CN2746387Y - Sample stand for investigating solid block sample by X-ray diffractometer - Google Patents
Sample stand for investigating solid block sample by X-ray diffractometer Download PDFInfo
- Publication number
- CN2746387Y CN2746387Y CN 200420092151 CN200420092151U CN2746387Y CN 2746387 Y CN2746387 Y CN 2746387Y CN 200420092151 CN200420092151 CN 200420092151 CN 200420092151 U CN200420092151 U CN 200420092151U CN 2746387 Y CN2746387 Y CN 2746387Y
- Authority
- CN
- China
- Prior art keywords
- sample
- solid block
- specimen holder
- ray diffractometer
- pedestal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model discloses a sample stand for investigating solid block sample by x-ray diffractometer, comprising a base, a datum baffler frame for the sample test surface and a pressure spring guide rod for fixing the block sample. The utility model has the advantages of simple processing, and convenient loading and unloading, with the practical application value. The utility model does not need to reform the sample table of the original x-ray diffractometer and the angle measurer. The inserting plate(6)at the right end of the base of the sample stand for the solid block sample is directly inserted into the slot of the sample plate of the sample table of the original instrument. The support board(9) on the left end falls on the rotary disc of the theta shaft of the angle measurer, and the upper plate surface of the base and the lower plate surface of the datum baffler frame for the sample test surface are riveted or adhesively fixed by the adhesives in the horizontal position. The external side of the right end(6) of the base and the internal side of the datum baffler frame(3 5) for the sample test surface are positioned at the same vertical plane, ensuring that the test surface of the solid block sample accords with the test requirement.
Description
One, technical field
The utility model relates to a kind of X-ray diffractometer and measures solid block sample specimen holder.
Two, background technology
Shallow slot glass sheet sample frame that the diffractometer of X-ray diffractometer such as D/max-A, B, C, 1000 and 2000 serial diffractometers and other brand provides and hollow aluminium sheet specimen holder are the specimen holder of powdered sample test usefulness.
To solid block sample less than 18 * 20mm plane to be tested, adoptable method is under the condition at present: put the solid block sample in the sample well of hollow aluminium sheet specimen holder, fix the back overleaf with plasticine and go up the machine test, but it is bigger to the sample deadweight, test surfaces off-centre in the test process often occurs and cause the test result distortion, (the machine test can't directly be gone up greater than 18 * 20mm) solid block sample in plane to be tested greatly and to size, need carry out just testing after the cutting process to sample, so can not carry out non-destructive testing to the bigger solid block sample of part, limit the diffractometer range of application.Simple, the Practical Method of seeking big solid block sample are technical matterss that presses for solution in X-ray diffraction field.
Three, summary of the invention
The utility model relates to a kind of X-ray diffractometer mensuration solid block sample specimen holder simple, easy to loading and unloading of processing, and key is to design a kind of solid block sample specimen holder that has sample test face benchmark baffle plate.Specimen holder is made of pedestal, sample test face benchmark baffle plate frame and stage clip guide rod three parts that are used for fixing bulk sample.
The utility model does not need former angular instrument sample stage is transformed, the right plate of the pedestal of this specimen holder (6) directly inserts in the sample panel slot of former instrument sample stage, be easy to install and unloading, left end back up pad (9) drops on the θ axle rotating disk of angular instrument, and the lower face of pedestal upper face and sample test face benchmark baffle plate frame is carried out riveted or is adhesively fixed and is horizontal with bonding agent.
The outside of the right plate of pedestal (6) and the inboard of sample test face benchmark baffle plate (3,5) are in same vertical plane, to guarantee that solid block product sample test face meets the basic demand of test, the open height a=16mm of benchmark baffle plate, A/F 25mm＜b＜60mm, open centre (4) is the intrafascicular heart of incident X-rays, and the stage clip guide rod axis that is used for fixing bulk sample passes open centre (4).
The utility model is applicable to that great majority are equipped with the X-ray diffractometer of horizontal angular instrument, according to the needs of bulk sample range of size in its concrete raw sample platform parameter and the actual test process, carry out processing and fabricating and meet the solid block sample specimen holder of measuring requirement.
Four, description of drawings
Fig. 1 is the utility model structural representation (each knuckle of pedestal and sample test face benchmark baffle plate frame is 90 °).
Five, embodiment
As seen from Figure 1, the utility model X-ray diffractometer is measured the solid block sample and is comprised pedestal (6,9), is installed in the sample test face benchmark baffle plate frame (3,5) on the pedestal with specimen holder, in the left side of sample test face benchmark baffle plate frame, open a circular hole that is suitable for installing and fixing stage clip (7) guide rod (11) of bulk sample with same axis place, right openings center (4) (10).The diameter 3mm of stage clip guide rod, at the top of its right-hand member welding garden plate (thickness 2mm is outward through 20mm) (1), and at its front end stickup rubber blanket (thickness 10mm is outward through 20mm) (2), handle of left end welding of guide rod.
The stage clip that selection intensity is suitable, promptly at the effect rubber blanket by stage clip under the n.s. state just with lighter pressure extrusion lower limb to the sample test face benchmark baffle plate.
