ATE158075T1 - Verfahren und vorrichtung, zwei magnetische sensoren und eine laser-messeinrichtung enthaltend, für das messen der dicke eines filmes - Google Patents

Verfahren und vorrichtung, zwei magnetische sensoren und eine laser-messeinrichtung enthaltend, für das messen der dicke eines filmes

Info

Publication number
ATE158075T1
ATE158075T1 AT94100712T AT94100712T ATE158075T1 AT E158075 T1 ATE158075 T1 AT E158075T1 AT 94100712 T AT94100712 T AT 94100712T AT 94100712 T AT94100712 T AT 94100712T AT E158075 T1 ATE158075 T1 AT E158075T1
Authority
AT
Austria
Prior art keywords
film
magnetic sensors
distance
thickness
laser
Prior art date
Application number
AT94100712T
Other languages
English (en)
Inventor
Alessandro Masotti
Original Assignee
Electronic Systems Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electronic Systems Spa filed Critical Electronic Systems Spa
Application granted granted Critical
Publication of ATE158075T1 publication Critical patent/ATE158075T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
AT94100712T 1993-01-22 1994-01-19 Verfahren und vorrichtung, zwei magnetische sensoren und eine laser-messeinrichtung enthaltend, für das messen der dicke eines filmes ATE158075T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITMI930092A IT1263789B (it) 1993-01-22 1993-01-22 Metodo e apparecchio comprendente due sensori magnetici ed un misuratore laser per misurare lo spessore di un film

Publications (1)

Publication Number Publication Date
ATE158075T1 true ATE158075T1 (de) 1997-09-15

Family

ID=11364718

Family Applications (1)

Application Number Title Priority Date Filing Date
AT94100712T ATE158075T1 (de) 1993-01-22 1994-01-19 Verfahren und vorrichtung, zwei magnetische sensoren und eine laser-messeinrichtung enthaltend, für das messen der dicke eines filmes

Country Status (4)

Country Link
EP (1) EP0607938B1 (de)
AT (1) ATE158075T1 (de)
DE (1) DE69405415T2 (de)
IT (1) IT1263789B (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118640810A (zh) * 2024-08-15 2024-09-13 江苏众盈精特科技有限公司 一种精密钢管线激光测厚方法

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1283347B1 (it) * 1996-07-29 1998-04-17 Electronic Systems Spa Metodo ed apperecchiatura per misurare con precisione un film che avanza,su tutta la sua superficie
AT408580B (de) * 1997-11-21 2002-01-25 Bierbaumer Hans Peter Dr Messvorrichtung zumindest zur ermittlung der dicke einer bahn sowie verfahren hierfür
US20020190710A1 (en) * 2001-02-13 2002-12-19 Asm Automation Sensorik Messtechnik Gmbh Magnetic length measuring device
EP2837484B1 (de) 2013-08-14 2020-10-21 Electronic Systems S.p.A. Vorrichtung zur automatischen Analyse von Extrusionsfolien
CN115436387A (zh) * 2022-10-08 2022-12-06 山东中为电子科技有限公司 一种陶瓷膜带外观标记装置
CN120740461B (zh) * 2025-08-15 2025-12-30 连云港市金田高新材料有限公司 一种高性能膜材料在线测厚仪

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61254812A (ja) * 1985-05-08 1986-11-12 Meisan Kk 非磁性体シ−ト厚さ連続測定装置
JPH0648185B2 (ja) * 1988-10-12 1994-06-22 明産株式会社 シート厚さ測定装置
US4977853A (en) * 1989-06-01 1990-12-18 E. I. Du Pont De Nemours And Company Non-contact wet or dry film thickness measuring device
US5485082A (en) * 1990-04-11 1996-01-16 Micro-Epsilon Messtechnik Gmbh & Co. Kg Method of calibrating a thickness measuring device and device for measuring or monitoring the thickness of layers, tapes, foils, and the like

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118640810A (zh) * 2024-08-15 2024-09-13 江苏众盈精特科技有限公司 一种精密钢管线激光测厚方法

Also Published As

Publication number Publication date
ITMI930092A0 (it) 1993-01-22
EP0607938A1 (de) 1994-07-27
DE69405415T2 (de) 1998-01-22
IT1263789B (it) 1996-08-29
EP0607938B1 (de) 1997-09-10
ITMI930092A1 (it) 1994-07-22
DE69405415D1 (de) 1997-10-16

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Legal Events

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RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties