ATE502333T1 - Verlässlichkeits-, zuverlässigkeits- und dienstbarkeitslösungen für die speichertechnologie - Google Patents

Verlässlichkeits-, zuverlässigkeits- und dienstbarkeitslösungen für die speichertechnologie

Info

Publication number
ATE502333T1
ATE502333T1 AT08169196T AT08169196T ATE502333T1 AT E502333 T1 ATE502333 T1 AT E502333T1 AT 08169196 T AT08169196 T AT 08169196T AT 08169196 T AT08169196 T AT 08169196T AT E502333 T1 ATE502333 T1 AT E502333T1
Authority
AT
Austria
Prior art keywords
reliability
serviceability
solutions
storage technology
configuration
Prior art date
Application number
AT08169196T
Other languages
English (en)
Inventor
Kuljit S Bains
Joseph H Salmon
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Application granted granted Critical
Publication of ATE502333T1 publication Critical patent/ATE502333T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1004—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's to protect a block of data words, e.g. CRC or checksum
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00—Accessing, addressing or allocating within memory systems or architectures
AT08169196T 2007-11-19 2008-11-14 Verlässlichkeits-, zuverlässigkeits- und dienstbarkeitslösungen für die speichertechnologie ATE502333T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/942,621 US8132074B2 (en) 2007-11-19 2007-11-19 Reliability, availability, and serviceability solutions for memory technology

Publications (1)

Publication Number Publication Date
ATE502333T1 true ATE502333T1 (de) 2011-04-15

Family

ID=40409870

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08169196T ATE502333T1 (de) 2007-11-19 2008-11-14 Verlässlichkeits-, zuverlässigkeits- und dienstbarkeitslösungen für die speichertechnologie

Country Status (6)

Country Link
US (2) US8132074B2 (de)
EP (1) EP2068245B1 (de)
KR (1) KR101031436B1 (de)
CN (1) CN101441896B (de)
AT (1) ATE502333T1 (de)
DE (1) DE602008005541D1 (de)

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WO2008076700A2 (en) 2006-12-13 2008-06-26 Rambus Inc. Interface with variable data rate
KR100951567B1 (ko) * 2008-02-29 2010-04-09 주식회사 하이닉스반도체 데이터 전달의 신뢰성을 보장하기 위한 반도체 메모리 장치
KR100929835B1 (ko) * 2008-02-29 2009-12-07 주식회사 하이닉스반도체 안정적인 초기 동작을 수행하는 반도체 메모리 장치
KR20110100465A (ko) 2010-03-04 2011-09-14 삼성전자주식회사 메모리 시스템
US8639964B2 (en) * 2010-03-17 2014-01-28 Dell Products L.P. Systems and methods for improving reliability and availability of an information handling system
US8738993B2 (en) 2010-12-06 2014-05-27 Intel Corporation Memory device on the fly CRC mode
CN102571478B (zh) * 2010-12-31 2016-05-25 上海宽惠网络科技有限公司 服务器
US8527836B2 (en) * 2011-07-01 2013-09-03 Intel Corporation Rank-specific cyclic redundancy check
US8468423B2 (en) 2011-09-01 2013-06-18 International Business Machines Corporation Data verification using checksum sidefile
US9619316B2 (en) * 2012-03-26 2017-04-11 Intel Corporation Timing optimization for memory devices employing error detection coded transactions
KR101984902B1 (ko) 2012-09-14 2019-05-31 삼성전자 주식회사 단방향의 리턴 클락 신호를 사용하는 임베디드 멀티미디어 카드, 이를 제어하는 호스트, 및 이들을 포함하는 임베디드 멀티미디어 카드 시스템의 동작 방법
US9299400B2 (en) 2012-09-28 2016-03-29 Intel Corporation Distributed row hammer tracking
US9881656B2 (en) 2014-01-09 2018-01-30 Qualcomm Incorporated Dynamic random access memory (DRAM) backchannel communication systems and methods
US11061431B2 (en) * 2018-06-28 2021-07-13 Micron Technology, Inc. Data strobe multiplexer
US10546620B2 (en) * 2018-06-28 2020-01-28 Micron Technology, Inc. Data strobe calibration
US11372717B2 (en) * 2019-08-30 2022-06-28 Qualcomm Incorporated Memory with system ECC

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6519733B1 (en) * 2000-02-23 2003-02-11 International Business Machines Corporation Method and apparatus for high integrity hardware memory compression
US6901551B1 (en) 2001-12-17 2005-05-31 Lsi Logic Corporation Method and apparatus for protection of data utilizing CRC
US20060077750A1 (en) * 2004-10-07 2006-04-13 Dell Products L.P. System and method for error detection in a redundant memory system
US7734980B2 (en) * 2005-06-24 2010-06-08 Intel Corporation Mitigating silent data corruption in a buffered memory module architecture
US7380197B1 (en) * 2005-07-12 2008-05-27 Xilinx, Inc. Circuit and method for error detection
US7587643B1 (en) * 2005-08-25 2009-09-08 T-Ram Semiconductor, Inc. System and method of integrated circuit testing
KR100681429B1 (ko) * 2005-10-24 2007-02-15 삼성전자주식회사 반도체 메모리 장치 및 그것의 비트 에러 검출 방법
US7734985B2 (en) 2006-02-27 2010-06-08 Intel Corporation Systems, methods, and apparatuses for using the same memory type to support an error check mode and a non-error check mode
US7844888B2 (en) * 2006-09-29 2010-11-30 Qimonda Ag Electronic device, method for operating an electronic device, memory circuit and method of operating a memory circuit
US7861140B2 (en) * 2006-10-31 2010-12-28 Globalfoundries Inc. Memory system including asymmetric high-speed differential memory interconnect
KR101308047B1 (ko) * 2007-02-08 2013-09-12 삼성전자주식회사 메모리 시스템, 이 시스템을 위한 메모리, 및 이 메모리를위한 명령 디코딩 방법

Also Published As

Publication number Publication date
US20120131414A1 (en) 2012-05-24
US8132074B2 (en) 2012-03-06
EP2068245A3 (de) 2009-07-22
CN101441896B (zh) 2013-05-29
KR20090051715A (ko) 2009-05-22
US8392796B2 (en) 2013-03-05
EP2068245B1 (de) 2011-03-16
KR101031436B1 (ko) 2011-04-26
CN101441896A (zh) 2009-05-27
US20090132888A1 (en) 2009-05-21
DE602008005541D1 (de) 2011-04-28
EP2068245A2 (de) 2009-06-10

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