GB1536147A - Data processing systems - Google Patents

Data processing systems

Info

Publication number
GB1536147A
GB1536147A GB27875/75A GB2787575A GB1536147A GB 1536147 A GB1536147 A GB 1536147A GB 27875/75 A GB27875/75 A GB 27875/75A GB 2787575 A GB2787575 A GB 2787575A GB 1536147 A GB1536147 A GB 1536147A
Authority
GB
United Kingdom
Prior art keywords
contents
loop
register
data processing
test register
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB27875/75A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Services Ltd
Original Assignee
Fujitsu Services Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Services Ltd filed Critical Fujitsu Services Ltd
Priority to GB27875/75A priority Critical patent/GB1536147A/en
Priority to DE2625183A priority patent/DE2625183C3/en
Priority to AU14847/76A priority patent/AU496167B2/en
Priority to IN1054/CAL/76A priority patent/IN146000B/en
Priority to CH826676A priority patent/CH612279A5/en
Priority to ZA763850A priority patent/ZA763850B/en
Publication of GB1536147A publication Critical patent/GB1536147A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test

Abstract

In the data processing device, the internal registers are formed by shift registers which are connected via a test register to form a loop. If someone wishes to view the contents of a required internal register, the contents of the loop are rotated until the desired register contents appear in the test register. The contents of the loop can be rotated via a secondary path (8) without passing through the test register (6). The contents of the loop can thus be rotated while the contents of the test register can still be viewed, thus saving time. <IMAGE>
GB27875/75A 1975-07-02 1975-07-02 Data processing systems Expired GB1536147A (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
GB27875/75A GB1536147A (en) 1975-07-02 1975-07-02 Data processing systems
DE2625183A DE2625183C3 (en) 1975-07-02 1976-06-04 Data processing device
AU14847/76A AU496167B2 (en) 1975-07-02 1976-06-11 Improvements in or relating to data processing systems
IN1054/CAL/76A IN146000B (en) 1975-07-02 1976-06-16
CH826676A CH612279A5 (en) 1975-07-02 1976-06-28 Data processing device with a test device in which the data can be displayed or modified
ZA763850A ZA763850B (en) 1975-07-02 1976-06-28 Improvements in or relating to data processing systems

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB27875/75A GB1536147A (en) 1975-07-02 1975-07-02 Data processing systems

Publications (1)

Publication Number Publication Date
GB1536147A true GB1536147A (en) 1978-12-20

Family

ID=10266707

Family Applications (1)

Application Number Title Priority Date Filing Date
GB27875/75A Expired GB1536147A (en) 1975-07-02 1975-07-02 Data processing systems

Country Status (5)

Country Link
CH (1) CH612279A5 (en)
DE (1) DE2625183C3 (en)
GB (1) GB1536147A (en)
IN (1) IN146000B (en)
ZA (1) ZA763850B (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0031501A2 (en) * 1979-12-28 1981-07-08 International Business Machines Corporation Diagnostic and debugging arrangement for a data processing system
GB2121997A (en) * 1982-06-11 1984-01-04 Int Computers Ltd Testing modular data processing systems
EP0109770A2 (en) * 1982-11-20 1984-05-30 International Computers Limited Testing digital electronic circuits
US4692897A (en) * 1984-09-04 1987-09-08 Gte Communication Systems Corporation Arrangement for dynamic range checking or matching for digital values in a software system
EP0347906A2 (en) * 1988-06-22 1989-12-27 Kabushiki Kaisha Toshiba Self-diagnostic circuit for logic circuit block
WO2007010493A2 (en) 2005-07-22 2007-01-25 Nxp B.V. Testable integrated circuit, system in package and test instruction set

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3373729D1 (en) * 1983-12-08 1987-10-22 Ibm Deutschland Testing and diagnostic device for a digital calculator
EP0151653B1 (en) * 1983-12-15 1987-09-16 International Business Machines Corporation Series-parallel/parallel-series device for variable bit length configuration

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0031501A2 (en) * 1979-12-28 1981-07-08 International Business Machines Corporation Diagnostic and debugging arrangement for a data processing system
EP0031501B1 (en) * 1979-12-28 1984-08-22 International Business Machines Corporation Diagnostic and debugging arrangement for a data processing system
GB2121997A (en) * 1982-06-11 1984-01-04 Int Computers Ltd Testing modular data processing systems
EP0109770A2 (en) * 1982-11-20 1984-05-30 International Computers Limited Testing digital electronic circuits
EP0109770B1 (en) * 1982-11-20 1986-12-30 International Computers Limited Testing digital electronic circuits
US4692897A (en) * 1984-09-04 1987-09-08 Gte Communication Systems Corporation Arrangement for dynamic range checking or matching for digital values in a software system
EP0347906A2 (en) * 1988-06-22 1989-12-27 Kabushiki Kaisha Toshiba Self-diagnostic circuit for logic circuit block
EP0347906A3 (en) * 1988-06-22 1991-03-27 Kabushiki Kaisha Toshiba Self-diagnostic circuit for logic circuit block
WO2007010493A2 (en) 2005-07-22 2007-01-25 Nxp B.V. Testable integrated circuit, system in package and test instruction set
WO2007010493A3 (en) * 2005-07-22 2007-06-07 Nxp Bv Testable integrated circuit, system in package and test instruction set
US7948243B2 (en) 2005-07-22 2011-05-24 Nxp B.V. Testable integrated circuit, system in package and test instruction set
CN101228451B (en) * 2005-07-22 2011-07-27 Nxp股份有限公司 Testable integrated circuit, system in package and test instruction set
US8653847B2 (en) 2005-07-22 2014-02-18 Nxp, B.V. Testable integrated circuit, system in package and test instruction set

Also Published As

Publication number Publication date
CH612279A5 (en) 1979-07-13
AU1484776A (en) 1977-12-15
DE2625183C3 (en) 1979-07-19
ZA763850B (en) 1977-05-25
IN146000B (en) 1979-02-03
DE2625183A1 (en) 1977-01-13
DE2625183B2 (en) 1978-11-16

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Legal Events

Date Code Title Description
PS Patent sealed
PE20 Patent expired after termination of 20 years

Effective date: 19960616