ZA202211021B - Rotatable sample stage for matching vertical goniometers in x-ray diffraction analysis - Google Patents
Rotatable sample stage for matching vertical goniometers in x-ray diffraction analysisInfo
- Publication number
- ZA202211021B ZA202211021B ZA2022/11021A ZA202211021A ZA202211021B ZA 202211021 B ZA202211021 B ZA 202211021B ZA 2022/11021 A ZA2022/11021 A ZA 2022/11021A ZA 202211021 A ZA202211021 A ZA 202211021A ZA 202211021 B ZA202211021 B ZA 202211021B
- Authority
- ZA
- South Africa
- Prior art keywords
- goniometers
- ray diffraction
- sample stage
- diffraction analysis
- rotatable sample
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111181526.0A CN113945594B (zh) | 2021-10-11 | 2021-10-11 | 用于装配垂直型测角仪的x射线衍射分析用旋转样品台 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ZA202211021B true ZA202211021B (en) | 2022-12-21 |
Family
ID=79330333
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ZA2022/11021A ZA202211021B (en) | 2021-10-11 | 2022-10-10 | Rotatable sample stage for matching vertical goniometers in x-ray diffraction analysis |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN113945594B (zh) |
| ZA (1) | ZA202211021B (zh) |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5127039A (en) * | 1991-01-16 | 1992-06-30 | The United States Of America As Represented By The United States Department Of Energy | Sample holder for X-ray diffractometry |
| WO2000023795A1 (en) * | 1998-10-21 | 2000-04-27 | Glaxo Group Limited | Environmentally controllable sample holder for x-ray diffractometer (xrd) |
| CN2746387Y (zh) * | 2004-08-25 | 2005-12-14 | 辽宁石油化工大学 | X射线衍射仪测定固体块状样品用样品架 |
| CN2840028Y (zh) * | 2005-10-17 | 2006-11-22 | 马鞍山钢铁股份有限公司 | X射线衍射仪用旋转样品台 |
| CN103293173B (zh) * | 2013-06-03 | 2015-05-13 | 深圳大学 | 一种x射线衍射仪薄膜测试样品台 |
| CN103983653B (zh) * | 2014-05-29 | 2016-08-31 | 中国科学院青海盐湖研究所 | X射线衍射仪用测量块状固体样品的多功能样品台 |
| CN211627417U (zh) * | 2019-12-26 | 2020-10-02 | 安徽科技学院 | 一种用于块体材料精密x射线衍射测试的样品架 |
| CN111487269A (zh) * | 2020-06-02 | 2020-08-04 | 深圳市合众清洁能源研究院 | 一种x射线衍射样品台 |
-
2021
- 2021-10-11 CN CN202111181526.0A patent/CN113945594B/zh active Active
-
2022
- 2022-10-10 ZA ZA2022/11021A patent/ZA202211021B/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| CN113945594B (zh) | 2023-03-24 |
| CN113945594A (zh) | 2022-01-18 |
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