WO2000023795A1 - Environmentally controllable sample holder for x-ray diffractometer (xrd) - Google Patents
Environmentally controllable sample holder for x-ray diffractometer (xrd) Download PDFInfo
- Publication number
- WO2000023795A1 WO2000023795A1 PCT/US1999/024678 US9924678W WO0023795A1 WO 2000023795 A1 WO2000023795 A1 WO 2000023795A1 US 9924678 W US9924678 W US 9924678W WO 0023795 A1 WO0023795 A1 WO 0023795A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- sample
- sample holder
- xrd
- housing
- disk
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU11295/00A AU1129500A (en) | 1998-10-21 | 1999-10-21 | Environmentally controllable sample holder for x-ray diffractometer (xrd) |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10510398P | 1998-10-21 | 1998-10-21 | |
US60/105,103 | 1998-10-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2000023795A1 true WO2000023795A1 (en) | 2000-04-27 |
WO2000023795A9 WO2000023795A9 (en) | 2000-08-24 |
Family
ID=22304039
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1999/024678 WO2000023795A1 (en) | 1998-10-21 | 1999-10-21 | Environmentally controllable sample holder for x-ray diffractometer (xrd) |
Country Status (2)
Country | Link |
---|---|
AU (1) | AU1129500A (en) |
WO (1) | WO2000023795A1 (en) |
Cited By (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004008127A2 (en) * | 2002-07-16 | 2004-01-22 | Proteros Biostructures Gmbh | Device and method for generation of a defined environment for particulate samples |
EP1484602A2 (en) * | 2003-05-16 | 2004-12-08 | Forschungszentrum Karlsruhe GmbH | Sample chamber with coupling and adjusting means for reproducibly coupling the sample chamber to a X-ray diffractometer |
FR2856793A1 (en) * | 2003-06-24 | 2004-12-31 | Inst Francais Du Petrole | X-ray diffraction instrument, for in-situ analysis e.g. of catalyst substrates or adsorbents used in petroleum industry, mimics atmosphere, temperature and agitation conditions |
EP1947448A1 (en) | 2007-01-19 | 2008-07-23 | Panalytical B.V. | X-ray Diffraction Equipment for X-ray Scattering |
WO2010119156A1 (en) * | 2009-04-13 | 2010-10-21 | Consejo Superior De Investigaciones Científicas (Csic) | Device for holding a sample inside an x-ray diffraction or dispersion chamber |
WO2013011022A1 (en) * | 2011-07-21 | 2013-01-24 | Commissariat à l'énergie atomique et aux énergies alternatives | Sample holder with integrated thermocouple |
GB2514125A (en) * | 2013-05-13 | 2014-11-19 | Nikon Metrology Nv | Enclosed X-ray imaging system |
EP2848924A1 (en) | 2013-09-11 | 2015-03-18 | Anton Paar GmbH | Tempering chamber for compact x-ray apparatus |
WO2015153980A1 (en) * | 2014-04-04 | 2015-10-08 | Nordson Corporation | X-ray inspection apparatus for inspecting semiconductor wafers |
RU2650836C1 (en) * | 2016-12-14 | 2018-04-17 | федеральное государственное автономное образовательное учреждение высшего образования "Московский физико-технический институт (государственный университет)" | Sample assembly block, intended for conducting combined measurements by x-ray structural analysis in a sliding bundle and additional physico-chemical methods of the study |
CN110031362A (en) * | 2019-02-26 | 2019-07-19 | 中国科学技术大学 | A kind of steam stretching, extension rheometer |
WO2019215326A1 (en) * | 2018-05-11 | 2019-11-14 | Universite De Rouen-Normandie | Anti-frosting and anti-dew device for spectroscopic measurements |
CN111933832A (en) * | 2020-09-03 | 2020-11-13 | 广州阳瑞仪器科技有限公司 | In-situ battery accessory, mounting seat and assembling method of X-ray diffractometer |
CN113049618A (en) * | 2021-03-10 | 2021-06-29 | 华研环科(北京)科技有限公司 | High-temperature high-pressure in-situ XRD testing device |
CN113302483A (en) * | 2018-11-23 | 2021-08-24 | 株式会社理学 | Device and method for storing sample for single crystal X-ray structural analysis |
CN113406128A (en) * | 2021-07-23 | 2021-09-17 | 重庆大学 | Temperature control accessory for X-ray diffractometer |
CN113945594A (en) * | 2021-10-11 | 2022-01-18 | 安徽科技学院 | Rotary sample table for X-ray diffraction analysis for assembling vertical goniometer |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4995063A (en) * | 1989-01-20 | 1991-02-19 | Shin-Etsu Handotai Company, Ltd. | Single crystal orientation identifying and determining apparatus for semiconductor wafer and its operation method |
US5084910A (en) * | 1990-12-17 | 1992-01-28 | Dow Corning Corporation | X-ray diffractometer sample holder |
US5390230A (en) * | 1993-03-30 | 1995-02-14 | Valence Technology, Inc. | Controlled atmosphere, variable volume sample holder for x-ray diffractomer |
US5832054A (en) * | 1996-11-29 | 1998-11-03 | Shimadzu Corporation | Fluorescent x-ray analyzer with quickly evacuable cover cases |
US5848122A (en) * | 1997-03-25 | 1998-12-08 | Advanced Technology Materials, Inc. | Apparatus for rapid in-situ X-ray stress measurement during thermal cycling of semiconductor wafers |
-
1999
- 1999-10-21 AU AU11295/00A patent/AU1129500A/en not_active Abandoned
- 1999-10-21 WO PCT/US1999/024678 patent/WO2000023795A1/en active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4995063A (en) * | 1989-01-20 | 1991-02-19 | Shin-Etsu Handotai Company, Ltd. | Single crystal orientation identifying and determining apparatus for semiconductor wafer and its operation method |
US5084910A (en) * | 1990-12-17 | 1992-01-28 | Dow Corning Corporation | X-ray diffractometer sample holder |
US5390230A (en) * | 1993-03-30 | 1995-02-14 | Valence Technology, Inc. | Controlled atmosphere, variable volume sample holder for x-ray diffractomer |
US5832054A (en) * | 1996-11-29 | 1998-11-03 | Shimadzu Corporation | Fluorescent x-ray analyzer with quickly evacuable cover cases |
US5848122A (en) * | 1997-03-25 | 1998-12-08 | Advanced Technology Materials, Inc. | Apparatus for rapid in-situ X-ray stress measurement during thermal cycling of semiconductor wafers |
Cited By (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004008127A2 (en) * | 2002-07-16 | 2004-01-22 | Proteros Biostructures Gmbh | Device and method for generation of a defined environment for particulate samples |
WO2004008127A3 (en) * | 2002-07-16 | 2004-03-18 | Proteros Biostructures Gmbh | Device and method for generation of a defined environment for particulate samples |
US7281669B2 (en) | 2002-07-16 | 2007-10-16 | Proteros Biostructures Gmbh | Apparatus and method for generating a defined environment for particle-shaped samples |
EP1484602A2 (en) * | 2003-05-16 | 2004-12-08 | Forschungszentrum Karlsruhe GmbH | Sample chamber with coupling and adjusting means for reproducibly coupling the sample chamber to a X-ray diffractometer |
EP1484602A3 (en) * | 2003-05-16 | 2005-01-26 | Forschungszentrum Karlsruhe GmbH | Sample chamber with coupling and adjusting means for reproducibly coupling the sample chamber to a X-ray diffractometer |
FR2856793A1 (en) * | 2003-06-24 | 2004-12-31 | Inst Francais Du Petrole | X-ray diffraction instrument, for in-situ analysis e.g. of catalyst substrates or adsorbents used in petroleum industry, mimics atmosphere, temperature and agitation conditions |
EP1947448A1 (en) | 2007-01-19 | 2008-07-23 | Panalytical B.V. | X-ray Diffraction Equipment for X-ray Scattering |
US7542547B2 (en) | 2007-01-19 | 2009-06-02 | Panalytical B.V. | X-ray diffraction equipment for X-ray scattering |
WO2010119156A1 (en) * | 2009-04-13 | 2010-10-21 | Consejo Superior De Investigaciones Científicas (Csic) | Device for holding a sample inside an x-ray diffraction or dispersion chamber |
ES2378045A1 (en) * | 2009-04-13 | 2012-04-04 | Consejo Superior De Investigaciones Científicas (Csic) | Device for holding a sample inside an x-ray diffraction or dispersion chamber |
WO2013011022A1 (en) * | 2011-07-21 | 2013-01-24 | Commissariat à l'énergie atomique et aux énergies alternatives | Sample holder with integrated thermocouple |
FR2978246A1 (en) * | 2011-07-21 | 2013-01-25 | Commissariat Energie Atomique | INTEGRATED THERMOCOUPLE SAMPLE HOLDER |
GB2514125A (en) * | 2013-05-13 | 2014-11-19 | Nikon Metrology Nv | Enclosed X-ray imaging system |
US9810647B2 (en) | 2013-05-13 | 2017-11-07 | Niko Metrology Nv | Enclosed X-ray imaging system |
GB2514125B (en) * | 2013-05-13 | 2016-10-05 | Nikon Metrology Nv | X-ray imaging system with climate control |
EP2848924A1 (en) | 2013-09-11 | 2015-03-18 | Anton Paar GmbH | Tempering chamber for compact x-ray apparatus |
US9459219B2 (en) | 2013-09-11 | 2016-10-04 | Anton Paar Gmbh | Temperature control chamber for compact X-ray machine |
WO2015153980A1 (en) * | 2014-04-04 | 2015-10-08 | Nordson Corporation | X-ray inspection apparatus for inspecting semiconductor wafers |
US10215716B2 (en) | 2014-04-04 | 2019-02-26 | Nordson Corporation | X-ray inspection apparatus for inspecting semiconductor wafers |
RU2650836C1 (en) * | 2016-12-14 | 2018-04-17 | федеральное государственное автономное образовательное учреждение высшего образования "Московский физико-технический институт (государственный университет)" | Sample assembly block, intended for conducting combined measurements by x-ray structural analysis in a sliding bundle and additional physico-chemical methods of the study |
WO2019215326A1 (en) * | 2018-05-11 | 2019-11-14 | Universite De Rouen-Normandie | Anti-frosting and anti-dew device for spectroscopic measurements |
US11921062B2 (en) | 2018-05-11 | 2024-03-05 | Universite De Rouen-Normandie | Anti-frosting and anti-dew device for spectroscopic measurements |
CN113302483A (en) * | 2018-11-23 | 2021-08-24 | 株式会社理学 | Device and method for storing sample for single crystal X-ray structural analysis |
CN110031362A (en) * | 2019-02-26 | 2019-07-19 | 中国科学技术大学 | A kind of steam stretching, extension rheometer |
CN111933832A (en) * | 2020-09-03 | 2020-11-13 | 广州阳瑞仪器科技有限公司 | In-situ battery accessory, mounting seat and assembling method of X-ray diffractometer |
CN111933832B (en) * | 2020-09-03 | 2023-10-20 | 广州阳瑞仪器科技有限公司 | In-situ battery accessory of X-ray diffractometer and assembling method |
CN113049618A (en) * | 2021-03-10 | 2021-06-29 | 华研环科(北京)科技有限公司 | High-temperature high-pressure in-situ XRD testing device |
CN113406128A (en) * | 2021-07-23 | 2021-09-17 | 重庆大学 | Temperature control accessory for X-ray diffractometer |
CN113945594A (en) * | 2021-10-11 | 2022-01-18 | 安徽科技学院 | Rotary sample table for X-ray diffraction analysis for assembling vertical goniometer |
Also Published As
Publication number | Publication date |
---|---|
WO2000023795A9 (en) | 2000-08-24 |
AU1129500A (en) | 2000-05-08 |
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