ATE495476T1 - Laserabtastvorrichtung und laserabtast-mikroskop - Google Patents

Laserabtastvorrichtung und laserabtast-mikroskop

Info

Publication number
ATE495476T1
ATE495476T1 AT07790182T AT07790182T ATE495476T1 AT E495476 T1 ATE495476 T1 AT E495476T1 AT 07790182 T AT07790182 T AT 07790182T AT 07790182 T AT07790182 T AT 07790182T AT E495476 T1 ATE495476 T1 AT E495476T1
Authority
AT
Austria
Prior art keywords
laser scanning
deflecting unit
light
light deflecting
laser
Prior art date
Application number
AT07790182T
Other languages
German (de)
English (en)
Inventor
Atsushi Tsurumune
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=38956646&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE495476(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Nikon Corp filed Critical Nikon Corp
Application granted granted Critical
Publication of ATE495476T1 publication Critical patent/ATE495476T1/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G02B26/101—Scanning systems with both horizontal and vertical deflecting means, e.g. raster or XY scanners
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G02B26/105—Scanning systems with one or more pivoting mirrors or galvano-mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0025—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
    • G02B27/0031—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration for scanning purposes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
  • Laser Beam Processing (AREA)
AT07790182T 2006-07-18 2007-06-20 Laserabtastvorrichtung und laserabtast-mikroskop ATE495476T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006195241 2006-07-18
PCT/JP2007/000656 WO2008010311A1 (en) 2006-07-18 2007-06-20 Laser scanning apparatus and laser scanning microscope

Publications (1)

Publication Number Publication Date
ATE495476T1 true ATE495476T1 (de) 2011-01-15

Family

ID=38956646

Family Applications (1)

Application Number Title Priority Date Filing Date
AT07790182T ATE495476T1 (de) 2006-07-18 2007-06-20 Laserabtastvorrichtung und laserabtast-mikroskop

Country Status (6)

Country Link
US (1) US8159744B2 (enExample)
EP (1) EP2045640B1 (enExample)
JP (1) JPWO2008010311A1 (enExample)
AT (1) ATE495476T1 (enExample)
DE (1) DE602007011940D1 (enExample)
WO (1) WO2008010311A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
HU0800688D0 (en) * 2008-11-17 2009-01-28 Femtonics Kft Multiple free line-scan mode of scanning
JP5581707B2 (ja) * 2010-01-28 2014-09-03 株式会社ニコン 制御方法
JP5806450B2 (ja) * 2010-07-02 2015-11-10 オリンパス株式会社 細胞観察方法
JP6157155B2 (ja) * 2012-03-15 2017-07-05 オリンパス株式会社 顕微鏡システム、駆動方法およびプログラム
JP2015125177A (ja) * 2013-12-25 2015-07-06 ソニー株式会社 顕微鏡システムおよびその画像データ転送方法
JP6171970B2 (ja) 2014-02-10 2017-08-02 ソニー株式会社 レーザ走査型顕微鏡装置および制御方法
JP6161678B2 (ja) * 2015-11-20 2017-07-12 株式会社キーエンス 共焦点顕微鏡システム
US10514394B2 (en) * 2016-02-26 2019-12-24 Tektronix, Inc. Dynamic output clamping for a probe or accessory
US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6161123A (ja) * 1984-08-31 1986-03-28 Fuji Photo Film Co Ltd ガルバノメ−タミラ−駆動装置
US5187364A (en) * 1989-03-22 1993-02-16 National Research Council Of Canada/Conseil National De Recherches Du Canada Scanning device with waveform generator optimizer
US5084612A (en) * 1989-10-20 1992-01-28 Fuji Photo Film Co., Ltd. Imaging method for scanning microscopes, and confocal scanning microscope
DE19702752C2 (de) * 1997-01-27 2001-12-13 Zeiss Carl Jena Gmbh Ansteuersystem für einen Scannerantrieb
JP4555905B2 (ja) * 1998-01-27 2010-10-06 カール ツアイス マイクロイメージング ゲゼルシャフト ミット ベシュレンクテル ハフツング スキャナ駆動部のための方向制御システム
US6639180B1 (en) * 1999-07-05 2003-10-28 Siemens Aktiengesellschaft Method for describing a predetermined desired course with a beam consisting of particles or waves and use of this method
US6687035B2 (en) * 2001-06-07 2004-02-03 Leica Microsystems Heildelberg Gmbh Method and apparatus for ROI-scan with high temporal resolution
US7355702B2 (en) 2004-06-21 2008-04-08 Olympus Corporation Confocal observation system
JP4700299B2 (ja) * 2004-07-07 2011-06-15 オリンパス株式会社 共焦点走査型顕微鏡
DE102004034956A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Verfahren zur Erfassung mindestens eines Probenbereiches mit einem Lichtrastermikroskop mit linienförmiger Abtastung
EP1669789B1 (en) * 2004-12-13 2011-07-06 Olympus Corporation Laser scanning microscope apparatus

Also Published As

Publication number Publication date
EP2045640B1 (en) 2011-01-12
US20090168157A1 (en) 2009-07-02
JPWO2008010311A1 (ja) 2009-12-17
EP2045640A4 (en) 2009-11-11
EP2045640A1 (en) 2009-04-08
WO2008010311A1 (en) 2008-01-24
DE602007011940D1 (enExample) 2011-02-24
US8159744B2 (en) 2012-04-17

Similar Documents

Publication Publication Date Title
ATE495476T1 (de) Laserabtastvorrichtung und laserabtast-mikroskop
EP1862838A3 (en) Laser scanning microscope and microscopic observing method
ATE470883T1 (de) Optische abtastvorrichtung und bildanzeigegerät
WO2007101184A3 (en) Endoscope tips, scanned beam endoscopes using same, and methods of use
ATE484395T1 (de) Bildverarbeitungsverfahren und bildprozessor
WO2011008386A3 (en) Correcting scanned projector distortion by varying the scan amplitude
ATE453173T1 (de) Farbbasierte inspektion von gedruckten leiterplatten
ATE444050T1 (de) Ophthalmologische vorrichtung
DE60204343D1 (de) Elektrooptische baugruppe zur bildprojektion, insbesondere in tragbaren instrumenten
WO2007024621A3 (en) Apparatus and methods for combining camera and projector functions in a single device
EP1792739A3 (en) Image forming apparatus having enhanced fixing configuration for optical scanning unit
DE602007008502D1 (de) Vorrichtung zum Fotografieren von Strahlungsbildern
WO2006078877A3 (en) Laser projector for audience scanning
PL2159535T3 (pl) Urządzenie do optycznej tomografii koherentnej i obrazowania nieinterferometrycznego
ATE425696T1 (de) Integrierter optischer miniaturisierter abtastkopf zur erzeugung eines homogenen konfokalen bilds und diesen verwendendes konfokales abbildungssystem
US20140231397A1 (en) Hand-guided marking system
DK1467235T3 (da) Hurtigt konfokalt multilinie laserskanningsmikroskop
WO2008108174A1 (ja) 照明装置並びにそれを用いた欠陥検査装置及びその方法並びに高さ計測装置及びその方法
KR102136671B1 (ko) 기판의 결함 검출 방법 및 이를 수행하기 위한 장치
DE602006012423D1 (de) Mikroskopvorrichtung
BRPI0815581A2 (pt) Dispositivo e processo para grafar uma imagem de estrutura reversível
WO2008010120A3 (en) Employing beam scanning for optical detection
EP1705509A3 (en) Scanning examination apparatus, lens unit, and objective-lens adaptor
ATE441131T1 (de) Optische abtastvorrichtung und bilderzeugungsvorrichtung damit
JP2005257509A (ja) 多光子励起型測定装置

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties