ATE490450T1 - Verbessertes interferometer - Google Patents

Verbessertes interferometer

Info

Publication number
ATE490450T1
ATE490450T1 AT08775968T AT08775968T ATE490450T1 AT E490450 T1 ATE490450 T1 AT E490450T1 AT 08775968 T AT08775968 T AT 08775968T AT 08775968 T AT08775968 T AT 08775968T AT E490450 T1 ATE490450 T1 AT E490450T1
Authority
AT
Austria
Prior art keywords
light beam
reflector
mirror
path
formula
Prior art date
Application number
AT08775968T
Other languages
English (en)
Inventor
Clive Speake
Stuart Aston
Arellano Fabian Pena
Timothy Copland
Original Assignee
Univ Birmingham
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Birmingham filed Critical Univ Birmingham
Application granted granted Critical
Publication of ATE490450T1 publication Critical patent/ATE490450T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
    • G01B9/02018—Multipass interferometers, e.g. double-pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02056—Passive reduction of errors
    • G01B9/02061—Reduction or prevention of effects of tilts or misalignment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/15—Cat eye, i.e. reflection always parallel to incoming beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
AT08775968T 2007-07-18 2008-07-17 Verbessertes interferometer ATE490450T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0713982.7A GB0713982D0 (en) 2007-07-18 2007-07-18 Improved interferometer
PCT/GB2008/002437 WO2009010750A1 (en) 2007-07-18 2008-07-17 Improved interferometer

Publications (1)

Publication Number Publication Date
ATE490450T1 true ATE490450T1 (de) 2010-12-15

Family

ID=38476533

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08775968T ATE490450T1 (de) 2007-07-18 2008-07-17 Verbessertes interferometer

Country Status (7)

Country Link
US (1) US8253943B2 (de)
EP (1) EP2167908B1 (de)
JP (1) JP2011501108A (de)
AT (1) ATE490450T1 (de)
DE (1) DE602008003821D1 (de)
GB (1) GB0713982D0 (de)
WO (1) WO2009010750A1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0920520D0 (en) 2009-11-23 2010-01-06 Univ Birmingham Innovative laser interferometric angular read-out device
JP6461445B1 (ja) 2017-07-06 2019-01-30 浜松ホトニクス株式会社 光学デバイス
CN109211826A (zh) * 2018-10-18 2019-01-15 安徽达致环保科技有限公司 一种分光装置和跨波段机动车排放遥测仪
CN112857207B (zh) * 2021-03-09 2022-12-16 哈尔滨工业大学 基于阵列式探测器的单光束三自由度零差激光干涉仪

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3832063A (en) * 1972-02-01 1974-08-27 Canon Kk Lens axis detection using an interferometer
US4534649A (en) * 1981-10-30 1985-08-13 Downs Michael J Surface profile interferometer
JP3003964B2 (ja) * 1991-09-20 2000-01-31 オリンパス光学工業株式会社 測長用干渉計
JP4198929B2 (ja) * 2002-03-27 2008-12-17 パイオニア株式会社 レーザ測長器及びレーザ測長方法
JP4514209B2 (ja) * 2004-10-15 2010-07-28 キヤノン株式会社 位置検出装置及び方法
JP2006349534A (ja) * 2005-06-16 2006-12-28 Fujinon Corp 動体測定用干渉計装置および動体測定用光干渉計測方法
US7532330B2 (en) * 2005-08-16 2009-05-12 Zygo Corporation Angle interferometers

Also Published As

Publication number Publication date
US20100238456A1 (en) 2010-09-23
JP2011501108A (ja) 2011-01-06
EP2167908B1 (de) 2010-12-01
US8253943B2 (en) 2012-08-28
EP2167908A1 (de) 2010-03-31
GB0713982D0 (en) 2007-08-29
WO2009010750A1 (en) 2009-01-22
DE602008003821D1 (de) 2011-01-13

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Legal Events

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