Pedestal and sample test face benchmark baffle plate frame all adopt stainless steel or the aluminium alloy plate of thickness 2mm, the lower face of the upper face of pedestal and sample test face benchmark baffle plate frame is adhesively fixed in suitable four position riveteds (8) or with bonding agent, by adjusting d, f numerical value, make the difference of f and d equal the height number of raw sample platform slot bottom, be horizontal to guarantee base platform apart from θ axle rotating disk.
The inboard of the outside of pedestal right-hand member plate (6) and sample test face benchmark baffle plate (3,5) is in same vertical plane, the solid block sample inserts in the sample panel slot of former instrument sample stage with the pedestal right-hand member (6) of specimen holder, and left end back up pad (9) drops on the θ axle rotating disk of angular instrument.
For D/max-A, B and C series diffractometer, the solid block sample with the processing technology reference parameter of specimen holder is: the open height a=16mm of sample test face benchmark baffle plate, width b=50mm, the high c=5mm of lower baffle plate, the right plate d=18mm of pedestal, pedestal left side back up pad f=49mm, the long e=60mm of pedestal, baffle plate frame height overall g=60mm, the height of overhead gage is g-a-c=60-16-5=39mm.
Can be according to the parameter of the X-ray diffractometer angular instrument sample stage of concrete brand and the needs of practical measurement solid block sample size scope, determine the concrete machined parameters (a, b, c, d, e, f and g) of solid block specimen holder, but the sample test face of assurance benchmark baffle openings center (4) is the intrafascicular heart of incident X-rays, open height a can not be less than 16mm, otherwise X-ray beam incides on the examination face benchmark baffle plate.
Claims (5)
1, a kind of X-ray diffractometer is measured solid block sample specimen holder, it is characterized in that: comprise pedestal (6,9), be installed in the sample test face benchmark baffle plate (3,5) on the pedestal and be used for fixing the stage clip guide rod (11) of bulk sample, pedestal and sample test face benchmark baffle plate frame adopt good stainless steel or the aluminium alloy plate of rigidity.
2, X-ray diffractometer as claimed in claim 1 is measured solid block sample specimen holder, and garden, the top plate (1) that is used for fixing the stage clip guide rod of bulk sample on the specimen holder is gone up stickup rubber blanket (2).
3, X-ray diffractometer as claimed in claim 1 is measured solid block sample specimen holder, the pedestal right-hand member plate (6) of specimen holder inserts in the sample panel slot of former instrument sample stage, left end back up pad (9) drops on the θ axle rotating disk of angular instrument, the lower face of pedestal upper face and sample test face benchmark baffle plate frame is carried out riveted or is adhesively fixed and is horizontal.
4, X-ray diffractometer as claimed in claim 1 is measured solid block sample specimen holder, and the inboard of the outside of the pedestal right-hand member (6) of specimen holder and sample test face benchmark baffle plate (3,5) is in same vertical plane.
5, X-ray diffractometer as claimed in claim 1 is measured solid block sample specimen holder, the open height a=16mm of the sample test face benchmark baffle plate of specimen holder, and A/F 25mm＜b＜60mm, open centre (4) is the intrafascicular heart of incident X-rays.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200420092151 CN2746387Y (en) | 2004-08-25 | 2004-08-25 | Sample stand for investigating solid block sample by X-ray diffractometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200420092151 CN2746387Y (en) | 2004-08-25 | 2004-08-25 | Sample stand for investigating solid block sample by X-ray diffractometer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2746387Y true CN2746387Y (en) | 2005-12-14 |
Family
ID=35582966
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200420092151 Expired - Fee Related CN2746387Y (en) | 2004-08-25 | 2004-08-25 | Sample stand for investigating solid block sample by X-ray diffractometer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2746387Y (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103293173A (en) * | 2013-06-03 | 2013-09-11 | 深圳大学 | Thin film test sample platform of X-ray diffraction instrument |
| CN103983653A (en) * | 2014-05-29 | 2014-08-13 | 中国科学院青海盐湖研究所 | Multifunctional sample stage for measuring block-shaped solid sample in X-ray diffractometer |
| CN106918608A (en) * | 2015-12-24 | 2017-07-04 | 中国科学院大连化学物理研究所 | Large sample X-ray diffraction material phase analysis support |
| CN113945594A (en) * | 2021-10-11 | 2022-01-18 | 安徽科技学院 | Rotary sample table for X-ray diffraction analysis for assembling vertical goniometer |
-
2004
- 2004-08-25 CN CN 200420092151 patent/CN2746387Y/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103293173A (en) * | 2013-06-03 | 2013-09-11 | 深圳大学 | Thin film test sample platform of X-ray diffraction instrument |
| CN103293173B (en) * | 2013-06-03 | 2015-05-13 | 深圳大学 | Thin film test sample platform of X-ray diffraction instrument |
| CN103983653A (en) * | 2014-05-29 | 2014-08-13 | 中国科学院青海盐湖研究所 | Multifunctional sample stage for measuring block-shaped solid sample in X-ray diffractometer |
| CN106918608A (en) * | 2015-12-24 | 2017-07-04 | 中国科学院大连化学物理研究所 | Large sample X-ray diffraction material phase analysis support |
| CN113945594A (en) * | 2021-10-11 | 2022-01-18 | 安徽科技学院 | Rotary sample table for X-ray diffraction analysis for assembling vertical goniometer |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C19 | Lapse of patent right due to non-payment of the annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |