CN202453307U - Sample table suitable for measuring small irregular solids by X-ray diffractometer - Google Patents
Sample table suitable for measuring small irregular solids by X-ray diffractometer Download PDFInfo
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- CN202453307U CN202453307U CN 201120555019 CN201120555019U CN202453307U CN 202453307 U CN202453307 U CN 202453307U CN 201120555019 CN201120555019 CN 201120555019 CN 201120555019 U CN201120555019 U CN 201120555019U CN 202453307 U CN202453307 U CN 202453307U
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Abstract
The utility model discloses a sample table which is suitable for measuring small irregular solids by an X-ray diffractometer. The sample table consists of a sample table main body and a groove, wherein the groove is positioned in the center of the sample table main body; the depth of the groove is 2 to 25 millimeters, and the outer edge of the groove is provided with positioning marks; the sample table main body consists of a sample table base and a measuring surface which does not have a clear X-ray diffraction signal and an intense background; the measuring surface is fixedly connected with the upper surface of the sample table base by a mucilage glue layer; and the shape and size of the outer edge of the measuring surface are the same as those of the outer edge of the sample table base. The sample table has the advantages that 1, the problem that small irregular solid samples cannot be measured by the conventional standard sample table is solved; 2, the production cost is low; 3, the samples are fixed by using plasticine in a sample groove, the height of the samples can be adjusted according to requirements, and the fixing of the irregular samples is ensured; 4, the small irregular solid samples are positioned accurately; and 5, the sample table is easy to manufacture and operate.
Description
(1) technical field:
The utility model relates to X ray polycrystalline diffractometry technical field, and particularly a kind of suitable X-ray diffractometer is measured the sample stage of the irregular solid of fritter.
(2) background technology:
X ray polycrystalline diffractometer is a kind of broad-spectrum surveying instrument; It is the important tool that characterizes the polycrystalline aggregate structure; Be widely used in industries such as metallurgy, chemical industry, environmental protection, the energy, biological medicine industry and semiconductor now, become the indispensable instrument of many research institutions and plant laboratory.
The normal standard model platform (see figure 1) that adopts in X ray polycrystalline diffractometry, its top is fixed through three duckpins in instrument specimen holder top, and the below utilizes fixedly (see figure 2) of a telescopic spring tray.Wherein dash area is the dark groove of 2mm, is mainly used in the placement sample, and this standard model platform only is fit to place powdered sample or thin bulk sample.Because sample analysis plane and sample stage plane must remain in the same plane; Can directly be contained on the specimen holder greater than the irregular solid sample of 30mm * 40mm for planar dimension and to measure; And to the fritter irregular solid sample of measurement plane less than 30mm * 40mm; Because the sample analysis plane can not remain on same surface level with measurement plane, the diffraction peak of measuring will integral body depart to the left or to the right, and diffraction peak intensity acutely descends; When two levels differ big, just can't collect the associated diffraction signal, therefore design one rationally the irregular solid sample platform of measurement fritter become and be engaged in pressing for of X-ray diffraction Measurement and analysis personnel.
(3) utility model content:
The purpose of the utility model provides the sample stage that a kind of suitable X-ray diffractometer is measured the irregular solid of fritter, it can be on X-ray diffractometer measurement plane less than the irregular solid sample of fritter of 30mm * 40mm.
The technical scheme of the utility model: a kind of suitable X-ray diffractometer is measured the sample stage of the irregular solid of fritter; It is applicable to meet that how much in Prague-Bo Lang Tylenol (B-B) diffraction and sample stage keep that horizontal level is motionless, general diffractometer that X source and detector are done θ-θ scanning; Be fixed between three duckpins and spring tray on the test desk in the general diffractometer; It is characterized in that it is made up of sample stage main body and groove; Said groove is positioned at the center of sample stage main body; The degree of depth of groove is 2-25mm, and the outer rim of groove has the location to indicate, and said sample stage main body is made up of the surface measurements of sample stage base with no obvious X-ray diffraction signal and strong background; Said surface measurements is fixedly connected according to the upper surface of adhesive-layer with the sample stage base, and the outer rim of surface measurements is identical with the outer rim shape and size of sample stage base.
The general diffractometer of above-mentionedly saidly meet that how much in Prague-Bo Lang Tylenol (B-B) diffraction and sample stage keep that horizontal level is motionless, X source and detector being done θ-θ scanning is the general diffractometer of Bruker-AXS D8 Advance.
The profile of above-mentioned said sample stage main body is a rectangular parallelepiped, and long is 50mm, and wide is 50mm, and height is 30mm.
Being shaped as of above-mentioned said groove is cylindrical, and the diameter in its cross section is 20-25mm.
The principle of work of the utility model: in the cylinder groove of sample stage, place an amount of plasticine; Place the center of cylinder groove to fix the irregular solid sample of fritter according to sample stage location sign; Make the sample measurement surface a little more than the sample stage surface simultaneously; Get a microslide with sample flatten to the sample stage flush, utilize three duckpins and spring tray on the test desk that sample stage is fixed at last and get final product.
The superiority of the utility model: 1, deepened the degree of depth of groove, solved the problem that the prior standard sample stage can't be measured fritter irregular solid sample; 2, only use the material of no obvious X-ray diffraction signal and strong background, can reduce production costs in surface measurements; 3, because the scalability and the cementation of plasticine adopt the plasticine fixed sample in sample cell, can adjust the height of sample as required, also guarantee the fixing of irregular sample; 4, the location of sample stage groove outer rim indicates and has guaranteed that the irregular solid sample of fritter can accurately be positioned x-ray bombardment scope center when mounted; 4, this sample stage is made simple, easy operating, for being engaged in the X-ray diffraction surveying work novelty instrument easily is provided.
(4) description of drawings:
Fig. 1 is the structural representation of standard model platform.
Fig. 2 is the structural representation of the test desk in the general diffractometer.
Fig. 3 is the structural representation that the related a kind of suitable X-ray diffractometer of the utility model is measured the sample stage of the irregular solid of fritter.
Wherein 1 is duckpin, and 2 is spring tray, and 3 is the sample stage main body, and 3-1 is the sample stage base, and 3-2 is a surface measurements, and 4 is groove, and 5 are the location sign.
(5) embodiment:
Embodiment: a kind of suitable X-ray diffractometer is measured the sample stage (see figure 3) of the irregular solid of fritter; It is applicable to meet that how much in Prague-Bo Lang Tylenol (B-B) diffraction and sample stage keep that horizontal level is motionless, general diffractometer that X source and detector are done θ-θ scanning; Be fixed on (see figure 2) between three duckpins and the spring tray on the test desk in the general diffractometer; It is characterized in that it is made up of sample stage main body 3 and groove 4; Said groove 4 is positioned at the center of sample stage main body 3; The degree of depth of groove 4 is 25mm, and the outer rim of groove 4 has the location to indicate 5, and said sample stage main body 3 is made up of the sample stage base 3-1 and the surface measurements 3-2 of no obvious X-ray diffraction signal and strong background; Said surface measurements 3-2 is fixedly connected according to the upper surface of adhesive-layer with sample stage base 3-1, and the outer rim of surface measurements 3-2 is identical with the outer rim shape and size of sample stage base 3-1.
The general diffractometer of above-mentionedly saidly meet that how much in Prague-Bo Lang Tylenol (B-B) diffraction and sample stage keep that horizontal level is motionless, X source and detector being done θ-θ scanning is the general diffractometer of Bruker-AXS D8 Advance.
The profile of above-mentioned said sample stage main body 3 is a rectangular parallelepiped, and long is 50mm, and wide is 50mm, and height is 30mm.
Being shaped as of above-mentioned said groove 4 is cylindrical, and the diameter in its cross section is 25mm.
Claims (4)
1. a suitable X-ray diffractometer is measured the sample stage of the irregular solid of fritter; It is applicable to meet that how much in Prague-Bo Lang Tylenol (B-B) diffraction and sample stage keep that horizontal level is motionless, general diffractometer that X source and detector are done θ-θ scanning; Be fixed between three duckpins and spring tray on the test desk in the general diffractometer; It is characterized in that it is made up of sample stage main body and groove, said groove is positioned at the center of sample stage main body, and the degree of depth of groove is 2-25mm; The outer rim of groove has the location to indicate; Said sample stage main body is made up of the surface measurements of sample stage base with no obvious X-ray diffraction signal and strong background, and said surface measurements is fixedly connected according to the upper surface of adhesive-layer with the sample stage base, and the outer rim of surface measurements is identical with the outer rim shape and size of sample stage base.
