ATE92640T1 - Frequenzmoduliertes laser-radar. - Google Patents
Frequenzmoduliertes laser-radar.Info
- Publication number
- ATE92640T1 ATE92640T1 AT85301845T AT85301845T ATE92640T1 AT E92640 T1 ATE92640 T1 AT E92640T1 AT 85301845 T AT85301845 T AT 85301845T AT 85301845 T AT85301845 T AT 85301845T AT E92640 T1 ATE92640 T1 AT E92640T1
- Authority
- AT
- Austria
- Prior art keywords
- ranging
- interferometer
- target
- path
- phase difference
- Prior art date
Links
- 230000005855 radiation Effects 0.000 abstract 5
- 230000003746 surface roughness Effects 0.000 abstract 3
- 238000002310 reflectometry Methods 0.000 abstract 2
- 230000001427 coherent effect Effects 0.000 abstract 1
- 238000005259 measurement Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/06—Systems determining position data of a target
- G01S17/08—Systems determining position data of a target for measuring distance only
- G01S17/32—Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated
- G01S17/34—Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated using transmission of continuous, frequency-modulated waves while heterodyning the received signal, or a signal derived therefrom, with a locally-generated signal related to the contemporaneously transmitted signal
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/497—Means for monitoring or calibrating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/60—Reference interferometer, i.e. additional interferometer not interacting with object
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Networks & Wireless Communication (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Electromagnetism (AREA)
- Optical Radar Systems And Details Thereof (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/590,350 US4830486A (en) | 1984-03-16 | 1984-03-16 | Frequency modulated lasar radar |
| EP85301845A EP0164181B1 (de) | 1984-03-16 | 1985-03-15 | Frequenzmoduliertes Laser-Radar |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE92640T1 true ATE92640T1 (de) | 1993-08-15 |
Family
ID=24361895
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT85301845T ATE92640T1 (de) | 1984-03-16 | 1985-03-15 | Frequenzmoduliertes laser-radar. |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4830486A (de) |
| EP (1) | EP0164181B1 (de) |
| JP (1) | JP2566907B2 (de) |
| AT (1) | ATE92640T1 (de) |
| DE (1) | DE3587492T2 (de) |
Families Citing this family (101)
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| US4355900A (en) * | 1980-08-08 | 1982-10-26 | The United States Of America As Represented By The Secretary Of The Air Force | Self-calibrating interferometer |
| JPS5838880A (ja) * | 1981-08-31 | 1983-03-07 | Tokyo Optical Co Ltd | 光波距離計 |
| CA1176355A (en) * | 1981-12-22 | 1984-10-16 | Her Majesty In Right Of Canada As Represented By The Atomic Energy Of Ca Nada Limited | Multiple measuring control volume laser doppler anemometer |
| US4533242A (en) * | 1982-09-28 | 1985-08-06 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Ranging system which compares an object-reflected component of a light beam to a reference component of the light beam |
| US4511800A (en) * | 1983-03-28 | 1985-04-16 | Rca Corporation | Optical reflectance method for determining the surface roughness of materials in semiconductor processing |
| US4611912A (en) * | 1983-04-04 | 1986-09-16 | Ball Corporation | Method and apparatus for optically measuring distance and velocity |
| US4594000A (en) * | 1983-04-04 | 1986-06-10 | Ball Corporation | Method and apparatus for optically measuring distance and velocity |
| US4547685A (en) * | 1983-10-21 | 1985-10-15 | Advanced Micro Devices, Inc. | Sense amplifier circuit for semiconductor memories |
| JPS60138484A (ja) * | 1983-12-26 | 1985-07-23 | Toshiba Corp | 距離測定装置 |
-
1984
- 1984-03-16 US US06/590,350 patent/US4830486A/en not_active Expired - Lifetime
-
1985
- 1985-03-15 AT AT85301845T patent/ATE92640T1/de not_active IP Right Cessation
- 1985-03-15 JP JP60052169A patent/JP2566907B2/ja not_active Expired - Lifetime
- 1985-03-15 DE DE85301845T patent/DE3587492T2/de not_active Expired - Fee Related
- 1985-03-15 EP EP85301845A patent/EP0164181B1/de not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60233581A (ja) | 1985-11-20 |
| US4830486A (en) | 1989-05-16 |
| JP2566907B2 (ja) | 1996-12-25 |
| EP0164181A2 (de) | 1985-12-11 |
| DE3587492T2 (de) | 1994-03-17 |
| DE3587492D1 (de) | 1993-09-09 |
| EP0164181B1 (de) | 1993-08-04 |
| EP0164181A3 (en) | 1988-10-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| UEP | Publication of translation of european patent specification | ||
| REN | Ceased due to non-payment of the annual fee |