ZA838162B - Testing digital electronic circuits - Google Patents

Testing digital electronic circuits

Info

Publication number
ZA838162B
ZA838162B ZA838162A ZA838162A ZA838162B ZA 838162 B ZA838162 B ZA 838162B ZA 838162 A ZA838162 A ZA 838162A ZA 838162 A ZA838162 A ZA 838162A ZA 838162 B ZA838162 B ZA 838162B
Authority
ZA
South Africa
Prior art keywords
electronic circuits
digital electronic
testing digital
testing
circuits
Prior art date
Application number
ZA838162A
Other languages
English (en)
Inventor
Peter Leo Lawrence Desyllas
George Martin Bradshaw
Keith Mclaren
Original Assignee
Int Computers Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Int Computers Ltd filed Critical Int Computers Ltd
Publication of ZA838162B publication Critical patent/ZA838162B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
ZA838162A 1982-11-20 1983-11-01 Testing digital electronic circuits ZA838162B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB8233179 1982-11-20

Publications (1)

Publication Number Publication Date
ZA838162B true ZA838162B (en) 1984-06-27

Family

ID=10534400

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA838162A ZA838162B (en) 1982-11-20 1983-11-01 Testing digital electronic circuits

Country Status (6)

Country Link
US (1) US4566104A (cs)
EP (1) EP0109770B1 (cs)
JP (1) JPS59105571A (cs)
AU (1) AU555808B2 (cs)
DE (1) DE3368770D1 (cs)
ZA (1) ZA838162B (cs)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2564619B1 (fr) * 1984-05-21 1986-09-26 Enertec Dispositif elementaire de traitement de donnees
US4720672A (en) * 1984-06-27 1988-01-19 Jon Turino Testability system
GB8432458D0 (en) * 1984-12-21 1985-02-06 Plessey Co Plc Integrated circuits
GB8432533D0 (en) * 1984-12-21 1985-02-06 Plessey Co Plc Integrated circuits
US4682329A (en) * 1985-03-28 1987-07-21 Kluth Daniel J Test system providing testing sites for logic circuits
NL8502476A (nl) * 1985-09-11 1987-04-01 Philips Nv Werkwijze voor het testen van dragers met meerdere digitaal-werkende geintegreerde schakelingen, drager voorzien van zulke schakelingen, geintegreerde schakeling geschikt voor het aanbrengen op zo'n drager, en testinrichting voor het testen van zulke dragers.
US4703484A (en) * 1985-12-19 1987-10-27 Harris Corporation Programmable integrated circuit fault detection apparatus
JPS62228177A (ja) * 1986-03-29 1987-10-07 Toshiba Corp 半導体集積回路用許容入力電圧検査回路
JPH0262124A (ja) * 1988-08-29 1990-03-02 Matsushita Electric Ind Co Ltd Ａ／ｄ変換器
US4972413A (en) * 1989-03-23 1990-11-20 Motorola, Inc. Method and apparatus for high speed integrated circuit testing
US4989209A (en) * 1989-03-24 1991-01-29 Motorola, Inc. Method and apparatus for testing high pin count integrated circuits
JP2513904B2 (ja) * 1990-06-12 1996-07-10 株式会社東芝 テスト容易化回路
US5228045A (en) * 1990-08-06 1993-07-13 Ncr Corporation Test driver for connecting a standard test port integrated circuit chip to a controlling computer
US5475815A (en) * 1994-04-11 1995-12-12 Unisys Corporation Built-in-self-test scheme for testing multiple memory elements
US5612965A (en) * 1994-04-26 1997-03-18 Unisys Corporation Multiple memory bit/chip failure detection
US5701313A (en) * 1995-02-24 1997-12-23 Unisys Corporation Method and apparatus for removing soft errors from a memory
US5666371A (en) * 1995-02-24 1997-09-09 Unisys Corporation Method and apparatus for detecting errors in a system that employs multi-bit wide memory elements
US5784382A (en) * 1995-03-01 1998-07-21 Unisys Corporation Method and apparatus for dynamically testing a memory within a computer system
US5511164A (en) * 1995-03-01 1996-04-23 Unisys Corporation Method and apparatus for determining the source and nature of an error within a computer system
US6581019B1 (en) * 2000-03-20 2003-06-17 Koninklijke Philips Electronics N.V. Computer-system-on-a-chip with test-mode addressing of normally off-bus input/output ports
JP2004519675A (ja) * 2001-03-08 2004-07-02 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ 試験可能な電子デバイスの試験方法
US8046648B1 (en) * 2006-06-12 2011-10-25 Russell Robert J Method and apparatus for controlling operating modes of an electronic device

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3815025A (en) * 1971-10-18 1974-06-04 Ibm Large-scale integrated circuit testing structure
FR2330014A1 (fr) * 1973-05-11 1977-05-27 Ibm France Procede de test de bloc de circuits logiques integres et blocs en faisant application
US3961254A (en) * 1974-12-20 1976-06-01 International Business Machines Corporation Testing embedded arrays
GB1536147A (en) * 1975-07-02 1978-12-20 Int Computers Ltd Data processing systems
US4340857A (en) * 1980-04-11 1982-07-20 Siemens Corporation Device for testing digital circuits using built-in logic block observers (BILBO's)
US4504784A (en) * 1981-07-02 1985-03-12 International Business Machines Corporation Method of electrically testing a packaging structure having N interconnected integrated circuit chips

Also Published As

Publication number Publication date
JPH0374796B2 (cs) 1991-11-28
AU555808B2 (en) 1986-10-09
EP0109770B1 (en) 1986-12-30
EP0109770A2 (en) 1984-05-30
DE3368770D1 (en) 1987-02-05
EP0109770A3 (en) 1984-07-11
US4566104A (en) 1986-01-21
JPS59105571A (ja) 1984-06-18
AU2150383A (en) 1984-05-24

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