2. measure the sample stage of the irregular solid of fritter according to the said a kind of suitable X-ray diffractometer of claim 1, the general diffractometer of it is characterized in that saidly meeting that Prague-how much of Bo Lang Tylenol (B-B) diffraction and sample stage keep that horizontal level is motionless, X source and detector being done θ-θ scanning is the general diffractometer of Bruker-AXS D8 Advance.
3. measure the sample stage of the irregular solid of fritter according to the said a kind of suitable X-ray diffractometer of claim 1, the profile that it is characterized in that said sample stage main body is a rectangular parallelepiped, and long is 50mm, and wide is 50mm, and height is 30mm.
4. measure the sample stage of the irregular solid of fritter according to the said a kind of suitable X-ray diffractometer of claim 1, it is characterized in that being shaped as of said groove is cylindrical, the diameter in its cross section is 20-25mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201120555019 CN202453307U (en) | 2011-12-27 | 2011-12-27 | Sample table suitable for measuring small irregular solids by X-ray diffractometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201120555019 CN202453307U (en) | 2011-12-27 | 2011-12-27 | Sample table suitable for measuring small irregular solids by X-ray diffractometer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202453307U true CN202453307U (en) | 2012-09-26 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201120555019 Expired - Fee Related CN202453307U (en) | 2011-12-27 | 2011-12-27 | Sample table suitable for measuring small irregular solids by X-ray diffractometer |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103901062A (en) * | 2014-03-05 | 2014-07-02 | 中国科学院青海盐湖研究所 | Sample platform mounted on powder X-ray diffractometer and used for testing solid block-shaped sample |
| CN103983653A (en) * | 2014-05-29 | 2014-08-13 | 中国科学院青海盐湖研究所 | Multifunctional sample stage for measuring block-shaped solid sample in X-ray diffractometer |
| CN104020027A (en) * | 2014-06-06 | 2014-09-03 | 酒泉钢铁(集团)有限责任公司 | D8-Advance diffraction instrument sample clamp and use method thereof |
| CN106876234A (en) * | 2017-04-17 | 2017-06-20 | 南京大学 | A kind of sample stage for the analysis of mineral facies automatic identification |
| CN109062418A (en) * | 2018-06-27 | 2018-12-21 | 河南孚点电子科技有限公司 | A kind of keyboard support of belt variable shape hand rest |
| CN109540943A (en) * | 2018-11-20 | 2019-03-29 | 中国航发贵州黎阳航空动力有限公司 | A kind of sample stage improving single-crystal orientation precision and efficiency of detecting |
-
2011
- 2011-12-27 CN CN 201120555019 patent/CN202453307U/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103901062A (en) * | 2014-03-05 | 2014-07-02 | 中国科学院青海盐湖研究所 | Sample platform mounted on powder X-ray diffractometer and used for testing solid block-shaped sample |
| CN103983653A (en) * | 2014-05-29 | 2014-08-13 | 中国科学院青海盐湖研究所 | Multifunctional sample stage for measuring block-shaped solid sample in X-ray diffractometer |
| CN104020027A (en) * | 2014-06-06 | 2014-09-03 | 酒泉钢铁(集团)有限责任公司 | D8-Advance diffraction instrument sample clamp and use method thereof |
| CN106876234A (en) * | 2017-04-17 | 2017-06-20 | 南京大学 | A kind of sample stage for the analysis of mineral facies automatic identification |
| CN106876234B (en) * | 2017-04-17 | 2018-06-26 | 南京大学 | A kind of sample stage for the analysis of mineral facies automatic identification |
| CN109062418A (en) * | 2018-06-27 | 2018-12-21 | 河南孚点电子科技有限公司 | A kind of keyboard support of belt variable shape hand rest |
| CN109540943A (en) * | 2018-11-20 | 2019-03-29 | 中国航发贵州黎阳航空动力有限公司 | A kind of sample stage improving single-crystal orientation precision and efficiency of detecting |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120926 Termination date: 20151227 |
|
| EXPY | Termination of patent right or utility model |