CN106918608A - Large sample X-ray diffraction material phase analysis support - Google Patents
Large sample X-ray diffraction material phase analysis support Download PDFInfo
- Publication number
- CN106918608A CN106918608A CN201510982237.9A CN201510982237A CN106918608A CN 106918608 A CN106918608 A CN 106918608A CN 201510982237 A CN201510982237 A CN 201510982237A CN 106918608 A CN106918608 A CN 106918608A
- Authority
- CN
- China
- Prior art keywords
- sample
- phase analysis
- material phase
- adjustment mechanism
- height adjustment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
- G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/309—Accessories, mechanical or electrical features support of sample holder
Abstract
The present invention relates to a kind of large sample X-ray diffraction material phase analysis support.Material phase analysis provisioned in commercial X-ray diffractometer are positioned using reed with standard flat sample stage to sample, and due to the limitation of reed elastic force and size, typically in φ below 40, thickness is no more than 100g to the sample size that it can be tested in below 4mm, quality.X-ray diffractometer large sample material phase analysis expandable stent involved in the present invention is the extension to X-ray diffractometer standard flat sample stage, it is support using the rotary shaft of standard flat sample stage, greatly improve the weight capacity of support so that X-ray diffractometer can carry out material phase analysis to large sample.After expandable stent, the size of sample is limited solely by the distance between X-ray incident light section and diffraction light section, and example weight is then deformed into limitation with the rotary shaft that can not cause angular instrument.
Description
Technical field
The present invention relates to X-ray diffraction testing field, and in particular to a kind of large sample material phase analysis expandable stent.
Background technology
Material phase analysis standard sample sample platform its principle provisioned in general business Multi-functional X ray diffractometer (there are Rigaku, German Brooker, Dutch PANalytical in common manufacturer) is as shown in Figure 1.The standard sample sample platform is pressed the lower surface (test benchmark plane) of sample and rotary shaft using spring leaf, it is ensured that test surfaces and test benchmark planes align.During test, the elastic force of spring leaf keeps the fixation of sample, is moved together with rotary shaft.But, the fixed form of sample is limited to, standard sample sample platform has strict requirements to the dimensional weight of test sample：Below 40, thickness is no more than 100g to general φ in below 4mm, quality.This significantly limit the scope of X-ray diffractometer application.
The content of the invention
Large sample X-ray diffraction material phase analysis expandable stent is made up of (as shown in Figure 2) fixing end, three parts of sample holder and height adjustment mechanism.When the material phase analysis of large sample are carried out, the fixing end of expandable stent is inserted the rotary shaft of standard sample sample platform, sample is positioned over sample holder, adjust sample test face using height adjustment mechanism flushes with test benchmark face, is used to ensure that sample test surface is consistent with test benchmark plane.The STP set by X-ray diffractometer can then be started.Therefore, the invention mainly comprises following four technical characteristics：
1st, large sample X-ray diffraction material phase analysis support, including fixing end, sample holder and the height adjustment mechanism that planar sample platform rotary shaft for being carried with X-ray diffractometer is connected；The lower end of fixing end and height adjustment mechanism is connected with a fixed mount, and sample holder is placed in height adjustment mechanism top, and sample holder can be moved up and down by height adjustment mechanism.
The height adjustment mechanism is one or two or more kinds in following structures,
A, it is a fluid cylinder being connected with a liquid source by liquid pump, fluid cylinder two ends are connected with fixed mount and sample holder respectively；
B, it is the screwed leading screw in a lower end, leading screw lower end is screwed with tapped through hole on fixed mount；Leading screw upper end is connected with sample holder lower section.
A blind hole or through hole are carried in the fixing end, rotary shaft is set in blind hole or through hole, fixing end is fetched by the planar sample platform rotary sleeve carried with X-ray diffractometer and fixes and position whole support.
The height that sample adjusts sample holder using height adjustment mechanism is placed using sample holder, is used to ensure that sample test surface is consistent with test benchmark plane
X-ray diffractometer large sample material phase analysis expandable stent involved in the present invention is the extension to X-ray diffractometer standard flat sample stage, it is support using the rotary shaft of standard flat sample stage, greatly improve the weight capacity of support so that X-ray diffractometer can carry out material phase analysis to large sample.After expandable stent, the size of sample is limited solely by the distance between X-ray incident light section and diffraction light section, and example weight is then deformed into limitation with the rotary shaft that can not cause angular instrument.
Brief description of the drawings：
Fixed form of Fig. 1 existing standards sample stage to sample
Fig. 2 large sample X-ray diffraction material phase analysis support theory of constitution figures
The auspicious shadow standard sample sample platform rotary shaft cross sectional dimensions of Fig. 3 PANalyticals；
Fig. 4 fixed supports section；
Sample holders of the Fig. 5 with height adjusting screw rod；
Fig. 6 metal derby test results.
Specific embodiment
Embodiment：
The not clear sheet metals of a diameter of φ 70mm*4mm do material phase analysis, to determine the composition of metal derby.
It is to test above-mentioned metal derby on the auspicious shadow Multi-functional X ray diffractometer of PANalytical, we have manufactured the extension sample stage of following specification.Auspicious shadow standard sample sample platform rotary shaft cross sectional dimensions is shown in Fig. 3：The auspicious shadow standard sample sample platform rotary shaft cross sectional dimensions of Fig. 3 PANalyticals；
The design of the expandable stent various pieces of the present embodiment is as follows：
1st, fixed support (Fig. 4)：Fixed support is engaged by the through hole of a diameter of 25mm with the universal sample platform of XRD equipment, is screwed togather by the tapped through hole and height adjustment mechanism of M6.
2nd, height adjustment mechanism and sample holder：The present embodiment uses relatively simple threaded adjusting, is fixedly connected with the sample holder of diameter 70mm using screw rod one end of M6, and one end screws togather with fixed support.It is the height (sample holders of the Fig. 5 with height adjusting screw rod) of adjustable sample stage by specimen rotating holder.
Metal derby is placed in sample holder during test, rotary sample supporting table causes that metal derby is tested plane and flushed with testing standard face, carries out the thing scanning phase of standard, tests out big metal derby for Mo (Fig. 6 metal derbies test result).
Claims (4)
1. large sample X-ray diffraction material phase analysis support, it is characterised in that：Including for X-ray diffractometer certainly
Fixing end, sample holder and height adjustment mechanism that the planar sample platform rotary shaft of band is connected；Fixing end and
The lower end of height adjustment mechanism is connected with a fixed mount, and sample holder is placed on a height adjustment mechanism
Side, sample holder can be moved up and down by height adjustment mechanism.
2. according to large sample X-ray diffraction material phase analysis support described in claim 1, it is characterised in that：
The height adjustment mechanism is one or two or more kinds in following structures,
A, be a fluid cylinder being connected with a liquid source by liquid pump, gone up under fluid cylinder two ends respectively with fixed mount and sample support
Platform is connected；
B, it is the screwed leading screw in a lower end, leading screw lower end is screwed with tapped through hole on fixed mount；Silk
Thick stick upper end is connected with sample holder lower section.
3. according to large sample X-ray diffraction material phase analysis support described in claim 1, it is characterised in that：It is described solid
A blind hole or through hole are carried on fixed end, rotary shaft is set in blind hole or through hole, fixing end by with X-ray
The planar sample platform rotary sleeve that diffractometer is carried is fetched fixes and positions whole support.
4. according to large sample X-ray diffraction material phase analysis support described in claim 1, it is characterised in that：Use sample
Product supporting table places the height that sample adjusts sample holder using height adjustment mechanism, is used to ensure sample test
Surface is consistent with test benchmark plane.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510982237.9A CN106918608A (en) | 2015-12-24 | 2015-12-24 | Large sample X-ray diffraction material phase analysis support |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510982237.9A CN106918608A (en) | 2015-12-24 | 2015-12-24 | Large sample X-ray diffraction material phase analysis support |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106918608A true CN106918608A (en) | 2017-07-04 |
Family
ID=59456935
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510982237.9A Pending CN106918608A (en) | 2015-12-24 | 2015-12-24 | Large sample X-ray diffraction material phase analysis support |
Country Status (1)
| Country | Link |
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| CN (1) | CN106918608A (en) |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01142443A (en) * | 1987-11-30 | 1989-06-05 | Rigaku Denki Kk | Specimen stand for x-ray diffraction apparatus |
| CN2746387Y (en) * | 2004-08-25 | 2005-12-14 | 辽宁石油化工大学 | Sample stand for investigating solid block sample by X-ray diffractometer |
| CN102120222A (en) * | 2010-12-17 | 2011-07-13 | 清华大学 | Device and method for disassembling plug-in mounted components of waste printed circuit board |
| CN202330313U (en) * | 2011-11-23 | 2012-07-11 | 中国科学院上海应用物理研究所 | Cooling sample platform of film X-ray diffractometer and X-ray diffractometer |
| CN102583068A (en) * | 2012-03-07 | 2012-07-18 | 东莞华尔泰装饰材料有限公司 | Transportation device specially used for loading and unloading aluminum-plastic composite panels |
| CN202854068U (en) * | 2012-10-16 | 2013-04-03 | 南京钢铁股份有限公司 | Sample testing jig of X-ray diffraction instrument |
| CN103293173A (en) * | 2013-06-03 | 2013-09-11 | 深圳大学 | Thin film test sample platform of X-ray diffraction instrument |
| CN103385603A (en) * | 2013-08-21 | 2013-11-13 | 苏州安帝尔金属制品有限公司 | Liftable office table convenient for wiring management |
| CN103640449A (en) * | 2013-12-24 | 2014-03-19 | 威海广泰空港设备股份有限公司 | Automatic leveling device and method for landing stair platform |
-
2015
- 2015-12-24 CN CN201510982237.9A patent/CN106918608A/en active Pending
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01142443A (en) * | 1987-11-30 | 1989-06-05 | Rigaku Denki Kk | Specimen stand for x-ray diffraction apparatus |
| CN2746387Y (en) * | 2004-08-25 | 2005-12-14 | 辽宁石油化工大学 | Sample stand for investigating solid block sample by X-ray diffractometer |
| CN102120222A (en) * | 2010-12-17 | 2011-07-13 | 清华大学 | Device and method for disassembling plug-in mounted components of waste printed circuit board |
| CN202330313U (en) * | 2011-11-23 | 2012-07-11 | 中国科学院上海应用物理研究所 | Cooling sample platform of film X-ray diffractometer and X-ray diffractometer |
| CN102583068A (en) * | 2012-03-07 | 2012-07-18 | 东莞华尔泰装饰材料有限公司 | Transportation device specially used for loading and unloading aluminum-plastic composite panels |
| CN202854068U (en) * | 2012-10-16 | 2013-04-03 | 南京钢铁股份有限公司 | Sample testing jig of X-ray diffraction instrument |
| CN103293173A (en) * | 2013-06-03 | 2013-09-11 | 深圳大学 | Thin film test sample platform of X-ray diffraction instrument |
| CN103385603A (en) * | 2013-08-21 | 2013-11-13 | 苏州安帝尔金属制品有限公司 | Liftable office table convenient for wiring management |
| CN103640449A (en) * | 2013-12-24 | 2014-03-19 | 威海广泰空港设备股份有限公司 | Automatic leveling device and method for landing stair platform |
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| PB01 | Publication | ||
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Application publication date: 20170704 |