ATE528639T1 - Detektionssystem und detektionsverfahren auf basis von gepulsten energetischen teilchen - Google Patents

Detektionssystem und detektionsverfahren auf basis von gepulsten energetischen teilchen

Info

Publication number
ATE528639T1
ATE528639T1 AT06291226T AT06291226T ATE528639T1 AT E528639 T1 ATE528639 T1 AT E528639T1 AT 06291226 T AT06291226 T AT 06291226T AT 06291226 T AT06291226 T AT 06291226T AT E528639 T1 ATE528639 T1 AT E528639T1
Authority
AT
Austria
Prior art keywords
item
flux
particles
detection
energetic particles
Prior art date
Application number
AT06291226T
Other languages
English (en)
Inventor
Choi Peter
Original Assignee
Sage Innovations Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sage Innovations Inc filed Critical Sage Innovations Inc
Application granted granted Critical
Publication of ATE528639T1 publication Critical patent/ATE528639T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G01N23/204—Measuring back scattering using neutrons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2206—Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/221—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by activation analysis
    • G01N23/222—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by activation analysis using neutron activation analysis [NAA]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of nuclear radiation, e.g. of natural or induced radioactivity
    • G01V5/223—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/074—Investigating materials by wave or particle radiation secondary emission activation analysis
    • G01N2223/0745—Investigating materials by wave or particle radiation secondary emission activation analysis neutron-gamma activation analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/505—Detectors scintillation
    • G01N2223/5055—Detectors scintillation scintillation crystal coupled to PMT
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/639—Specific applications or type of materials material in a container
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/22—Fuels, explosives
AT06291226T 2006-07-28 2006-07-28 Detektionssystem und detektionsverfahren auf basis von gepulsten energetischen teilchen ATE528639T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP06291226A EP1882929B1 (de) 2006-07-28 2006-07-28 Detektionssystem und Detektionsverfahren auf Basis von gepulsten energetischen Teilchen

Publications (1)

Publication Number Publication Date
ATE528639T1 true ATE528639T1 (de) 2011-10-15

Family

ID=37719824

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06291226T ATE528639T1 (de) 2006-07-28 2006-07-28 Detektionssystem und detektionsverfahren auf basis von gepulsten energetischen teilchen

Country Status (16)

Country Link
US (1) US20100065727A1 (de)
EP (1) EP1882929B1 (de)
JP (1) JP5264724B2 (de)
KR (1) KR20090046805A (de)
CN (1) CN101512330B (de)
AT (1) ATE528639T1 (de)
AU (1) AU2007278212A1 (de)
BR (1) BRPI0714983A2 (de)
CA (1) CA2659304A1 (de)
DK (1) DK1882929T3 (de)
ES (1) ES2375295T3 (de)
IL (1) IL196751A0 (de)
PL (1) PL1882929T3 (de)
RU (1) RU2428681C2 (de)
WO (1) WO2008012360A1 (de)
ZA (1) ZA200900624B (de)

