ATE396499T1 - Photodetektor mit grossem dynamikbereich und erhöhtem arbeitstemperaturbereich - Google Patents
Photodetektor mit grossem dynamikbereich und erhöhtem arbeitstemperaturbereichInfo
- Publication number
- ATE396499T1 ATE396499T1 AT01811011T AT01811011T ATE396499T1 AT E396499 T1 ATE396499 T1 AT E396499T1 AT 01811011 T AT01811011 T AT 01811011T AT 01811011 T AT01811011 T AT 01811011T AT E396499 T1 ATE396499 T1 AT E396499T1
- Authority
- AT
- Austria
- Prior art keywords
- range
- photodiode
- photodetector
- control voltage
- working temperature
- Prior art date
Links
- 238000005286 illumination Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/1443—Devices controlled by radiation with at least one potential jump or surface barrier
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Light Receiving Elements (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP01811011A EP1302986B1 (de) | 2001-10-16 | 2001-10-16 | Photodetektor mit grossem Dynamikbereich und erhöhtem Arbeitstemperaturbereich |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE396499T1 true ATE396499T1 (de) | 2008-06-15 |
Family
ID=8184192
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT01811011T ATE396499T1 (de) | 2001-10-16 | 2001-10-16 | Photodetektor mit grossem dynamikbereich und erhöhtem arbeitstemperaturbereich |
Country Status (5)
Country | Link |
---|---|
US (1) | US6921891B2 (de) |
EP (1) | EP1302986B1 (de) |
JP (1) | JP2003202264A (de) |
AT (1) | ATE396499T1 (de) |
DE (1) | DE60134143D1 (de) |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6974973B2 (en) * | 2002-11-08 | 2005-12-13 | Micron Technology, Inc. | Apparatus for determining temperature of an active pixel imager and correcting temperature induced variations in an imager |
US7115855B2 (en) * | 2003-09-05 | 2006-10-03 | Micron Technology, Inc. | Image sensor having pinned floating diffusion diode |
WO2005074250A1 (fr) * | 2004-02-01 | 2005-08-11 | Susanna Pita | Capteur optoelectronique a haute dynamique avec faible bruit d’offset |
KR20060023890A (ko) * | 2004-09-11 | 2006-03-15 | 학교법인연세대학교 | 광응답특성을 제어할 수 있는 광대역 cmos 이미지센서및 광응답특성 제어방법 |
JP4807014B2 (ja) * | 2005-09-02 | 2011-11-02 | ソニー株式会社 | 固体撮像装置、固体撮像装置の駆動方法および撮像装置 |
EP1763220A1 (de) | 2005-09-07 | 2007-03-14 | CSEM Centre Suisse d'Electronique et de Microtechnique SA | Festkörperbildsensor mit hoher Empfindlichkeit und erweitertem Dynamikbereich |
EP1863091A3 (de) * | 2006-05-30 | 2012-11-21 | Semiconductor Energy Laboratory Co., Ltd. | Halbleiterbauelement und elektronische Vorrichtung damit |
JP4353224B2 (ja) | 2006-09-25 | 2009-10-28 | エプソンイメージングデバイス株式会社 | 光検出装置、電気光学装置、および電子機器 |
EP2432015A1 (de) | 2007-04-18 | 2012-03-21 | Invisage Technologies, Inc. | Materialien, System und Verfahren für optoelektronische Geräte |
US8525287B2 (en) | 2007-04-18 | 2013-09-03 | Invisage Technologies, Inc. | Materials, systems and methods for optoelectronic devices |
US20100044676A1 (en) | 2008-04-18 | 2010-02-25 | Invisage Technologies, Inc. | Photodetectors and Photovoltaics Based on Semiconductor Nanocrystals |
KR100958028B1 (ko) * | 2008-02-13 | 2010-05-17 | 삼성모바일디스플레이주식회사 | 광센서 및 그를 이용한 평판표시장치 |
US8138567B2 (en) * | 2008-04-18 | 2012-03-20 | Invisage Technologies, Inc. | Materials, fabrication equipment, and methods for stable, sensitive photodetectors and image sensors made therefrom |
US8203195B2 (en) | 2008-04-18 | 2012-06-19 | Invisage Technologies, Inc. | Materials, fabrication equipment, and methods for stable, sensitive photodetectors and image sensors made therefrom |
KR101015884B1 (ko) * | 2008-07-16 | 2011-02-23 | 삼성모바일디스플레이주식회사 | 손가락 열에 의한 전류를 제거하는 터치 패널 구동회로 및 이를 포함하는 터치 패널 |
JP5491131B2 (ja) * | 2008-11-12 | 2014-05-14 | 株式会社半導体エネルギー研究所 | 光電変換装置 |
IT1392502B1 (it) * | 2008-12-31 | 2012-03-09 | St Microelectronics Srl | Sensore comprendente almeno un fotodiodo a doppia giunzione verticale integrato su substrato semiconduttore e relativo processo di integrazione |
TWI400944B (zh) * | 2009-07-16 | 2013-07-01 | Au Optronics Corp | 影像感測器 |
US8916947B2 (en) | 2010-06-08 | 2014-12-23 | Invisage Technologies, Inc. | Photodetector comprising a pinned photodiode that is formed by an optically sensitive layer and a silicon diode |
JP5986551B2 (ja) * | 2013-10-03 | 2016-09-06 | 旭化成エレクトロニクス株式会社 | センサ処理回路及びそのオフセット検出方法 |
WO2015105048A1 (ja) * | 2014-01-08 | 2015-07-16 | 旭化成エレクトロニクス株式会社 | ダイオード型センサの出力電流検出icチップ及びダイオード型センサ装置 |
FR3053503B1 (fr) * | 2016-06-30 | 2019-03-29 | Stmicroelectronics (Rousset) Sas | Procede de protection d'un circuit integre, et circuit integre correspondant |
JP6696695B2 (ja) * | 2017-03-16 | 2020-05-20 | 株式会社東芝 | 光検出装置およびこれを用いた被写体検知システム |
CN107014489B (zh) * | 2017-04-27 | 2018-05-08 | 浙江工业大学 | 一种光多参量传感cmos单片集成电路 |
US10340852B2 (en) * | 2017-10-13 | 2019-07-02 | Northrop Grumman Systems Corporation | Bias boosting circuit for amplifier |
CN112362159B (zh) * | 2017-12-05 | 2024-01-19 | 上海耕岩智能科技有限公司 | 光侦测像素结构、光侦测器件、光侦测装置 |
JP7150504B2 (ja) * | 2018-07-18 | 2022-10-11 | キヤノン株式会社 | 固体撮像装置及びその駆動方法 |
US11587962B2 (en) | 2020-07-15 | 2023-02-21 | Raytheon Company | Imaging system including analog compression for simultaneous pulse detection and imaging |
CN114245047B (zh) * | 2021-12-21 | 2024-03-05 | 上海集成电路装备材料产业创新中心有限公司 | 像素单元及图像传感器 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61187267A (ja) * | 1985-02-14 | 1986-08-20 | Matsushita Electric Ind Co Ltd | 固体撮像装置 |
FR2638286B1 (fr) * | 1988-10-25 | 1990-12-07 | Thomson Csf | Dispositif photosensible du type a amplification du signal au niveau des points photosensibles |
US5376782A (en) * | 1992-03-04 | 1994-12-27 | Fuji Xerox Co., Ltd. | Image pickup device providing decreased image lag |
GB9505305D0 (en) * | 1995-03-16 | 1995-05-03 | Philips Electronics Uk Ltd | Electronic devices comprising an array |
US5721425A (en) * | 1996-03-01 | 1998-02-24 | National Semiconductor Corporation | Active pixel sensor cell that reduces the effect of 1/f noise, increases the voltage range of the cell, and reduces the size of the cell |
DE69833998T2 (de) | 1998-11-18 | 2007-04-05 | C.S.E.M. Centre Suisse D'electronique Et De Microtechnique S.A. | Bilderzeugungsverfahren und -vorrichtung |
US6498331B1 (en) * | 1999-12-21 | 2002-12-24 | Pictos Technologies, Inc. | Method and apparatus for achieving uniform low dark current with CMOS photodiodes |
-
2001
- 2001-10-16 DE DE60134143T patent/DE60134143D1/de not_active Expired - Lifetime
- 2001-10-16 AT AT01811011T patent/ATE396499T1/de not_active IP Right Cessation
- 2001-10-16 EP EP01811011A patent/EP1302986B1/de not_active Expired - Lifetime
-
2002
- 2002-10-11 JP JP2002298464A patent/JP2003202264A/ja active Pending
- 2002-10-15 US US10/270,924 patent/US6921891B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20030071196A1 (en) | 2003-04-17 |
EP1302986B1 (de) | 2008-05-21 |
US6921891B2 (en) | 2005-07-26 |
EP1302986A1 (de) | 2003-04-16 |
JP2003202264A (ja) | 2003-07-18 |
DE60134143D1 (de) | 2008-07-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |