ATE105597T1 - Procede de metallisation sous vide permettant le depot d'un compose organo-metallique sur un substrat. - Google Patents
Procede de metallisation sous vide permettant le depot d'un compose organo-metallique sur un substrat.Info
- Publication number
- ATE105597T1 ATE105597T1 AT9090917451T AT90917451T ATE105597T1 AT E105597 T1 ATE105597 T1 AT E105597T1 AT 9090917451 T AT9090917451 T AT 9090917451T AT 90917451 T AT90917451 T AT 90917451T AT E105597 T1 ATE105597 T1 AT E105597T1
- Authority
- AT
- Austria
- Prior art keywords
- organo
- metallique
- procede
- substrat
- permettant
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/4485—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation without using carrier gas in contact with the source material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/301—AIII BV compounds, where A is Al, Ga, In or Tl and B is N, P, As, Sb or Bi
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/933—Germanium or silicon or Ge-Si on III-V
Landscapes
- Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Steroid Compounds (AREA)
- Chemical Vapour Deposition (AREA)
- Oxygen, Ozone, And Oxides In General (AREA)
- Chemically Coating (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/430,397 US4975299A (en) | 1989-11-02 | 1989-11-02 | Vapor deposition process for depositing an organo-metallic compound layer on a substrate |
PCT/US1990/006051 WO1991006688A1 (en) | 1989-11-02 | 1990-10-22 | Vapor depostion process for depositing an organo-metallic compound layer on a substrate |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE105597T1 true ATE105597T1 (de) | 1994-05-15 |
Family
ID=23707388
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT9090917451T ATE105597T1 (de) | 1989-11-02 | 1990-10-22 | Procede de metallisation sous vide permettant le depot d'un compose organo-metallique sur un substrat. |
Country Status (6)
Country | Link |
---|---|
US (1) | US4975299A (de) |
EP (1) | EP0497907B1 (de) |
JP (1) | JP3193372B2 (de) |
AT (1) | ATE105597T1 (de) |
DE (1) | DE69008862T2 (de) |
WO (1) | WO1991006688A1 (de) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3631469A1 (de) * | 1986-09-16 | 1988-03-17 | Merck Patent Gmbh | Metallorganische verbindungen |
US5073410A (en) * | 1989-10-16 | 1991-12-17 | Eastman Kodak Company | Thin films of metal phosphates and the method of their formation |
US6111124A (en) | 1997-10-30 | 2000-08-29 | Advanced Technology Materials, Inc. | Lewis base adducts of anhydrous mononuclear tris(β-diketonate) bismuth compositions for deposition of bismuth-containing films, and method of making the same |
US6511706B1 (en) | 1990-07-06 | 2003-01-28 | Advanced Technology Materials, Inc. | MOCVD of SBT using tetrahydrofuran-based solvent system for precursor delivery |
WO1993004212A1 (en) * | 1991-08-26 | 1993-03-04 | Eastman Kodak Company | Preparation of group iii element-group vi element compound films |
US5381756A (en) * | 1992-03-04 | 1995-01-17 | Fujitsu Limited | Magnesium doping in III-V compound semiconductor |
DE4217735A1 (de) * | 1992-05-29 | 1993-12-02 | Merck Patent Gmbh | Borhaltige organische Gruppe-V-Verbindungen |
US5330629A (en) * | 1992-12-15 | 1994-07-19 | At&T Bell Laboratories | Method for depositing aluminum layers on insulating oxide substrates |
JPH06310438A (ja) * | 1993-04-22 | 1994-11-04 | Mitsubishi Electric Corp | 化合物半導体気相成長用基板ホルダおよび化合物半導体気相成長装置 |
US5501751A (en) * | 1994-12-08 | 1996-03-26 | Alloy Surfaces Co. Inc. | Pyrophoic material and method for making the same |
JP2846477B2 (ja) * | 1994-12-27 | 1999-01-13 | シーメンス アクチエンゲゼルシヤフト | 炭化シリコン単結晶の製造方法 |
US5714391A (en) * | 1995-05-17 | 1998-02-03 | Matsushita Electric Industrial Co., Ltd. | Method of manufacturing a compound semiconductor thin film for a photoelectric or solar cell device |
US6303391B1 (en) * | 1997-06-26 | 2001-10-16 | Advanced Technology Materials, Inc. | Low temperature chemical vapor deposition process for forming bismuth-containing ceramic films useful in ferroelectric memory devices |
US7005303B2 (en) * | 1997-11-20 | 2006-02-28 | Advanced Technology Materials, Inc. | Low temperature chemical vapor deposition process for forming bismuth-containing ceramic thin films useful in ferroelectric memory devices |
DE19855476A1 (de) * | 1997-12-02 | 1999-06-17 | Murata Manufacturing Co | Lichtemittierendes Halbleiterelement mit einer Halbleiterschicht auf GaN-Basis, Verfahren zur Herstellung desselben und Verfahren zur Ausbildung einer Halbleiterschicht auf GaN-Basis |
KR100319389B1 (ko) * | 1999-06-15 | 2002-01-09 | 김충섭 | 유기갈륨 화합물, 이의 제조 방법 및 이를 이용한 질화갈륨 박막의 제조 방법 |
US6273951B1 (en) * | 1999-06-16 | 2001-08-14 | Micron Technology, Inc. | Precursor mixtures for use in preparing layers on substrates |
AU2002237658A1 (en) * | 2000-11-20 | 2002-05-27 | The Regents Of The University Of California | Process for producing iii-v compound films by chemical deposition |
US8617312B2 (en) * | 2002-08-28 | 2013-12-31 | Micron Technology, Inc. | Systems and methods for forming layers that contain niobium and/or tantalum |
US7115528B2 (en) * | 2003-04-29 | 2006-10-03 | Micron Technology, Inc. | Systems and method for forming silicon oxide layers |
EP1995347A4 (de) * | 2006-02-08 | 2010-04-28 | Jsr Corp | Verfahren zur bildung eines metallfilms |
WO2008069259A1 (en) | 2006-12-05 | 2008-06-12 | Semiconductor Energy Laboratory Co., Ltd. | Film formation apparatus, film formation method, manufacturing apparatus, and method for manufacturing light-emitting device |
US20090215225A1 (en) | 2008-02-24 | 2009-08-27 | Advanced Technology Materials, Inc. | Tellurium compounds useful for deposition of tellurium containing materials |
JP5881714B2 (ja) * | 2010-10-01 | 2016-03-09 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 太陽電池デバイスを形成する方法 |
JP2016051824A (ja) * | 2014-08-29 | 2016-04-11 | 高知県公立大学法人 | エピタキシャル成長方法および成長装置ならびに量子井戸構造の作製方法 |
JP7391296B2 (ja) * | 2017-10-07 | 2023-12-05 | 株式会社Flosfia | 成膜方法 |
JP7023445B2 (ja) * | 2017-10-07 | 2022-02-22 | 株式会社Flosfia | 成膜方法 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL296876A (de) * | 1962-08-23 | |||
US3705059A (en) * | 1971-02-25 | 1972-12-05 | Zenith Radio Corp | Methods of producing p-typeness and p-n junctions in wide band gap semiconductor materials |
US3754975A (en) * | 1971-06-28 | 1973-08-28 | Ransburg Electro Coating Corp | Deposition materials and method |
US3802967A (en) * | 1971-08-27 | 1974-04-09 | Rca Corp | Iii-v compound on insulating substrate and its preparation and use |
US4262630A (en) * | 1977-01-04 | 1981-04-21 | Bochkarev Ellin P | Method of applying layers of source substance over recipient and device for realizing same |
FR2403646A1 (fr) * | 1977-09-16 | 1979-04-13 | Anvar | Procede de realisation d'un depot de compose semi-conducteur d'elements iii et v |
GB2049636A (en) * | 1979-05-31 | 1980-12-31 | Vecht A | Methods of Producing Thin Films |
US4279670A (en) * | 1979-08-06 | 1981-07-21 | Raytheon Company | Semiconductor device manufacturing methods utilizing a predetermined flow of reactive substance over a dopant material |
US4427714A (en) * | 1981-01-16 | 1984-01-24 | Pa Management Consultants Limited | Thin films of compounds and alloy compounds of Group III and Group V elements |
JPS57134558A (en) * | 1981-02-16 | 1982-08-19 | Fuji Photo Film Co Ltd | Production of organic vapor deposited thin film |
US4594264A (en) * | 1984-11-20 | 1986-06-10 | Hughes Aircraft Company | Method for forming gallium arsenide from thin solid films of gallium-arsenic complexes |
US4759951A (en) * | 1985-09-25 | 1988-07-26 | Sharp Kabushiki Kaisha | Heat-treating Cd-containing photoelectric conversion film in the presence of a cadmium halide |
US4752455A (en) * | 1986-05-27 | 1988-06-21 | Kms Fusion, Inc. | Pulsed laser microfabrication |
JP2555045B2 (ja) * | 1987-01-19 | 1996-11-20 | 株式会社日立製作所 | 薄膜形成方法及びその装置 |
US4780334A (en) * | 1987-03-13 | 1988-10-25 | General Electric Company | Method and composition for depositing silicon dioxide layers |
JPS63237517A (ja) * | 1987-03-26 | 1988-10-04 | Canon Inc | 3−5族化合物膜の選択形成方法 |
US4833103A (en) * | 1987-06-16 | 1989-05-23 | Eastman Kodak Company | Process for depositing a III-V compound layer on a substrate |
US4895735A (en) * | 1988-03-01 | 1990-01-23 | Texas Instruments Incorporated | Radiation induced pattern deposition |
-
1989
- 1989-11-02 US US07/430,397 patent/US4975299A/en not_active Expired - Fee Related
-
1990
- 1990-10-22 JP JP50041791A patent/JP3193372B2/ja not_active Expired - Fee Related
- 1990-10-22 DE DE69008862T patent/DE69008862T2/de not_active Expired - Fee Related
- 1990-10-22 WO PCT/US1990/006051 patent/WO1991006688A1/en active IP Right Grant
- 1990-10-22 EP EP90917451A patent/EP0497907B1/de not_active Expired - Lifetime
- 1990-10-22 AT AT9090917451T patent/ATE105597T1/de active
Also Published As
Publication number | Publication date |
---|---|
JPH05503319A (ja) | 1993-06-03 |
DE69008862D1 (de) | 1994-06-16 |
EP0497907A1 (de) | 1992-08-12 |
JP3193372B2 (ja) | 2001-07-30 |
DE69008862T2 (de) | 1994-12-22 |
EP0497907B1 (de) | 1994-05-11 |
US4975299A (en) | 1990-12-04 |
WO1991006688A1 (en) | 1991-05-16 |
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