ATE241848T1 - Mehrfachecke kirkpatrick-baez optische strahlbehandlungsanordnung - Google Patents

Mehrfachecke kirkpatrick-baez optische strahlbehandlungsanordnung

Info

Publication number
ATE241848T1
ATE241848T1 AT99934364T AT99934364T ATE241848T1 AT E241848 T1 ATE241848 T1 AT E241848T1 AT 99934364 T AT99934364 T AT 99934364T AT 99934364 T AT99934364 T AT 99934364T AT E241848 T1 ATE241848 T1 AT E241848T1
Authority
AT
Austria
Prior art keywords
optical beam
beam treatment
treatment arrangement
kirkpatrick
baez
Prior art date
Application number
AT99934364T
Other languages
English (en)
Inventor
George Gutman
Licai Jiang
Boris Verman
Original Assignee
Osmic Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Osmic Inc filed Critical Osmic Inc
Application granted granted Critical
Publication of ATE241848T1 publication Critical patent/ATE241848T1/de

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G21K1/062—Devices having a multilayer structure
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/061—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements characterised by a multilayer structure

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Nanotechnology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Plural Heterocyclic Compounds (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Sorption Type Refrigeration Machines (AREA)
  • Pharmaceuticals Containing Other Organic And Inorganic Compounds (AREA)
  • Particle Accelerators (AREA)
  • Aerials With Secondary Devices (AREA)
AT99934364T 1998-02-19 1999-02-18 Mehrfachecke kirkpatrick-baez optische strahlbehandlungsanordnung ATE241848T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/026,391 US6014423A (en) 1998-02-19 1998-02-19 Multiple corner Kirkpatrick-Baez beam conditioning optic assembly
PCT/US1999/003304 WO1999043008A1 (en) 1998-02-19 1999-02-18 Multiple corner kirkpatrick-baez beam conditioning optic assembly

Publications (1)

Publication Number Publication Date
ATE241848T1 true ATE241848T1 (de) 2003-06-15

Family

ID=21831575

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99934364T ATE241848T1 (de) 1998-02-19 1999-02-18 Mehrfachecke kirkpatrick-baez optische strahlbehandlungsanordnung

Country Status (9)

Country Link
US (1) US6014423A (de)
EP (1) EP1060478B1 (de)
JP (1) JP4391019B2 (de)
AT (1) ATE241848T1 (de)
AU (1) AU3295099A (de)
CA (1) CA2321005C (de)
CZ (1) CZ301383B6 (de)
DE (1) DE69908311T2 (de)
WO (1) WO1999043008A1 (de)

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3734366B2 (ja) * 1998-03-20 2006-01-11 株式会社リガク Ｘ線分析装置
US6389100B1 (en) 1999-04-09 2002-05-14 Osmic, Inc. X-ray lens system
US6421417B1 (en) 1999-08-02 2002-07-16 Osmic, Inc. Multilayer optics with adjustable working wavelength
US6580940B2 (en) * 2000-02-02 2003-06-17 George Gutman X-ray system with implantable needle for treatment of cancer
US6504902B2 (en) * 2000-04-10 2003-01-07 Rigaku Corporation X-ray optical device and multilayer mirror for small angle scattering system
US6493421B2 (en) 2000-10-16 2002-12-10 Advanced X-Ray Technology, Inc. Apparatus and method for generating a high intensity X-ray beam with a selectable shape and wavelength
US6870896B2 (en) 2000-12-28 2005-03-22 Osmic, Inc. Dark-field phase contrast imaging
DE10107914A1 (de) * 2001-02-14 2002-09-05 Fraunhofer Ges Forschung Anordnung für röntgenanalytische Anwendungen
US6804324B2 (en) * 2001-03-01 2004-10-12 Osmo, Inc. X-ray phase contrast imaging using a fabry-perot interferometer concept
US6510200B1 (en) 2001-06-29 2003-01-21 Osmic, Inc. Multi-layer structure with variable bandpass for monochromatization and spectroscopy
JP3762665B2 (ja) * 2001-07-03 2006-04-05 株式会社リガク Ｘ線分析装置およびｘ線供給装置
DE10160472B4 (de) 2001-12-08 2004-06-03 Bruker Axs Gmbh Röntgen-optisches System und Verfahren zur Abbildung einer Strahlungsquelle
US6643353B2 (en) 2002-01-10 2003-11-04 Osmic, Inc. Protective layer for multilayers exposed to x-rays
JP3699998B2 (ja) * 2002-03-20 2005-09-28 国立大学法人東北大学 蛍光ｘ線ホログラフィー装置、蛍光ｘ線ホログラフィーおよび局所構造解析方法
DE10254026C5 (de) * 2002-11-20 2009-01-29 Incoatec Gmbh Reflektor für Röntgenstrahlung
US7245699B2 (en) * 2003-02-28 2007-07-17 Osmic, Inc. X-ray optical system with adjustable convergence
JP3697246B2 (ja) * 2003-03-26 2005-09-21 株式会社リガク Ｘ線回折装置
WO2004114325A2 (en) * 2003-06-13 2004-12-29 Osmic, Inc. Beam conditioning system
US7280634B2 (en) * 2003-06-13 2007-10-09 Osmic, Inc. Beam conditioning system with sequential optic
US7139366B1 (en) * 2005-05-31 2006-11-21 Osmic, Inc. Two-dimensional small angle x-ray scattering camera
JP4814782B2 (ja) * 2006-12-28 2011-11-16 株式会社ジェイテック 位相回復法を用いたｘ線集光方法及びその装置
US7706503B2 (en) * 2007-11-20 2010-04-27 Rigaku Innovative Technologies, Inc. X-ray optic with varying focal points
US8559597B2 (en) * 2008-03-05 2013-10-15 X-Ray Optical Systems, Inc. XRF system having multiple excitation energy bands in highly aligned package
US7848483B2 (en) * 2008-03-07 2010-12-07 Rigaku Innovative Technologies Magnesium silicide-based multilayer x-ray fluorescence analyzers
JP5237186B2 (ja) * 2009-04-30 2013-07-17 株式会社リガク Ｘ線散乱測定装置およびｘ線散乱測定方法
US8537967B2 (en) * 2009-09-10 2013-09-17 University Of Washington Short working distance spectrometer and associated devices, systems, and methods
US8249220B2 (en) * 2009-10-14 2012-08-21 Rigaku Innovative Technologies, Inc. Multiconfiguration X-ray optical system
US8126117B2 (en) * 2010-02-03 2012-02-28 Rigaku Innovative Technologies, Inc. Multi-beam X-ray system
US8406374B2 (en) * 2010-06-25 2013-03-26 Rigaku Innovative Technologies, Inc. X-ray optical systems with adjustable convergence and focal spot size
KR101332502B1 (ko) * 2011-06-14 2013-11-26 전남대학교산학협력단 국부적 방사선 치료용 ｘ―선 바늘 모듈
JP2013221882A (ja) * 2012-04-18 2013-10-28 Hitachi Ltd 測定装置
JP6322628B2 (ja) * 2012-06-08 2018-05-09 リガク イノベイティブ テクノロジーズ インコーポレイテッド １ｄ及び２ｄビームを提供するｘ線ビームシステム
JP6322627B2 (ja) * 2012-06-08 2018-05-09 リガク イノベイティブ テクノロジーズ インコーポレイテッド デュアルモード小角散乱カメラ
WO2014045273A1 (en) * 2012-09-24 2014-03-27 Convergent R.N.R Ltd X-ray reflective lens arrangement
JP6857400B2 (ja) * 2018-03-01 2021-04-14 株式会社リガク Ｘ線発生装置、及びｘ線分析装置
US11885753B2 (en) * 2020-10-23 2024-01-30 Rigaku Corporation Imaging type X-ray microscope

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Publication number Priority date Publication date Assignee Title
US4242588A (en) * 1979-08-13 1980-12-30 American Science And Engineering, Inc. X-ray lithography system having collimating optics
US4525853A (en) * 1983-10-17 1985-06-25 Energy Conversion Devices, Inc. Point source X-ray focusing device
US4958363A (en) * 1986-08-15 1990-09-18 Nelson Robert S Apparatus for narrow bandwidth and multiple energy x-ray imaging
US4912737A (en) * 1987-10-30 1990-03-27 Hamamatsu Photonics K.K. X-ray image observing device
JPH01263599A (ja) * 1988-04-15 1989-10-20 Nec Corp 半導体製造装置
JPH01292297A (ja) * 1988-05-19 1989-11-24 Toshiba Corp Ｘ線ミラー及びその製造方法
JPH0225737A (ja) * 1988-07-15 1990-01-29 Hitachi Ltd 表面分析方法および装置
US4951304A (en) * 1989-07-12 1990-08-21 Adelphi Technology Inc. Focused X-ray source
US5027377A (en) * 1990-01-09 1991-06-25 The United States Of America As Represented By The United States Department Of Energy Chromatic X-ray magnifying method and apparatus by Bragg reflective planes on the surface of Abbe sphere
JP2968996B2 (ja) * 1990-11-30 1999-11-02 株式会社リコー Ｘ線集光装置
DE4407278A1 (de) * 1994-03-04 1995-09-07 Siemens Ag Röntgen-Analysegerät
JPH09500453A (ja) * 1994-05-11 1997-01-14 ザ・リージェンツ・オブ・ザ・ユニバーシティ・オブ・コロラド 球面ミラーかすめ入射ｘ線光学系
US5646976A (en) * 1994-08-01 1997-07-08 Osmic, Inc. Optical element of multilayered thin film for X-rays and neutrons

Also Published As

Publication number Publication date
JP4391019B2 (ja) 2009-12-24
EP1060478A1 (de) 2000-12-20
WO1999043008A1 (en) 1999-08-26
CA2321005C (en) 2008-12-02
CZ20003041A3 (en) 2001-05-16
US6014423A (en) 2000-01-11
CA2321005A1 (en) 1999-08-26
AU3295099A (en) 1999-09-06
DE69908311D1 (de) 2003-07-03
JP2002504692A (ja) 2002-02-12
EP1060478B1 (de) 2003-05-28
DE69908311T2 (de) 2003-12-11
CZ301383B6 (cs) 2010-02-10

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