ATE335206T1 - Verfahren und einrichtung zur ruhestrombestimmung - Google Patents
Verfahren und einrichtung zur ruhestrombestimmungInfo
- Publication number
- ATE335206T1 ATE335206T1 AT03748376T AT03748376T ATE335206T1 AT E335206 T1 ATE335206 T1 AT E335206T1 AT 03748376 T AT03748376 T AT 03748376T AT 03748376 T AT03748376 T AT 03748376T AT E335206 T1 ATE335206 T1 AT E335206T1
- Authority
- AT
- Austria
- Prior art keywords
- terminal
- circuit
- vdd
- under test
- count period
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3004—Current or voltage test
- G01R31/3008—Quiescent current [IDDQ] test or leakage current test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3004—Current or voltage test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
- Air Bags (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP02078906 | 2002-09-20 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE335206T1 true ATE335206T1 (de) | 2006-08-15 |
Family
ID=32011004
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT03748376T ATE335206T1 (de) | 2002-09-20 | 2003-08-08 | Verfahren und einrichtung zur ruhestrombestimmung |
Country Status (9)
Country | Link |
---|---|
US (1) | US7336088B2 (de) |
EP (1) | EP1543339B1 (de) |
JP (1) | JP2006500559A (de) |
KR (1) | KR20050057517A (de) |
AT (1) | ATE335206T1 (de) |
AU (1) | AU2003267684A1 (de) |
DE (1) | DE60307297T2 (de) |
TW (1) | TWI280380B (de) |
WO (1) | WO2004027438A1 (de) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1727090A1 (de) * | 2004-02-27 | 2006-11-29 | Tdvision Corporation S.A. DE C.V. | Verfahren und system zum digitalen decodieren von stereoskopischen 3d-videobildern |
JP2005346815A (ja) * | 2004-06-02 | 2005-12-15 | Hitachi Global Storage Technologies Netherlands Bv | ディスク装置、そのヘッドの位置決め制御方法、及び信号処理回路 |
JP4630122B2 (ja) * | 2005-05-11 | 2011-02-09 | 株式会社アドバンテスト | 試験装置、及び試験方法 |
KR100758222B1 (ko) | 2007-04-09 | 2007-09-12 | 주식회사 룩센테크놀러지 | 자체 클럭 발생기를 갖는 정현파 전압 최대값 검출기 |
US8159255B2 (en) * | 2008-02-15 | 2012-04-17 | Qualcomm, Incorporated | Methodologies and tool set for IDDQ verification, debugging and failure diagnosis |
US8044676B2 (en) * | 2008-06-11 | 2011-10-25 | Infineon Technologies Ag | IDDQ testing |
US8391469B2 (en) * | 2008-07-11 | 2013-03-05 | Texas Instruments Incorporated | Methods and apparatus to decode dual-tone signals |
US8278960B2 (en) * | 2009-06-19 | 2012-10-02 | Freescale Semiconductor, Inc. | Method and circuit for measuring quiescent current |
JP2011027453A (ja) * | 2009-07-22 | 2011-02-10 | Renesas Electronics Corp | 半導体試験装置及び半導体試験方法 |
US8816754B1 (en) * | 2012-11-02 | 2014-08-26 | Suvolta, Inc. | Body bias circuits and methods |
US9007079B2 (en) * | 2012-11-02 | 2015-04-14 | Nvidia Corporation | System and method for compensating measured IDDQ values |
US9482706B2 (en) * | 2012-12-11 | 2016-11-01 | Dust Company, Inc. | Methods and circuits for measuring a high impedance element based on time constant measurements |
FR3014266B1 (fr) * | 2013-12-03 | 2017-07-21 | Stmicroelectronics Rousset | Procede et dispositif de commande d'un echantillonneur bloqueur. |
JP6502538B1 (ja) * | 2018-01-24 | 2019-04-17 | ウィンボンド エレクトロニクス コーポレーション | 半導体記憶装置および解析システム |
US20220268857A1 (en) * | 2021-02-12 | 2022-08-25 | Nordic Semiconductor Asa | Power leakage testing |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5731700A (en) * | 1994-03-14 | 1998-03-24 | Lsi Logic Corporation | Quiescent power supply current test method and apparatus for integrated circuits |
US5694063A (en) * | 1994-08-11 | 1997-12-02 | Ltx Corporation | High speed IDDQ monitor circuit |
US5917331A (en) * | 1995-10-23 | 1999-06-29 | Megatest Corporation | Integrated circuit test method and structure |
ATE300741T1 (de) * | 1996-06-05 | 2005-08-15 | Imec Inter Uni Micro Electr | Hochauflösendes stromversorgungsprüfsystem |
US5789933A (en) * | 1996-10-30 | 1998-08-04 | Hewlett-Packard Co. | Method and apparatus for determining IDDQ |
US6037796A (en) * | 1997-06-25 | 2000-03-14 | Lsi Logic Corp. | Current waveform analysis for testing semiconductor devices |
US6348806B1 (en) * | 1999-03-18 | 2002-02-19 | Motorola, Inc. | Method and apparatus for measuring gate leakage current in an integrated circuit |
US6535015B1 (en) * | 2001-04-30 | 2003-03-18 | Advanced Micro Devices, Inc. | Device and method for testing performance of silicon structures |
US6845480B2 (en) * | 2002-01-28 | 2005-01-18 | Winbond Electronics Corp. | Test pattern generator and test pattern generation |
AU2003255888A1 (en) * | 2002-09-16 | 2004-04-30 | Koninklijke Philips Electronics N.V. | A method and apparatus for iddq measuring |
-
2003
- 2003-08-08 AT AT03748376T patent/ATE335206T1/de not_active IP Right Cessation
- 2003-08-08 DE DE60307297T patent/DE60307297T2/de not_active Expired - Lifetime
- 2003-08-08 KR KR1020057004835A patent/KR20050057517A/ko not_active Application Discontinuation
- 2003-08-08 JP JP2004537366A patent/JP2006500559A/ja not_active Withdrawn
- 2003-08-08 AU AU2003267684A patent/AU2003267684A1/en not_active Abandoned
- 2003-08-08 WO PCT/IB2003/003553 patent/WO2004027438A1/en active IP Right Grant
- 2003-08-08 EP EP03748376A patent/EP1543339B1/de not_active Expired - Lifetime
- 2003-08-08 US US10/528,253 patent/US7336088B2/en not_active Expired - Fee Related
- 2003-09-17 TW TW092125616A patent/TWI280380B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
TW200413734A (en) | 2004-08-01 |
DE60307297T2 (de) | 2007-10-18 |
KR20050057517A (ko) | 2005-06-16 |
US20060250152A1 (en) | 2006-11-09 |
DE60307297D1 (de) | 2006-09-14 |
US7336088B2 (en) | 2008-02-26 |
TWI280380B (en) | 2007-05-01 |
EP1543339A1 (de) | 2005-06-22 |
WO2004027438A1 (en) | 2004-04-01 |
AU2003267684A1 (en) | 2004-04-08 |
JP2006500559A (ja) | 2006-01-05 |
EP1543339B1 (de) | 2006-08-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |