IN146000B - - Google Patents
Info
- Publication number
- IN146000B IN146000B IN1054/CAL/76A IN1054CA1976A IN146000B IN 146000 B IN146000 B IN 146000B IN 1054CA1976 A IN1054CA1976 A IN 1054CA1976A IN 146000 B IN146000 B IN 146000B
- Authority
- IN
- India
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318558—Addressing or selecting of subparts of the device under test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB27875/75A GB1536147A (en) | 1975-07-02 | 1975-07-02 | Data processing systems |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IN146000B true IN146000B (en) | 1979-02-03 |
Family
ID=10266707
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IN1054/CAL/76A IN146000B (en) | 1975-07-02 | 1976-06-16 |
Country Status (5)
| Country | Link |
|---|---|
| CH (1) | CH612279A5 (en) |
| DE (1) | DE2625183C3 (en) |
| GB (1) | GB1536147A (en) |
| IN (1) | IN146000B (en) |
| ZA (1) | ZA763850B (en) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4312066A (en) * | 1979-12-28 | 1982-01-19 | International Business Machines Corporation | Diagnostic/debug machine architecture |
| GB2121997B (en) * | 1982-06-11 | 1985-10-09 | Int Computers Ltd | Testing modular data processing systems |
| EP0109770B1 (en) * | 1982-11-20 | 1986-12-30 | International Computers Limited | Testing digital electronic circuits |
| EP0146645B1 (en) * | 1983-12-08 | 1987-09-16 | Ibm Deutschland Gmbh | Testing and diagnostic device for a digital calculator |
| DE3373730D1 (en) * | 1983-12-15 | 1987-10-22 | Ibm | Series-parallel/parallel-series device for variable bit length configuration |
| US4692897A (en) * | 1984-09-04 | 1987-09-08 | Gte Communication Systems Corporation | Arrangement for dynamic range checking or matching for digital values in a software system |
| KR920009635B1 (en) * | 1988-06-22 | 1992-10-22 | 가부시키가이샤 도시바 | Self-diagnostic circuit for logic block |
| TW200708750A (en) | 2005-07-22 | 2007-03-01 | Koninkl Philips Electronics Nv | Testable integrated circuit, system in package and test instruction set |
-
1975
- 1975-07-02 GB GB27875/75A patent/GB1536147A/en not_active Expired
-
1976
- 1976-06-04 DE DE2625183A patent/DE2625183C3/en not_active Expired
- 1976-06-16 IN IN1054/CAL/76A patent/IN146000B/en unknown
- 1976-06-28 CH CH826676A patent/CH612279A5/en not_active IP Right Cessation
- 1976-06-28 ZA ZA763850A patent/ZA763850B/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| DE2625183B2 (en) | 1978-11-16 |
| AU1484776A (en) | 1977-12-15 |
| DE2625183A1 (en) | 1977-01-13 |
| DE2625183C3 (en) | 1979-07-19 |
| GB1536147A (en) | 1978-12-20 |
| CH612279A5 (en) | 1979-07-13 |
| ZA763850B (en) | 1977-05-25 |