ATE100191T1 - Monitor der oberflaechenkontur einer bramme. - Google Patents

Monitor der oberflaechenkontur einer bramme.

Info

Publication number
ATE100191T1
ATE100191T1 AT89311766T AT89311766T ATE100191T1 AT E100191 T1 ATE100191 T1 AT E100191T1 AT 89311766 T AT89311766 T AT 89311766T AT 89311766 T AT89311766 T AT 89311766T AT E100191 T1 ATE100191 T1 AT E100191T1
Authority
AT
Austria
Prior art keywords
video camera
workpiece
image
creates
processor
Prior art date
Application number
AT89311766T
Other languages
English (en)
Inventor
David Lawrence Burk
Original Assignee
Allegheny Ludlum Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Allegheny Ludlum Corp filed Critical Allegheny Ludlum Corp
Application granted granted Critical
Publication of ATE100191T1 publication Critical patent/ATE100191T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Continuous Casting (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Road Signs Or Road Markings (AREA)
  • Electrochromic Elements, Electrophoresis, Or Variable Reflection Or Absorption Elements (AREA)
  • Laser Beam Processing (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Coating With Molten Metal (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
AT89311766T 1988-11-28 1989-11-14 Monitor der oberflaechenkontur einer bramme. ATE100191T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/276,717 US5083867A (en) 1988-11-28 1988-11-28 Slab surface contour monitor
EP89311766A EP0371650B1 (de) 1988-11-28 1989-11-14 Monitor der Oberflächenkontur einer Bramme

Publications (1)

Publication Number Publication Date
ATE100191T1 true ATE100191T1 (de) 1994-01-15

Family

ID=23057807

Family Applications (1)

Application Number Title Priority Date Filing Date
AT89311766T ATE100191T1 (de) 1988-11-28 1989-11-14 Monitor der oberflaechenkontur einer bramme.

Country Status (12)

Country Link
US (2) US5083867A (de)
EP (1) EP0371650B1 (de)
JP (1) JPH02187609A (de)
KR (1) KR900008245A (de)
AT (1) ATE100191T1 (de)
AU (1) AU628396B2 (de)
BR (1) BR8905675A (de)
CA (1) CA2002752C (de)
DE (1) DE68912285T2 (de)
ES (1) ES2049336T3 (de)
HU (1) HUT62085A (de)
PL (1) PL165123B1 (de)

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JPH0618957U (ja) * 1992-08-17 1994-03-11 東芝エンジニアリング株式会社 Ｐｔｐ用シール検査装置
US5566244A (en) * 1993-11-22 1996-10-15 Honda Giken Kogyo Kabushiki Kaisha Method of inspecting a workpiece surface including a picturing system with a shortened focal plane
DE59408809D1 (de) * 1994-11-04 1999-11-11 Robert Massen Verfahren und anordnung zur optischen inspektion von produkten
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JPH08313223A (ja) * 1995-05-16 1996-11-29 Ls Electro Galvanizing Co 移動ストリップを監視する方法と装置
SE516607C2 (sv) * 1995-12-04 2002-02-05 Optonova Ab Sätt och anordning vid kantavkänning
AU718931B2 (en) * 1996-03-01 2000-05-04 Durand-Wayland, Inc. Optical inspection apparatus and method for articles
US6122065A (en) * 1996-08-12 2000-09-19 Centre De Recherche Industrielle Du Quebec Apparatus and method for detecting surface defects
JPH1134187A (ja) * 1997-07-15 1999-02-09 Mitsubishi Heavy Ind Ltd 製函用シート材の接合部判定方法及び製函用シート材の接合部判定装置
US6335757B1 (en) 1997-09-02 2002-01-01 Bojko Vodanovic CCD imaging device for high speed profiling
US6094269A (en) * 1997-12-31 2000-07-25 Metroptic Technologies, Ltd. Apparatus and method for optically measuring an object surface contour
WO1999064882A1 (en) * 1998-06-10 1999-12-16 Teradyne, Inc. Measuring and compensating for warp in the inspection of printed circuit board assemblies
US6222630B1 (en) 1998-08-26 2001-04-24 Teradyne, Inc. Measuring and compensating for warp in the inspection of printed circuit board assemblies
WO2002046713A2 (en) 2000-12-08 2002-06-13 Cyberoptics Corporation Automated system with improved height sensing
KR100523099B1 (ko) * 2001-12-20 2005-10-19 주식회사 포스코 선재압연소재의 단면형상 측정방법
US6948347B2 (en) * 2003-01-24 2005-09-27 Isg Technologies Inc. Graphical rolled steel sheet flatness display and method of using same
PT1524047E (pt) * 2003-10-16 2007-05-31 Concast Ag Processo e dispositivo para a leitura automática de produtos semi-acabados
DE102005023270A1 (de) * 2005-05-20 2006-11-23 Sms Demag Ag Verfahren und Vorrichtung zur Herstellung eines Metallbandes
KR20090080528A (ko) 2006-10-16 2009-07-24 스트랜덱스 코포레이션 압출된 합성 목재 조성물의 치수를 모니터링하기 위한 풀러 속도 제어 장치
JP5488953B2 (ja) * 2008-09-17 2014-05-14 新日鐵住金株式会社 凹凸疵検査方法及び装置
JP5312144B2 (ja) * 2009-03-30 2013-10-09 トヨタ自動車株式会社 自動車ボディ表面欠陥検査方法、及び自動車ボディ表面欠陥検査装置
CN101655464B (zh) * 2009-09-16 2011-06-08 重庆大学 高温连铸坯表面缺陷形态及深度在线无损检测方法
FR2973110B1 (fr) * 2011-03-25 2013-04-26 Snecma Procede d'inspection des impacts observes dans des carters de soufflante
JP6156253B2 (ja) * 2014-05-20 2017-07-05 Ｊｆｅスチール株式会社 金属帯エッジ部撮像装置
CN104020177B (zh) * 2014-06-26 2016-06-15 重庆大学 连铸坯表面缺陷双ccd扫描成像检测方法
JP7099958B2 (ja) 2016-01-26 2022-07-12 シムボティック カナダ、ユーエルシー ケース入り物品検査システムおよび方法
US10031087B2 (en) 2016-09-22 2018-07-24 SSAB Enterprises, LLC Methods and systems for the quantitative measurement of internal defects in as-cast steel products

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US4105925A (en) * 1977-03-14 1978-08-08 General Motors Corporation Optical object locator
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US4158507A (en) * 1977-07-27 1979-06-19 Recognition Equipment Incorporated Laser measuring system for inspection
US4188544A (en) * 1977-08-22 1980-02-12 Weyerhaeuser Company Method and apparatus for automatically processing a workpiece employing calibrated scanning
US4118544A (en) * 1977-09-28 1978-10-03 P.R. Mallory & Co. Inc. Metal-air depolarized cell having restricted gas passageway
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US4223346A (en) * 1979-04-05 1980-09-16 Armco Inc. Automatic defect detecting inspection apparatus
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US4498778A (en) * 1981-03-30 1985-02-12 Technical Arts Corporation High speed scanning method and apparatus
US4594001A (en) * 1981-07-07 1986-06-10 Robotic Vision Systems, Inc. Detection of three-dimensional information with a projected plane of light
JPS58143204A (ja) * 1982-02-22 1983-08-25 Kinji Kitada 表面形状計測装置
US4628469A (en) * 1982-09-29 1986-12-09 Technical Arts Corporation Method and apparatus for locating center of reference pulse in a measurement system
US4541722A (en) * 1982-12-13 1985-09-17 Jenksystems, Inc. Contour line scanner
SE438091B (sv) * 1983-06-08 1985-04-01 Gote Palsgard Anordning for koordinatregistrering
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US4648053A (en) * 1984-10-30 1987-03-03 Kollmorgen Technologies, Corp. High speed optical inspection system
DE3503858A1 (de) * 1985-02-05 1986-08-21 Daimler-Benz Ag, 7000 Stuttgart Vorrichtung zur ermittlung von gestaltsfehlern niedriger ordnung
US4801207A (en) * 1985-06-14 1989-01-31 The Broken Hill Proprietary Company Limited Method and apparatus for the optical determination of surface profiles
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US4741621A (en) * 1986-08-18 1988-05-03 Westinghouse Electric Corp. Geometric surface inspection system with dual overlap light stripe generator
DE3639329C1 (de) * 1986-11-18 1988-02-25 Heesemann Karl Masch Bandschleifmaschine

Also Published As

Publication number Publication date
CA2002752A1 (en) 1990-05-28
US5083867A (en) 1992-01-28
EP0371650B1 (de) 1994-01-12
HUT62085A (en) 1993-03-29
AU628396B2 (en) 1992-09-17
DE68912285T2 (de) 1994-05-19
DE68912285D1 (de) 1994-02-24
BR8905675A (pt) 1990-06-05
EP0371650A1 (de) 1990-06-06
HU896224D0 (en) 1990-02-28
KR900008245A (ko) 1990-06-02
JPH02187609A (ja) 1990-07-23
CA2002752C (en) 2002-05-14
PL165123B1 (pl) 1994-11-30
US5162873A (en) 1992-11-10
ES2049336T3 (es) 1994-04-16
AU4270889A (en) 1990-05-31

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