ATE536630T1 - Einfangen geladener teilchen in oberflächennahen potentialmulden - Google Patents

Einfangen geladener teilchen in oberflächennahen potentialmulden

Info

Publication number
ATE536630T1
ATE536630T1 AT02713493T AT02713493T ATE536630T1 AT E536630 T1 ATE536630 T1 AT E536630T1 AT 02713493 T AT02713493 T AT 02713493T AT 02713493 T AT02713493 T AT 02713493T AT E536630 T1 ATE536630 T1 AT E536630T1
Authority
AT
Austria
Prior art keywords
ions
time
mass analysis
electric field
energy
Prior art date
Application number
AT02713493T
Other languages
English (en)
Inventor
Craig Whitehouse
David Welkie
Original Assignee
Perkinelmer Health Sci Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Perkinelmer Health Sci Inc filed Critical Perkinelmer Health Sci Inc
Application granted granted Critical
Publication of ATE536630T1 publication Critical patent/ATE536630T1/de

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y30/00Nanotechnology for materials or surface science, e.g. nanocomposites
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/0068Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with a surface, e.g. surface induced dissociation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Nanotechnology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Composite Materials (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Materials Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
AT02713493T 2001-01-29 2002-01-28 Einfangen geladener teilchen in oberflächennahen potentialmulden ATE536630T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US26485601P 2001-01-29 2001-01-29
US10/056,671 US6683301B2 (en) 2001-01-29 2002-01-25 Charged particle trapping in near-surface potential wells
PCT/US2002/002534 WO2002061798A1 (en) 2001-01-29 2002-01-28 Charged particle trapping in near surface potential wells

Publications (1)

Publication Number Publication Date
ATE536630T1 true ATE536630T1 (de) 2011-12-15

Family

ID=26735584

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02713493T ATE536630T1 (de) 2001-01-29 2002-01-28 Einfangen geladener teilchen in oberflächennahen potentialmulden

Country Status (5)

Country Link
US (2) US6683301B2 (de)
EP (1) EP1364386B1 (de)
AT (1) ATE536630T1 (de)
CA (1) CA2442248C (de)
WO (1) WO2002061798A1 (de)

Families Citing this family (88)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7375319B1 (en) 2000-06-09 2008-05-20 Willoughby Ross C Laser desorption ion source
US6683301B2 (en) * 2001-01-29 2004-01-27 Analytica Of Branford, Inc. Charged particle trapping in near-surface potential wells
CA2448332C (en) 2001-05-25 2009-04-14 Analytica Of Branford, Inc. Multiple detection systems
US7084395B2 (en) * 2001-05-25 2006-08-01 Ionwerks, Inc. Time-of-flight mass spectrometer for monitoring of fast processes
US7586088B2 (en) * 2001-06-21 2009-09-08 Micromass Uk Limited Mass spectrometer and method of mass spectrometry
US6906319B2 (en) * 2002-05-17 2005-06-14 Micromass Uk Limited Mass spectrometer
JP3752470B2 (ja) * 2002-05-30 2006-03-08 株式会社日立ハイテクノロジーズ 質量分析装置
US7095019B1 (en) 2003-05-30 2006-08-22 Chem-Space Associates, Inc. Remote reagent chemical ionization source
US7053565B2 (en) * 2002-07-03 2006-05-30 Kronos Advanced Technologies, Inc. Electrostatic fluid accelerator for and a method of controlling fluid flow
GB0219872D0 (en) * 2002-08-27 2002-10-02 Univ Belfast Charged particle manipulation
AU2003268325A1 (en) * 2002-08-30 2004-03-19 The State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Oregon St Mass spectrometer
JP2004172070A (ja) * 2002-11-22 2004-06-17 Jeol Ltd 垂直加速型飛行時間型質量分析装置
US6878933B1 (en) * 2002-12-10 2005-04-12 University Of Florida Method for coupling laser desorption to ion trap mass spectrometers
US6878930B1 (en) * 2003-02-24 2005-04-12 Ross Clark Willoughby Ion and charged particle source for production of thin films
CA2527701A1 (en) * 2003-06-06 2005-01-06 J. Albert Schultz Gold implantation/deposition of biological samples for laser desorption three dimensional depth profiling of tissues
WO2004112074A2 (en) 2003-06-07 2004-12-23 Willoughby Ross C Laser desorption ion source
US7297960B2 (en) * 2003-11-17 2007-11-20 Micromass Uk Limited Mass spectrometer
US7456388B2 (en) * 2004-05-05 2008-11-25 Mds Inc. Ion guide for mass spectrometer
CA2567466C (en) * 2004-05-21 2012-05-01 Craig M. Whitehouse Rf surfaces and rf ion guides
US7323682B2 (en) * 2004-07-02 2008-01-29 Thermo Finnigan Llc Pulsed ion source for quadrupole mass spectrometer and method
GB0424426D0 (en) 2004-11-04 2004-12-08 Micromass Ltd Mass spectrometer
US7138626B1 (en) 2005-05-05 2006-11-21 Eai Corporation Method and device for non-contact sampling and detection
WO2006130475A2 (en) * 2005-05-27 2006-12-07 Ionwerks, Inc. Multi-beam ion mobility time-of-flight mass spectrometry with multi-channel data recording
GB0511333D0 (en) * 2005-06-03 2005-07-13 Micromass Ltd Mass spectrometer
US7568401B1 (en) 2005-06-20 2009-08-04 Science Applications International Corporation Sample tube holder
JP5340735B2 (ja) * 2005-10-11 2013-11-13 レコ コーポレイション 直交加速を備えた多重反射型飛行時間質量分析計
US7576322B2 (en) * 2005-11-08 2009-08-18 Science Applications International Corporation Non-contact detector system with plasma ion source
US10276358B2 (en) * 2006-01-02 2019-04-30 Excellims Corporation Chemically modified ion mobility separation apparatus and method
EP1971998B1 (de) * 2006-01-11 2019-05-08 DH Technologies Development Pte. Ltd. Fragmentierung von ionen in der massenspektrometrie
US7538320B2 (en) * 2006-06-27 2009-05-26 The Arizona Board Of Regents On Behalf Of The University Of Arizona Ion detection device and method with compressing ion-beam shutter
JP5214607B2 (ja) * 2006-08-25 2013-06-19 サーモ フィニガン リミテッド ライアビリティ カンパニー 質量分析計での解離型のデータ依存式選択
GB0624679D0 (en) * 2006-12-11 2007-01-17 Shimadzu Corp A time-of-flight mass spectrometer and a method of analysing ions in a time-of-flight mass spectrometer
GB0624993D0 (en) * 2006-12-14 2007-01-24 Micromass Ltd Mass spectrometer
US7737376B2 (en) * 2007-05-09 2010-06-15 Alcatel-Lucent Usa Inc. Mechanical switch
US8123396B1 (en) 2007-05-16 2012-02-28 Science Applications International Corporation Method and means for precision mixing
GB2454508B (en) 2007-11-09 2010-04-28 Microsaic Systems Ltd Electrode structures
JP4922900B2 (ja) * 2007-11-13 2012-04-25 日本電子株式会社 垂直加速型飛行時間型質量分析装置
US8334506B2 (en) * 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
US8008617B1 (en) 2007-12-28 2011-08-30 Science Applications International Corporation Ion transfer device
WO2009095952A1 (ja) * 2008-01-30 2009-08-06 Shimadzu Corporation Ms/ms型質量分析装置
JP2011511400A (ja) * 2008-01-31 2011-04-07 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド 線形イオントラップにおけるイオン冷却の方法
JP5323384B2 (ja) * 2008-04-14 2013-10-23 株式会社日立製作所 質量分析計および質量分析方法
US7973277B2 (en) * 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
GB0809950D0 (en) 2008-05-30 2008-07-09 Thermo Fisher Scient Bremen Mass spectrometer
JP5523457B2 (ja) 2008-07-28 2014-06-18 レコ コーポレイション 無線周波数電場内でメッシュを使用してイオン操作を行う方法及び装置
US7772546B2 (en) * 2008-09-23 2010-08-10 Ohio University Portable loeb-eiber mass spectrometer
US8071957B1 (en) 2009-03-10 2011-12-06 Science Applications International Corporation Soft chemical ionization source
US8071942B2 (en) * 2009-03-20 2011-12-06 Physical Electronics USA, Inc. Sample holder apparatus to reduce energy of electrons in an analyzer system and method
US9373474B2 (en) * 2009-03-27 2016-06-21 Osaka University Ion source, and mass spectroscope provided with same
US8847155B2 (en) 2009-08-27 2014-09-30 Virgin Instruments Corporation Tandem time-of-flight mass spectrometry with simultaneous space and velocity focusing
US8461521B2 (en) 2010-12-14 2013-06-11 Virgin Instruments Corporation Linear time-of-flight mass spectrometry with simultaneous space and velocity focusing
US20110049350A1 (en) * 2009-08-27 2011-03-03 Virgin Instruments Corporation Tandem TOF Mass Spectrometer With Pulsed Accelerator To Reduce Velocity Spread
US8674292B2 (en) 2010-12-14 2014-03-18 Virgin Instruments Corporation Reflector time-of-flight mass spectrometry with simultaneous space and velocity focusing
US8399828B2 (en) * 2009-12-31 2013-03-19 Virgin Instruments Corporation Merged ion beam tandem TOF-TOF mass spectrometer
US8063390B2 (en) * 2010-03-03 2011-11-22 Larson Delbert J Electron cooling system and method for increasing the phase space intensity and overall intensity of ion beams in multiple overlap regions
JP2011210698A (ja) * 2010-03-11 2011-10-20 Jeol Ltd タンデム型飛行時間型質量分析装置
US8525106B2 (en) 2011-05-09 2013-09-03 Bruker Daltonics, Inc. Method and apparatus for transmitting ions in a mass spectrometer maintained in a sub-atmospheric pressure regime
WO2013091019A1 (en) * 2011-12-22 2013-06-27 Bruker Biosciences Pty Ltd Improvements in or relating to mass spectrometry
US8933397B1 (en) 2012-02-02 2015-01-13 University of Northern Iowa Research Foundati Ion trap mass analyzer apparatus, methods, and systems utilizing one or more multiple potential ion guide (MPIG) electrodes
WO2014022301A1 (en) 2012-08-03 2014-02-06 Thermo Finnigan Llc Ion carpet for mass spectrometry having progressive electrodes
GB2506362B (en) 2012-09-26 2015-09-23 Thermo Fisher Scient Bremen Improved ion guide
GB201303919D0 (en) * 2013-03-05 2013-04-17 Micromass Ltd Spatially correlated dynamic focusing
WO2014135862A1 (en) * 2013-03-05 2014-09-12 Micromass Uk Limited Spatially correlated dynamic focusing
US8975580B2 (en) * 2013-03-14 2015-03-10 Perkinelmer Health Sciences, Inc. Orthogonal acceleration system for time-of-flight mass spectrometer
US8735810B1 (en) 2013-03-15 2014-05-27 Virgin Instruments Corporation Time-of-flight mass spectrometer with ion source and ion detector electrically connected
CA2907483C (en) * 2013-03-22 2020-07-21 Eth Zurich Laser ablation cell
WO2015026727A1 (en) 2013-08-19 2015-02-26 Virgin Instruments Corporation Ion optical system for maldi-tof mass spectrometer
US9583321B2 (en) 2013-12-23 2017-02-28 Thermo Finnigan Llc Method for mass spectrometer with enhanced sensitivity to product ions
US10114120B2 (en) * 2014-04-16 2018-10-30 The Regents Of The University Of Michigan Unidirectional near-field focusing using near-field plates
WO2015166251A1 (en) * 2014-04-30 2015-11-05 Micromass Uk Limited Mass spectrometer with reduced potential drop
US9627190B2 (en) * 2015-03-27 2017-04-18 Agilent Technologies, Inc. Energy resolved time-of-flight mass spectrometry
US9373490B1 (en) * 2015-06-19 2016-06-21 Shimadzu Corporation Time-of-flight mass spectrometer
WO2018039136A1 (en) * 2016-08-22 2018-03-01 Jo Eung Joon Time versus intensity distribution analysis using a matrix-assisted laser desorption/ionization time-of-flight mass spectrometer
GB2573485B (en) 2017-11-20 2022-01-12 Thermo Fisher Scient Bremen Gmbh Mass spectrometer
GB2570435B (en) * 2017-11-20 2022-03-16 Thermo Fisher Scient Bremen Gmbh Mass spectrometer
JP6881684B2 (ja) * 2018-05-30 2021-06-02 株式会社島津製作所 直交加速飛行時間型質量分析装置及びその引き込み電極
GB201808894D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
GB201808912D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
US11367607B2 (en) 2018-05-31 2022-06-21 Micromass Uk Limited Mass spectrometer
GB201808892D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
GB201808890D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808949D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808932D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
US11373849B2 (en) 2018-05-31 2022-06-28 Micromass Uk Limited Mass spectrometer having fragmentation region
GB201808936D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
CN111912895A (zh) * 2019-05-09 2020-11-10 岛津分析技术研发(上海)有限公司 真空下的质谱成像装置及方法
CN114354057B (zh) * 2022-01-05 2023-03-24 华东师范大学 一种精密测量冷原子真空系统压强的传感装置及方法
GB2623758A (en) 2022-10-24 2024-05-01 Thermo Fisher Scient Bremen Gmbh Apparatus for trapping ions

