ATE520050T1 - Aberrationskorrektur für die spektroskopische analyse - Google Patents

Aberrationskorrektur für die spektroskopische analyse

Info

Publication number
ATE520050T1
ATE520050T1 AT05746577T AT05746577T ATE520050T1 AT E520050 T1 ATE520050 T1 AT E520050T1 AT 05746577 T AT05746577 T AT 05746577T AT 05746577 T AT05746577 T AT 05746577T AT E520050 T1 ATE520050 T1 AT E520050T1
Authority
AT
Austria
Prior art keywords
interest
volume
objective lens
aberrations
spectroscopic
Prior art date
Application number
AT05746577T
Other languages
English (en)
Inventor
Beek Michael Cornelis Van
Wouter Harry Jacinth Rensen
Gerald Lucassen
Der Voort Marjolein Van
Bernardus Leonardus Gerardus Bakker
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Application granted granted Critical
Publication of ATE520050T1 publication Critical patent/ATE520050T1/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0025—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Microscoopes, Condenser (AREA)
AT05746577T 2004-06-21 2005-06-13 Aberrationskorrektur für die spektroskopische analyse ATE520050T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP04102841 2004-06-21
PCT/IB2005/051944 WO2006000939A1 (en) 2004-06-21 2005-06-13 Aberration correction for spectroscopic analysis

Publications (1)

Publication Number Publication Date
ATE520050T1 true ATE520050T1 (de) 2011-08-15

Family

ID=34970667

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05746577T ATE520050T1 (de) 2004-06-21 2005-06-13 Aberrationskorrektur für die spektroskopische analyse

Country Status (6)

Country Link
US (1) US7511812B2 (de)
EP (1) EP1761815B1 (de)
JP (1) JP4855394B2 (de)
CN (1) CN100437195C (de)
AT (1) ATE520050T1 (de)
WO (1) WO2006000939A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008081729A1 (ja) * 2006-12-22 2008-07-10 Nikon Corporation レーザ走査共焦点顕微鏡
JP5541907B2 (ja) 2009-11-25 2014-07-09 オリンパス株式会社 レーザ走査型顕微鏡
CN102928346B (zh) * 2012-10-18 2014-08-27 中国科学院深圳先进技术研究院 双模成像系统
CN103837093B (zh) * 2012-11-20 2017-09-12 鸿富锦精密工业（深圳）有限公司 光谱共焦传感器校准系统及方法
WO2015047555A1 (en) * 2013-09-28 2015-04-02 Elias Athanasopoulos Methods, systems, and media for authenticating users using multiple services
US10401327B2 (en) 2014-12-08 2019-09-03 University Of Virginia Patent Foundation Systems and methods for multispectral photoacoustic microscopy
JP2018509622A (ja) * 2015-03-13 2018-04-05 カリフォルニア インスティチュート オブ テクノロジー フーリエタイコグラフィ手法を用いるインコヒーレント撮像システムにおける収差補正
CN109740464B (zh) * 2018-12-21 2021-01-26 北京智行者科技有限公司 目标的识别跟随方法
CN113029032B (zh) * 2021-03-26 2022-04-01 中南大学 基于光谱共焦的高精度面形测量方法及装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62192716A (ja) * 1986-02-20 1987-08-24 Minolta Camera Co Ltd 焦点検出装置
US5452085A (en) * 1993-01-27 1995-09-19 Acton Research Corporation Spectrographic astigmatism correction system
US5847400A (en) * 1996-02-01 1998-12-08 Molecular Dynamics, Inc. Fluorescence imaging system having reduced background fluorescence
JP3797704B2 (ja) * 1996-04-05 2006-07-19 株式会社ミツトヨ 光学式測定装置
DE19951482C2 (de) * 1999-10-26 2003-01-09 Zeiss Carl Jena Gmbh Fluoreszenzmikroskop
US6609015B2 (en) 2001-01-18 2003-08-19 Koninklijke Philips Electronics N.V. Analysis of a composition
WO2003098615A1 (en) * 2001-08-24 2003-11-27 Sharp Kabushiki Kaisha Optical pickup device
US7065236B2 (en) * 2001-09-19 2006-06-20 Tripath Imaging, Inc. Method for quantitative video-microscopy and associated system and computer software program product
DE10228477A1 (de) * 2002-06-26 2004-01-15 Leica Microsystems Heidelberg Gmbh Verfahren und Vorrichtung zum Kalibrieren eines Spektraldetektors
JP4086182B2 (ja) * 2002-10-09 2008-05-14 オリンパス株式会社 分光器およびこれを用いた共焦点光学系、走査型光学顕微鏡
AU2003290736A1 (en) * 2002-11-26 2004-06-18 Cornell Research Foundation, Inc. Miniaturized holographic fourier transform spectrometer with digital aberration correction
JP4311040B2 (ja) * 2003-03-05 2009-08-12 セイコーエプソン株式会社 色収差補正装置および色収差補正方法、並びに色収差補正プログラム
US20070049830A1 (en) 2003-03-18 2007-03-01 Hendriks Robert F M Analysis of a composition with monitoring
JP2007501646A (ja) 2003-08-08 2007-02-01 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ オブジェクトの表面より下にあるターゲット地域に暗視野撮像するためのシステム

Also Published As

Publication number Publication date
CN100437195C (zh) 2008-11-26
JP4855394B2 (ja) 2012-01-18
US7511812B2 (en) 2009-03-31
US20080002199A1 (en) 2008-01-03
WO2006000939A1 (en) 2006-01-05
EP1761815A1 (de) 2007-03-14
EP1761815B1 (de) 2011-08-10
CN1973233A (zh) 2007-05-30
JP2008503765A (ja) 2008-02-07

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