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US8357910B2 (en) 2008-11-24 2013-01-22 Boss Physical Sciences Llc Background signal reduction in neutron fluorescence applications using agile neutron beam flux
US8410451B2 (en) 2009-04-09 2013-04-02 Boss Physical Sciences Llc Neutron fluorescence with synchronized gamma detector
US8461534B1 (en) * 2009-04-23 2013-06-11 Purdue Research Foundation Detection of buried explosives
WO2011037945A2 (en) 2009-09-22 2011-03-31 Boss Physical Sciences Llc Organic-scintillator compton gamma ray telescope
JP5445016B2 (ja) 2009-10-15 2014-03-19 株式会社Ｉｈｉ 非破壊検査方法及びその装置
JP5347896B2 (ja) * 2009-10-15 2013-11-20 株式会社Ｉｈｉ 非破壊検査方法及びその装置
JP6002579B2 (ja) * 2009-12-15 2016-10-05 フェニックス ニュークリア ラブズ エルエルシー 貨物専用コンテナの内容物を検査する装置及び貨物専用コンテナ内の物質を識別する方法
DE102010031844A1 (de) * 2010-07-22 2012-01-26 Forschungszentrum Jülich GmbH Verfahren zur zerstörungsfreien Elementanalyse großvolumiger Proben und Vorrichtung zur Durchführung
CN103189739B (zh) * 2010-10-19 2015-12-02 皇家飞利浦电子股份有限公司 微分相位对比成像
FR2970339B1 (fr) * 2011-01-10 2013-02-08 Commissariat Energie Atomique Procede de detection de matiere nucleaire par interrogation neutronique et systeme de detection associe
US9239303B2 (en) * 2011-09-01 2016-01-19 L-3 Communications Security And Detection Systems, Inc. Material discrimination system
CN103092098B (zh) * 2012-12-28 2015-10-14 沈阳东软医疗系统有限公司 一种多通道时序控制的方法和装置
CN104651569B (zh) * 2015-03-02 2016-10-12 江西省科学院应用物理研究所 一种铸铁的表面改性方法
RU2593766C1 (ru) * 2015-06-10 2016-08-10 Общество с ограниченной ответственностью "РатэкЛаб" Способ обнаружения взрывчатого вещества в контролируемом предмете
JP6712418B2 (ja) * 2015-09-09 2020-06-24 国立研究開発法人理化学研究所 非破壊検査装置と方法
US10672527B2 (en) * 2017-01-27 2020-06-02 Westinghouse Electric Company Llc In-core transmitter device structured to wirelessly emit signals corresponding to detected neutron flux
BR112019025088B1 (pt) 2017-05-31 2023-12-19 Aachen Institute For Nuclear Training Gmbh Método e dispositivo para a análise de elementos múltiplos com base na ativação de nêutrons e uso
DE102017111935B4 (de) 2017-05-31 2019-03-14 Aachen Institute for Nuclear Training GmbH (AINT) Verfahren und Vorrichtung zur Multielementanalyse basierend auf Neutronenaktivierung sowie Computerprogrammprodukt dafür
SI3410104T1 (sl) 2017-05-31 2020-12-31 Aachen Institute fur Nuclear Training GmbH Postopek in naprave za večelementno analizo na osnovi aktivacije nevtronov in uporaba
CN109959962B (zh) * 2017-12-14 2022-07-26 中国核动力研究设计院 基于脉冲型中子探测器信号特性的核信号发生器
CN109856666B (zh) * 2018-12-07 2020-06-26 中国科学院高能物理研究所 用于高能粒子束流实验的样机系统
US11061164B1 (en) * 2019-06-06 2021-07-13 National Technology & Engineering Solutions Of Sandia, Llc System, algorithm, and method using short pulse interrogation with neutrons to detect and identify matter
CN110160948B (zh) * 2019-06-12 2021-06-22 中国核动力研究设计院 聚变堆第一壁结构材料温度及中子场辐照环境模拟器
CN110333547B (zh) * 2019-07-24 2020-10-23 中国工程物理研究院核物理与化学研究所 一种用于塑性地雷探测的中子背散射成像装置
CN110552680B (zh) * 2019-08-21 2022-11-04 中国石油天然气集团有限公司 一种利用中子输运时间测量地层参数空间分布的方法
CN110764157B (zh) * 2019-11-11 2021-06-29 中国原子能科学研究院 可疑物检测方法
CN110837129B (zh) * 2019-11-11 2021-03-09 中国原子能科学研究院 可疑物检测方法
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Also Published As

Publication number Publication date
JP2009544958A (ja) 2009-12-17
ES2375295T3 (es) 2012-02-28
CN101512330B (zh) 2012-10-17
AU2007278212A1 (en) 2008-01-31
KR20090046805A (ko) 2009-05-11
ZA200900624B (en) 2010-03-31
US20100065727A1 (en) 2010-03-18
BRPI0714983A2 (pt) 2013-07-23
CA2659304A1 (en) 2008-01-31
RU2009107212A (ru) 2010-09-10
EP1882929B1 (de) 2011-10-12
DK1882929T3 (da) 2012-01-23
RU2428681C2 (ru) 2011-09-10
EP1882929A1 (de) 2008-01-30
WO2008012360A1 (en) 2008-01-31
IL196751A0 (en) 2009-11-18
JP5264724B2 (ja) 2013-08-14
PL1882929T3 (pl) 2012-04-30
CN101512330A (zh) 2009-08-19

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