induced breakdown spectroscopy and machine learning
CN112517889B (zh) * 2020-10-30 2021-12-24 中国航发北京航空材料研究院 一种钛合金机匣铸造过程冒口动态加热系统及方法
CN115108680B (zh) * 2022-06-25 2023-11-03 广西七彩环境科技有限公司 一种靶向法水质提标工艺系统

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2528187B1 (fr) * 1982-06-08 1986-01-24 Commissariat Energie Atomique Dispositif pour la transmission d'un faisceau energetique
DE3413589A1 (de) * 1984-04-11 1985-10-24 Fried. Krupp Gmbh, 4300 Essen Verfahren zur messung der zusammensetzung und der temperatur von fluessigem stahl und fluessiger schlacke in einem schmelzgefaess
JPS6186636A (ja) 1984-10-05 1986-05-02 Kawasaki Steel Corp 鋼のレ−ザ発光分光分析方法
IT206702Z2 (it) * 1985-11-26 1987-10-01 Comau Spa Robot industriale per saldatura e taglio mediante fascio laser
DE3617869A1 (de) * 1986-05-27 1987-12-03 Hoesch Stahl Ag Spektralanalysenvorrichtung an einem konverter
ES2065961T3 (es) * 1988-10-03 1995-03-01 Krupp Ag Hoesch Krupp Procedimiento para el acoplamiento optico de un sistema de analisis elemental y un laser de metal liquido en un recipiente de fundicion.
US4892992A (en) * 1988-11-03 1990-01-09 Gmf Robotics Corporation Industrial laser robot system
US4986658B1 (en) * 1989-04-21 1996-06-25 Univ Lehigh Transient spectroscopic method and apparatus for in-process analysis of molten metal
JP2727813B2 (ja) * 1991-08-07 1998-03-18 住友金属工業株式会社 溶融金属の成分分析装置
JP2727812B2 (ja) * 1991-08-07 1998-03-18 住友金属工業株式会社 溶融金属の成分分析装置
TW337553B (en) 1995-12-20 1998-08-01 Voest Alpine Ind Anlagen Method for determination of electromagnetic waves originating from a melt
IT1306112B1 (it) * 1998-03-20 2001-05-29 Consiglio Nazionale Ricerche Metodo per l'analisi quantitativa dei componenti atomici di materialimediante misure di spettroscopia libs senza calibrazione
JPH11326206A (ja) * 1998-05-08 1999-11-26 Nippon Steel Corp 炉内溶融金属の光学的測定装置

Also Published As

Publication number Publication date
US7006216B2 (en) 2006-02-28
EP1322939A1 (fr) 2003-07-02
BR0114292A (pt) 2003-07-29
ATA16472000A (de) 2002-01-15
AT409553B (de) 2002-09-25
CZ2003905A3 (cs) 2003-08-13
KR20030028581A (ko) 2003-04-08
CA2425621A1 (fr) 2003-04-08
KR100809563B1 (ko) 2008-03-04
US20030218747A1 (en) 2003-11-27
ZA200302380B (en) 2004-03-12
EP1322939B1 (fr) 2007-05-02
ATE361466T1 (de) 2007-05-15
WO2002027301A1 (fr) 2002-04-04
DE50112457D1 (de) 2007-06-14

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