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5206506A (en) * 1991-02-12 1993-04-27 Kirchner Nicholas J Ion processing: control and analysis
US7019285B2 (en) * 1995-08-10 2006-03-28 Analytica Of Branford, Inc. Ion storage time-of-flight mass spectrometer
AU1932095A (en) * 1994-02-28 1995-09-11 Analytica Of Branford, Inc. Multipole ion guide for mass spectrometry
US5689111A (en) * 1995-08-10 1997-11-18 Analytica Of Branford, Inc. Ion storage time-of-flight mass spectrometer
DE19523859C2 (de) 1995-06-30 2000-04-27 Bruker Daltonik Gmbh Vorrichtung für die Reflektion geladener Teilchen
EP0970504B1 (de) * 1998-01-23 2004-11-17 Micromass UK Limited Flugzeitmassenspektrometer und doppelverstärkungsdetektor dafür
EP1050065A4 (de) * 1998-01-23 2004-03-31 Analytica Of Branford Inc Oberflächen-massenspektrometrie
US6469296B1 (en) * 2000-01-14 2002-10-22 Agilent Technologies, Inc. Ion acceleration apparatus and method
US6683301B2 (en) * 2001-01-29 2004-01-27 Analytica Of Branford, Inc. Charged particle trapping in near-surface potential wells
US6627883B2 (en) * 2001-03-02 2003-09-30 Bruker Daltonics Inc. Apparatus and method for analyzing samples in a dual ion trap mass spectrometer

Also Published As

Publication number Publication date
CA2442248C (en) 2011-01-11
WO2002061798A1 (en) 2002-08-08
US6683301B2 (en) 2004-01-27
CA2442248A1 (en) 2002-08-08
EP1364386A4 (de) 2007-05-02
EP1364386B1 (de) 2011-12-07
US6872941B1 (en) 2005-03-29
EP1364386A1 (de) 2003-11-26
US20020100870A1 (en) 2002-08-01

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