ATE521898T1 - Ein digitales system und verfahren zum testen von analogen und digital/analog-schaltungen oder systemen - Google Patents
Ein digitales system und verfahren zum testen von analogen und digital/analog-schaltungen oder systemenInfo
- Publication number
- ATE521898T1 ATE521898T1 AT03760088T AT03760088T ATE521898T1 AT E521898 T1 ATE521898 T1 AT E521898T1 AT 03760088 T AT03760088 T AT 03760088T AT 03760088 T AT03760088 T AT 03760088T AT E521898 T1 ATE521898 T1 AT E521898T1
- Authority
- AT
- Austria
- Prior art keywords
- digital
- analog
- input signal
- testing
- merit
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/3167—Testing of combined analog and digital circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318371—Methodologies therefor, e.g. algorithms, procedures
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Mobile Radio Communication Systems (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB0213882.4A GB0213882D0 (en) | 2002-06-17 | 2002-06-17 | A digital system & method for testing analogue & mixed-signal circuits or systems |
PCT/GB2003/002599 WO2003107019A2 (en) | 2002-06-17 | 2003-06-17 | A digital system and method for testing analogue and mixed-signal circuits or systems |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE521898T1 true ATE521898T1 (de) | 2011-09-15 |
Family
ID=9938726
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT03760088T ATE521898T1 (de) | 2002-06-17 | 2003-06-17 | Ein digitales system und verfahren zum testen von analogen und digital/analog-schaltungen oder systemen |
Country Status (7)
Country | Link |
---|---|
US (1) | US7174491B2 (de) |
EP (1) | EP1514125B1 (de) |
JP (1) | JP2005530161A (de) |
AT (1) | ATE521898T1 (de) |
AU (1) | AU2003250369A1 (de) |
GB (1) | GB0213882D0 (de) |
WO (1) | WO2003107019A2 (de) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE60224378T2 (de) * | 2002-07-19 | 2009-01-02 | Qimonda Ag | Verfahren zur Erzeugung eines Testmusters für die Simulation und/oder Prüfung des Layouts einer integrierten Schaltung |
US7823128B2 (en) * | 2004-04-19 | 2010-10-26 | Verigy (Singapore) Pte. Ltd. | Apparatus, system and/or method for combining multiple tests to a single test in a multiple independent port test environment |
US20050278160A1 (en) * | 2004-06-14 | 2005-12-15 | Donnelly James M | Reduction of settling time in dynamic simulations |
US7729098B2 (en) | 2006-03-24 | 2010-06-01 | Ics Triplex Technology Limited | Overload protection method |
US7476891B2 (en) | 2006-03-24 | 2009-01-13 | Ics Triplex Technology, Ltd. | Fault detection method and apparatus |
US8166362B2 (en) | 2006-03-24 | 2012-04-24 | Rockwell Automation Limited | Fault detection method and apparatus for analog to digital converter circuits |
US7504975B2 (en) | 2006-03-24 | 2009-03-17 | Ics Triplex Technology Limited | Method and apparatus for output current control |
US7613974B2 (en) | 2006-03-24 | 2009-11-03 | Ics Triplex Technology Limited | Fault detection method and apparatus |
US7688560B2 (en) | 2006-03-24 | 2010-03-30 | Ics Triplex Technology Limited | Overload protection method |
US7747405B2 (en) | 2006-03-24 | 2010-06-29 | Ics Triplex Technology Ltd. | Line frequency synchronization |
ATE499747T1 (de) * | 2006-03-24 | 2011-03-15 | Ics Triplex Technology Ltd | Überlastungsschutz für ein digitales ausgangsmodul |
US9459316B2 (en) | 2011-09-06 | 2016-10-04 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and apparatus for testing a semiconductor device |
CN103064009B (zh) * | 2012-12-28 | 2015-03-11 | 辽宁大学 | 基于小波分析和有限高斯混合模型em方法的模拟电路故障诊断方法 |
FI126901B (en) * | 2014-09-12 | 2017-07-31 | Enics Ag | Procedure and system for testing an electronic device |
CN105223495A (zh) * | 2015-10-20 | 2016-01-06 | 国家电网公司 | 一种基于专家系统的模数混合电路故障诊断的测试方法 |
ES2893250T3 (es) | 2016-12-22 | 2022-02-08 | Vestas Wind Sys As | Detección de fallos eléctricos en un sistema de control de generador de aerogenerador |
CN112444737B (zh) * | 2020-09-21 | 2021-10-22 | 电子科技大学 | 模拟电路故障参数范围确定方法 |
CN112684282B (zh) * | 2020-11-12 | 2022-07-19 | 国网河北省电力有限公司电力科学研究院 | 配电网单相接地故障识别方法、装置及终端设备 |
CN113051862B (zh) * | 2021-04-19 | 2022-07-26 | 电子科技大学 | 基于遗传算法的数模混合电路测试向量集优选方法 |
CN115085194B (zh) * | 2022-07-20 | 2022-12-23 | 南方电网科学研究院有限责任公司 | 一种电力系统稳控策略生成方法、系统、装置及存储介质 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5694356A (en) | 1994-11-02 | 1997-12-02 | Invoice Technology, Inc. | High resolution analog storage EPROM and flash EPROM |
US5646521A (en) | 1995-08-01 | 1997-07-08 | Schlumberger Technologies, Inc. | Analog channel for mixed-signal-VLSI tester |
US5745409A (en) * | 1995-09-28 | 1998-04-28 | Invox Technology | Non-volatile memory with analog and digital interface and storage |
US5793778A (en) * | 1997-04-11 | 1998-08-11 | National Semiconductor Corporation | Method and apparatus for testing analog and digital circuitry within a larger circuit |
CA2206738A1 (en) | 1997-06-02 | 1998-12-02 | Naim Ben Hamida | Fault modeling and simulation for mixed-signal circuits and systems |
US6467058B1 (en) * | 1999-01-20 | 2002-10-15 | Nec Usa, Inc. | Segmented compaction with pruning and critical fault elimination |
US20020188904A1 (en) * | 2001-06-11 | 2002-12-12 | International Business Machines Corporation | Efficiency of fault simulation by logic backtracking |
US6898746B2 (en) * | 2001-06-19 | 2005-05-24 | Intel Corporation | Method of and apparatus for testing a serial differential/mixed signal device |
-
2002
- 2002-06-17 GB GBGB0213882.4A patent/GB0213882D0/en not_active Ceased
-
2003
- 2003-06-17 AU AU2003250369A patent/AU2003250369A1/en not_active Abandoned
- 2003-06-17 US US10/518,743 patent/US7174491B2/en not_active Expired - Lifetime
- 2003-06-17 JP JP2004513786A patent/JP2005530161A/ja active Pending
- 2003-06-17 EP EP03760088A patent/EP1514125B1/de not_active Expired - Lifetime
- 2003-06-17 WO PCT/GB2003/002599 patent/WO2003107019A2/en active Application Filing
- 2003-06-17 AT AT03760088T patent/ATE521898T1/de not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
WO2003107019A3 (en) | 2004-07-01 |
EP1514125B1 (de) | 2011-08-24 |
EP1514125A2 (de) | 2005-03-16 |
US7174491B2 (en) | 2007-02-06 |
WO2003107019A2 (en) | 2003-12-24 |
AU2003250369A1 (en) | 2003-12-31 |
US20060242498A1 (en) | 2006-10-26 |
JP2005530161A (ja) | 2005-10-06 |
GB0213882D0 (en) | 2002-07-31 |
AU2003250369A8 (en) | 2003-12-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |