ATE511694T1 - Verfahren zur erkennung resistiver brückendefekte in dem globalen datenbus von halbleiterspeichern - Google Patents
Verfahren zur erkennung resistiver brückendefekte in dem globalen datenbus von halbleiterspeichernInfo
- Publication number
- ATE511694T1 ATE511694T1 AT05708915T AT05708915T ATE511694T1 AT E511694 T1 ATE511694 T1 AT E511694T1 AT 05708915 T AT05708915 T AT 05708915T AT 05708915 T AT05708915 T AT 05708915T AT E511694 T1 ATE511694 T1 AT E511694T1
- Authority
- AT
- Austria
- Prior art keywords
- bridge defects
- memory
- data bus
- semiconductor memory
- resistive bridge
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/025—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in signal lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Tests Of Electronic Circuits (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Static Random-Access Memory (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US55052104P | 2004-03-05 | 2004-03-05 | |
US59284404P | 2004-07-30 | 2004-07-30 | |
PCT/IB2005/050778 WO2005088643A1 (en) | 2004-03-05 | 2005-03-03 | Method for detecting resistive bridge defects in the global data bus of semiconductor memories |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE511694T1 true ATE511694T1 (de) | 2011-06-15 |
Family
ID=34960645
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT05708915T ATE511694T1 (de) | 2004-03-05 | 2005-03-03 | Verfahren zur erkennung resistiver brückendefekte in dem globalen datenbus von halbleiterspeichern |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP1728254B1 (de) |
JP (1) | JP2007527090A (de) |
KR (1) | KR20060133602A (de) |
CN (1) | CN1930636B (de) |
AT (1) | ATE511694T1 (de) |
WO (1) | WO2005088643A1 (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106824833B (zh) * | 2017-02-28 | 2023-07-18 | 中国振华集团云科电子有限公司 | 电阻器筛选工艺方法 |
CN112417191B (zh) * | 2019-08-20 | 2023-09-26 | 华润微电子(重庆)有限公司 | 缺陷扫描结果处理方法、装置、系统和存储介质 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2242548B (en) * | 1990-03-28 | 1994-01-12 | Sony Corp | Testing random access memories |
US5959911A (en) * | 1997-09-29 | 1999-09-28 | Siemens Aktiengesellschaft | Apparatus and method for implementing a bank interlock scheme and related test mode for multibank memory devices |
-
2005
- 2005-03-03 AT AT05708915T patent/ATE511694T1/de not_active IP Right Cessation
- 2005-03-03 KR KR1020067017912A patent/KR20060133602A/ko not_active Application Discontinuation
- 2005-03-03 WO PCT/IB2005/050778 patent/WO2005088643A1/en not_active Application Discontinuation
- 2005-03-03 JP JP2007501435A patent/JP2007527090A/ja not_active Withdrawn
- 2005-03-03 EP EP05708915A patent/EP1728254B1/de not_active Not-in-force
- 2005-03-03 CN CN2005800070234A patent/CN1930636B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2007527090A (ja) | 2007-09-20 |
CN1930636A (zh) | 2007-03-14 |
KR20060133602A (ko) | 2006-12-26 |
CN1930636B (zh) | 2012-05-23 |
EP1728254A1 (de) | 2006-12-06 |
EP1728254B1 (de) | 2011-06-01 |
WO2005088643A1 (en) | 2005-09-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |