ATE73236T1 - Sechstorreflektometer-pruefanordnung. - Google Patents

Sechstorreflektometer-pruefanordnung.

Info

Publication number
ATE73236T1
ATE73236T1 AT86309749T AT86309749T ATE73236T1 AT E73236 T1 ATE73236 T1 AT E73236T1 AT 86309749 T AT86309749 T AT 86309749T AT 86309749 T AT86309749 T AT 86309749T AT E73236 T1 ATE73236 T1 AT E73236T1
Authority
AT
Austria
Prior art keywords
test
port
test setup
generator
port reflectometer
Prior art date
Application number
AT86309749T
Other languages
English (en)
Inventor
Christopher Malcolm Potter
George Hjipieris
Original Assignee
Marconi Instruments Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB8601108A external-priority patent/GB2185582B/en
Application filed by Marconi Instruments Ltd filed Critical Marconi Instruments Ltd
Application granted granted Critical
Publication of ATE73236T1 publication Critical patent/ATE73236T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Aerials With Secondary Devices (AREA)
  • Optical Elements Other Than Lenses (AREA)
AT86309749T 1986-01-17 1986-12-15 Sechstorreflektometer-pruefanordnung. ATE73236T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB8601108A GB2185582B (en) 1986-01-17 1986-01-17 Test arrangement
GB8609227A GB2185583B (en) 1986-01-17 1986-04-16 Test arrangement
EP86309749A EP0234112B1 (de) 1986-01-17 1986-12-15 Sechstorreflektometer-Prüfanordnung

Publications (1)

Publication Number Publication Date
ATE73236T1 true ATE73236T1 (de) 1992-03-15

Family

ID=26290237

Family Applications (1)

Application Number Title Priority Date Filing Date
AT86309749T ATE73236T1 (de) 1986-01-17 1986-12-15 Sechstorreflektometer-pruefanordnung.

Country Status (4)

Country Link
US (1) US4808912A (de)
EP (1) EP0234112B1 (de)
AT (1) ATE73236T1 (de)
DE (1) DE3684139D1 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5170126A (en) * 1991-05-14 1992-12-08 Hughes Aircraft Company Microwave six-port noise parameter analyzer
JP2807177B2 (ja) * 1994-07-27 1998-10-08 日本ヒューレット・パッカード株式会社 回路網測定装置及び校正方法
JP2866011B2 (ja) * 1994-08-24 1999-03-08 日本ヒューレット・パッカード株式会社 回路網測定装置の校正方法
US5572160A (en) * 1994-12-01 1996-11-05 Teradyne, Inc. Architecture for RF signal automatic test equipment
DE19606986C2 (de) * 1996-02-24 1999-03-04 Rohde & Schwarz Verfahren zum Messen der Eintor- bzw. Mehrtor-Parameter eines Meßobjektes mittels eines Netzwerkanalysators
US6249128B1 (en) 1997-10-22 2001-06-19 Teradyne, Inc. Automated microwave test system with improved accuracy
DE19926454C2 (de) * 1999-06-10 2002-02-28 Rohde & Schwarz Vektorieller Netzwerkanalysator
IT1312404B1 (it) * 1999-06-15 2002-04-17 Andrea Ferrero Dispositivo a sintesi di impedenza di carico o sorgente attiva perbanchi di misura di componenti ed apparati alle microonde
EP1296151B1 (de) * 2001-09-24 2006-11-15 Agilent Technologies, Inc. (a Delaware corporation) Sammeln von HF-Eingangs- und -Ausgangs- sowie Vorspannungssignaldaten
US7476371B2 (en) * 2002-02-14 2009-01-13 Phibro-Tech, Inc. Dissolution of copper metal in aqueous alkanolamine to form copper containing aqueous solution
WO2005069943A2 (en) * 2004-01-15 2005-08-04 Bae Systems Information And Electronic Systems Integration Inc. Method and apparatus for calibrating a frequency domain reflectometer
US7019510B1 (en) * 2004-12-14 2006-03-28 Anritsu Company Portable ultra wide band handheld VNA
US7994800B2 (en) * 2008-03-25 2011-08-09 General Electric Company Systems and methods for online phase calibration
US8874391B2 (en) * 2009-06-05 2014-10-28 Bae Systems Information And Electronic Systems Integration Inc. Distance-to-fault measurement system capable of measuring complex reflection coefficients
US10084554B2 (en) * 2014-03-10 2018-09-25 Litepoint Corporation System and method for testing a radio frequency transceiver by controlling test flow via an induced interrupt
US9910124B2 (en) * 2016-02-04 2018-03-06 Globalfoundries Inc. Apparatus and method for vector s-parameter measurements
DE102016119562B3 (de) * 2016-10-13 2018-02-15 Friedrich-Alexander-Universität Erlangen-Nürnberg Elektrisches Messsystem zur Frequenzmessung und Erkennung von Störsignalen und Betriebsverfahren hierfür
US11431379B1 (en) * 2021-03-31 2022-08-30 Teradyne, Inc. Front-end module

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4521728A (en) * 1982-08-23 1985-06-04 Renato Bosisio Method and a six port network for use in determining complex reflection coefficients of microwave networks
GB8413339D0 (en) * 1984-05-24 1984-06-27 Secr Defence Six-port reflectometer

Also Published As

Publication number Publication date
EP0234112A1 (de) 1987-09-02
US4808912A (en) 1989-02-28
DE3684139D1 (de) 1992-04-09
EP0234112B1 (de) 1992-03-04

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Legal Events

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