ATE73236T1 - Sechstorreflektometer-pruefanordnung. - Google Patents
Sechstorreflektometer-pruefanordnung.Info
- Publication number
- ATE73236T1 ATE73236T1 AT86309749T AT86309749T ATE73236T1 AT E73236 T1 ATE73236 T1 AT E73236T1 AT 86309749 T AT86309749 T AT 86309749T AT 86309749 T AT86309749 T AT 86309749T AT E73236 T1 ATE73236 T1 AT E73236T1
- Authority
- AT
- Austria
- Prior art keywords
- test
- port
- test setup
- generator
- port reflectometer
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
- G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Aerials With Secondary Devices (AREA)
- Optical Elements Other Than Lenses (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB8601108A GB2185582B (en) | 1986-01-17 | 1986-01-17 | Test arrangement |
GB8609227A GB2185583B (en) | 1986-01-17 | 1986-04-16 | Test arrangement |
EP86309749A EP0234112B1 (de) | 1986-01-17 | 1986-12-15 | Sechstorreflektometer-Prüfanordnung |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE73236T1 true ATE73236T1 (de) | 1992-03-15 |
Family
ID=26290237
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT86309749T ATE73236T1 (de) | 1986-01-17 | 1986-12-15 | Sechstorreflektometer-pruefanordnung. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4808912A (de) |
EP (1) | EP0234112B1 (de) |
AT (1) | ATE73236T1 (de) |
DE (1) | DE3684139D1 (de) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5170126A (en) * | 1991-05-14 | 1992-12-08 | Hughes Aircraft Company | Microwave six-port noise parameter analyzer |
JP2807177B2 (ja) * | 1994-07-27 | 1998-10-08 | 日本ヒューレット・パッカード株式会社 | 回路網測定装置及び校正方法 |
JP2866011B2 (ja) * | 1994-08-24 | 1999-03-08 | 日本ヒューレット・パッカード株式会社 | 回路網測定装置の校正方法 |
US5572160A (en) * | 1994-12-01 | 1996-11-05 | Teradyne, Inc. | Architecture for RF signal automatic test equipment |
DE19606986C2 (de) * | 1996-02-24 | 1999-03-04 | Rohde & Schwarz | Verfahren zum Messen der Eintor- bzw. Mehrtor-Parameter eines Meßobjektes mittels eines Netzwerkanalysators |
US6249128B1 (en) | 1997-10-22 | 2001-06-19 | Teradyne, Inc. | Automated microwave test system with improved accuracy |
DE19926454C2 (de) * | 1999-06-10 | 2002-02-28 | Rohde & Schwarz | Vektorieller Netzwerkanalysator |
IT1312404B1 (it) * | 1999-06-15 | 2002-04-17 | Andrea Ferrero | Dispositivo a sintesi di impedenza di carico o sorgente attiva perbanchi di misura di componenti ed apparati alle microonde |
DE60124547T2 (de) * | 2001-09-24 | 2007-09-06 | Agilent Technologies, Inc. (n.d.Ges.d.Staates Delaware), Palo Alto | Sammeln von HF-Eingangs- und -Ausgangs- sowie Vorspannungssignaldaten |
US7476371B2 (en) * | 2002-02-14 | 2009-01-13 | Phibro-Tech, Inc. | Dissolution of copper metal in aqueous alkanolamine to form copper containing aqueous solution |
WO2006004569A2 (en) * | 2004-01-15 | 2006-01-12 | Bae Systems Information And Electronic Systems Integration Inc. | Algorithm for estimation of multiple faults on a transmission line or waveguide |
US7019510B1 (en) * | 2004-12-14 | 2006-03-28 | Anritsu Company | Portable ultra wide band handheld VNA |
US7994800B2 (en) * | 2008-03-25 | 2011-08-09 | General Electric Company | Systems and methods for online phase calibration |
US8874391B2 (en) * | 2009-06-05 | 2014-10-28 | Bae Systems Information And Electronic Systems Integration Inc. | Distance-to-fault measurement system capable of measuring complex reflection coefficients |
US10084554B2 (en) * | 2014-03-10 | 2018-09-25 | Litepoint Corporation | System and method for testing a radio frequency transceiver by controlling test flow via an induced interrupt |
US9910124B2 (en) * | 2016-02-04 | 2018-03-06 | Globalfoundries Inc. | Apparatus and method for vector s-parameter measurements |
DE102016119562B3 (de) * | 2016-10-13 | 2018-02-15 | Friedrich-Alexander-Universität Erlangen-Nürnberg | Elektrisches Messsystem zur Frequenzmessung und Erkennung von Störsignalen und Betriebsverfahren hierfür |
US11431379B1 (en) * | 2021-03-31 | 2022-08-30 | Teradyne, Inc. | Front-end module |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4521728A (en) * | 1982-08-23 | 1985-06-04 | Renato Bosisio | Method and a six port network for use in determining complex reflection coefficients of microwave networks |
GB8413339D0 (en) * | 1984-05-24 | 1984-06-27 | Secr Defence | Six-port reflectometer |
-
1986
- 1986-12-15 EP EP86309749A patent/EP0234112B1/de not_active Expired - Lifetime
- 1986-12-15 AT AT86309749T patent/ATE73236T1/de not_active IP Right Cessation
- 1986-12-15 DE DE8686309749T patent/DE3684139D1/de not_active Expired - Fee Related
- 1986-12-31 US US06/948,055 patent/US4808912A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US4808912A (en) | 1989-02-28 |
EP0234112B1 (de) | 1992-03-04 |
EP0234112A1 (de) | 1987-09-02 |
DE3684139D1 (de) | 1992-04-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ATE73236T1 (de) | Sechstorreflektometer-pruefanordnung. | |
AU1678697A (en) | Assembly and method for testing integrated circuit devices | |
CA2148106A1 (en) | Printed Circuit Board Testing Device with Foil Adapter | |
GB1542235A (en) | Test pin for testing electrical circuits | |
KR900006789A (ko) | 전자장치를 시험하는 시험장치 및 방법과 시험장치를 갖춘 반도체장치 | |
IE34695B1 (en) | Telephone calls simulator | |
CA990355A (en) | Fault simulation system for determining the testability of a non-linear integrated circuit by an electrical signal test pattern | |
GB1404159A (en) | Methods and apparatus for measuring the parameters of electrical devices | |
SE7706576L (sv) | Forfarande och anordning for att testa overforingsledningar | |
BR8707524A (pt) | Aparelho de teste de fundicao hepatica | |
ATE61122T1 (de) | Sechstorreflektometer-pruefanordnung. | |
JPS5440082A (en) | Semiconductor test device | |
SE8306911L (sv) | Kretsanordning for overvakning av telefonkretsar | |
SU1182407A1 (ru) | Способ испытаний компенсационных приборов на устойчивость к комбинированным воздействи м | |
JPS542778A (en) | Checking device | |
JPS534412A (en) | Test method for subscribing lines | |
JPS52143708A (en) | Signal line test system | |
MILLER | Dumiload transducer tester[Final Report] | |
JPS5769348A (en) | Electronic device and its test system | |
SU705373A1 (ru) | Измеритель амплитудно-частотных характеристик | |
JPS5422105A (en) | Circuit connecting device | |
SU796687A1 (ru) | Стенд дл испытани строительныхэлЕМЕНТОВ HA СЕйСМОСТОйКОСТь | |
JPS55153353A (en) | Semiconductor device | |
JPS6448137A (en) | Input/output method for loop back testing data | |
JPS5320981A (en) | Voltage-withstand tester |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |