ATE391284T1 - Verwendung von oberflächenmesssonden - Google Patents

Verwendung von oberflächenmesssonden

Info

Publication number
ATE391284T1
ATE391284T1 AT05772904T AT05772904T ATE391284T1 AT E391284 T1 ATE391284 T1 AT E391284T1 AT 05772904 T AT05772904 T AT 05772904T AT 05772904 T AT05772904 T AT 05772904T AT E391284 T1 ATE391284 T1 AT E391284T1
Authority
AT
Austria
Prior art keywords
artifact
probe
measurements
measuring probe
surface measuring
Prior art date
Application number
AT05772904T
Other languages
English (en)
Inventor
Kevyn Barry Jonas
Geoffrey Mcfarland
Original Assignee
Renishaw Plc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=32982635&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE391284(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Renishaw Plc filed Critical Renishaw Plc
Application granted granted Critical
Publication of ATE391284T1 publication Critical patent/ATE391284T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Prostheses (AREA)
  • Dental Preparations (AREA)
  • Pens And Brushes (AREA)
AT05772904T 2004-08-06 2005-08-05 Verwendung von oberflächenmesssonden ATE391284T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB0417536.0A GB0417536D0 (en) 2004-08-06 2004-08-06 The use of surface measurement probes

Publications (1)

Publication Number Publication Date
ATE391284T1 true ATE391284T1 (de) 2008-04-15

Family

ID=32982635

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05772904T ATE391284T1 (de) 2004-08-06 2005-08-05 Verwendung von oberflächenmesssonden

Country Status (8)

Country Link
US (1) US7526873B2 (de)
EP (1) EP1792139B2 (de)
JP (1) JP2008509386A (de)
CN (1) CN100460814C (de)
AT (1) ATE391284T1 (de)
DE (1) DE602005005839T3 (de)
GB (1) GB0417536D0 (de)
WO (1) WO2006013387A2 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0608235D0 (en) * 2006-04-26 2006-06-07 Renishaw Plc Differential calibration
GB0703423D0 (en) 2007-02-22 2007-04-04 Renishaw Plc Calibration method and apparatus
JP2008304332A (ja) * 2007-06-07 2008-12-18 Tokyo Seimitsu Co Ltd 表面粗さ／形状測定装置及び表面粗さ／形状測定方法
WO2009001385A1 (en) * 2007-06-28 2008-12-31 Hexagon Metrology S.P.A. Method for determining dynamic errors in a measuring machine
DE102009004982A1 (de) * 2009-01-14 2010-07-22 Höfler Maschinenbau GmbH Messverfahren und Messvorrichtung
GB0900878D0 (en) * 2009-01-20 2009-03-04 Renishaw Plc Method for optimising a measurement cycle
CN102072701A (zh) * 2010-11-23 2011-05-25 苏州江城数控精密机械有限公司 一种检测零件尺寸的方法及装置
CN110076630B (zh) 2012-04-18 2021-10-08 瑞尼斯豪公司 在机床上测量的方法以及相应的机床设备
US9733060B2 (en) 2012-04-18 2017-08-15 Renishaw Plc Method of finding a feature using a machine tool
JP6346167B2 (ja) 2012-04-18 2018-06-20 レニショウ パブリック リミテッド カンパニーＲｅｎｉｓｈａｗ Ｐｕｂｌｉｃ Ｌｉｍｉｔｅｄ Ｃｏｍｐａｎｙ 工作機械におけるアナログ測定走査方法および対応する工作機械装置
GB201316329D0 (en) * 2013-09-13 2013-10-30 Renishaw Plc A Method of Using a scanning probe
WO2015085316A1 (en) * 2013-12-07 2015-06-11 Bruker Nano, Inc. Force measurement with real-time baseline determination
DE102015006636A1 (de) * 2015-05-22 2016-11-24 Blum-Novotest Gmbh Verfahren und System zur Erfassung einer Werkstückkontur und zur Korrektur eines SOLL-Pfades für die Bearbeitung eines Werkstücks in einer Werkzeugmaschine
JP6608726B2 (ja) * 2016-02-18 2019-11-20 株式会社東京精密 位置決め測定システム
DE102019122650A1 (de) * 2019-08-22 2021-02-25 M & H Inprocess Messtechnik Gmbh Messsystem
US11644299B2 (en) * 2020-12-31 2023-05-09 Mitutoyo Corporation Inductive position sensor signal gain control for coordinate measuring machine probe

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2242355C2 (de) 1972-08-29 1974-10-17 Fa. Carl Zeiss, 7920 Heidenheim Elektronischer Mehrkoordinatentaster
US4118871A (en) * 1978-06-13 1978-10-10 Kearney & Trecker Corporation Binary inspection probe for numerically controlled machine tools
GB8624191D0 (en) * 1986-10-08 1986-11-12 Renishaw Plc Datuming of analogue measurement probes
GB8713715D0 (en) 1987-06-11 1987-07-15 Renishaw Plc Workpiece inspection method
US5390424A (en) 1990-01-25 1995-02-21 Renishaw Metrology Limited Analogue probe
GB9110818D0 (en) * 1991-05-21 1991-07-10 Renishaw Metrology Ltd A method of measuring workpieces using a surface contacting measuring probe
DE4134371A1 (de) * 1991-10-17 1993-04-22 Zeiss Carl Fa Verfahren zur messung der effektiven momentanposition eines von einem schlitten getragenen tastelementes bzw. werkzeugs
GB9224335D0 (en) * 1992-11-20 1993-01-13 Renishaw Metrology Ltd A method of measuring workpieces using a surface contacting measuring probe
ATE169395T1 (de) * 1995-02-23 1998-08-15 Inst Fertigungstechnik Der Tu Messvorrichtung zur kontrolle der geometrischen und dynamischen genauigkeit von nc- werkzeugmaschinen und industrierobotern
DE29612861U1 (de) 1996-07-24 1996-09-12 Fa. Carl Zeiss, 89518 Heidenheim Koordinatenmeßgerät mit Meßzeitoptimierung
US6810597B2 (en) * 1999-04-08 2004-11-02 Renishaw Plc Use of surface measuring probes
GB9907868D0 (en) * 1999-04-08 1999-06-02 Renishaw Plc Method of calibrating a scanning system
DE50106760D1 (de) * 2000-05-23 2005-08-25 Zeiss Ind Messtechnik Gmbh Korrekturverfahren für Koordinatenmessgeräte
JP2002039743A (ja) * 2000-07-28 2002-02-06 Mori Seiki Co Ltd 測定機
GB0215478D0 (en) 2002-07-04 2002-08-14 Renishaw Plc Method of scanning a calibrating system
GB0228371D0 (en) * 2002-12-05 2003-01-08 Leland E C E Workpiece inspection method
GB0329098D0 (en) * 2003-12-16 2004-01-21 Renishaw Plc Method of calibrating a scanning system
DE102004007968B4 (de) * 2004-02-18 2006-02-09 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zum Antasten eines Werkstücks mit einem Koordinatenmessgerät
DE102005003321A1 (de) * 2005-01-18 2006-07-27 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zum Bestimmen einer Raumkoordinate eines Messpunktes an einem Messobjekt sowie entsprechendes Koordinatenmessgerät

Also Published As

Publication number Publication date
WO2006013387A9 (en) 2007-03-15
DE602005005839T2 (de) 2009-04-02
JP2008509386A (ja) 2008-03-27
CN1993600A (zh) 2007-07-04
EP1792139B1 (de) 2008-04-02
US20080028626A1 (en) 2008-02-07
GB0417536D0 (en) 2004-09-08
CN100460814C (zh) 2009-02-11
DE602005005839D1 (de) 2008-05-15
WO2006013387A2 (en) 2006-02-09
US7526873B2 (en) 2009-05-05
EP1792139A2 (de) 2007-06-06
EP1792139B2 (de) 2014-02-19
DE602005005839T3 (de) 2014-04-10
WO2006013387A3 (en) 2006-03-23

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Legal Events

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