ZA202211021B - Rotatable sample stage for matching vertical goniometers in x-ray diffraction analysis - Google Patents

Rotatable sample stage for matching vertical goniometers in x-ray diffraction analysis

Info

Publication number
ZA202211021B
ZA202211021B ZA2022/11021A ZA202211021A ZA202211021B ZA 202211021 B ZA202211021 B ZA 202211021B ZA 2022/11021 A ZA2022/11021 A ZA 2022/11021A ZA 202211021 A ZA202211021 A ZA 202211021A ZA 202211021 B ZA202211021 B ZA 202211021B
Authority
ZA
South Africa
Prior art keywords
goniometers
ray diffraction
sample stage
diffraction analysis
rotatable sample
Prior art date
Application number
ZA2022/11021A
Inventor
Teng Guo
Yibo Wang
Yongxin Du
Jingyong Wu
Xuchun Wang
Original Assignee
Univ Anhui Science & Tech
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Anhui Science & Tech filed Critical Univ Anhui Science & Tech
Publication of ZA202211021B publication Critical patent/ZA202211021B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025Sample holders or supports therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
ZA2022/11021A 2021-10-11 2022-10-10 Rotatable sample stage for matching vertical goniometers in x-ray diffraction analysis ZA202211021B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202111181526.0A CN113945594B (en) 2021-10-11 2021-10-11 Rotary sample table for X-ray diffraction analysis for assembling vertical goniometer

Publications (1)

Publication Number Publication Date
ZA202211021B true ZA202211021B (en) 2022-12-21

Family

ID=79330333

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA2022/11021A ZA202211021B (en) 2021-10-11 2022-10-10 Rotatable sample stage for matching vertical goniometers in x-ray diffraction analysis

Country Status (2)

Country Link
CN (1) CN113945594B (en)
ZA (1) ZA202211021B (en)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5127039A (en) * 1991-01-16 1992-06-30 The United States Of America As Represented By The United States Department Of Energy Sample holder for X-ray diffractometry
WO2000023795A1 (en) * 1998-10-21 2000-04-27 Glaxo Group Limited Environmentally controllable sample holder for x-ray diffractometer (xrd)
CN2746387Y (en) * 2004-08-25 2005-12-14 辽宁石油化工大学 Sample stand for investigating solid block sample by X-ray diffractometer
CN2840028Y (en) * 2005-10-17 2006-11-22 马鞍山钢铁股份有限公司 Rotary sample table for X-ray diffractometer
CN103293173B (en) * 2013-06-03 2015-05-13 深圳大学 Thin film test sample platform of X-ray diffraction instrument
CN103983653B (en) * 2014-05-29 2016-08-31 中国科学院青海盐湖研究所 The X-ray diffractometer multifunctional sample platform measuring block solid sample
CN211627417U (en) * 2019-12-26 2020-10-02 安徽科技学院 Sample rack for block material precision X-ray diffraction test
CN111487269A (en) * 2020-06-02 2020-08-04 深圳市合众清洁能源研究院 X-ray diffraction sample stage

Also Published As

Publication number Publication date
CN113945594B (en) 2023-03-24
CN113945594A (en) 2022-01-18

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